List of Latest Electron Microscope RFPs Posted on RFPMart RFPMart LLC en-us https://www.rfpmart.com/electron-microscope-rfp-government-contract.html Sat, 13 Jun 2026 08:57:37 -0700 Vendor needs to provide scanning electron microscope supplies for engineering administration to the government authority located in Alabama.– SEM Specific Specificationsa. Resolutioni. High vacuum mode1. 1.0nm at 20kV2. 3.0nm at 1.0kVb. Electron gunc. Accelerating voltaged. Probe currente. Maximum specimen sizei. 200mm diameter x 75mm height Sat, 13 Jun 2026 00:00:00 -0700 http://www.rfpmart.com/1129592-usa-alabama-scanning-electron-microscope-supplies-for-engineering-administration-rfp.html http://www.rfpmart.com/1129592-usa-alabama-scanning-electron-microscope-supplies-for-engineering-administration-rfp.html (1) Vendor needs to provide scanning electron microscope supplies to the government authority located in Alfred, NY. – Used to characterize microstructures, fracture surfaces, powders, and elemental compositions of materials.– Optional Electron Backscatter Diffraction will aid in grain size analysis, phase analysis and determining any texturing (grain orientation) of material samples.– Electron source:– Schottky field emission gun.– Accelerating voltage range.– Beam current range.– Resolution:– High–vacuum resolution.– Low–vacuum or variable pressure modes.– Imaging and detectors:– Backscattered electron (BSE) detector.– Stage:– Travel range.– Tilt range.– Vacuum system:– Column vacuum level.– Variable pressure or low–vacuum range.(2) All the questions must be submitted no later than June 22, 2026. Fri, 12 Jun 2026 00:00:00 -0700 http://www.rfpmart.com/1129113-usa-alfred-new-york-scanning-electron-microscope-supplies-rfp.html http://www.rfpmart.com/1129113-usa-alfred-new-york-scanning-electron-microscope-supplies-rfp.html (1) Vendor needs to provide Zeiss microscopes supply to the government authority located in Baltimore, MD.• Provide new and unused Olympus microscopes and accessories (including imaging accessories)• A single discount percentage is to be quoted to include microscopes and accessories• Microscopes must be warranted a minimum of one–year pai1s and labor. Manufacturer warranty must pass directly to the University• Vendors must have the capability to set–up and demonstrate the manufacturer's entire microscope line that you are quoting and be able to do this at no extra charge when deliveries are made• Vendors must quote average delivery time after receipt of order(2) The contract period will be for one year.(3) All the questions must be submitted no later than June 12, 2026  Sat, 06 Jun 2026 00:00:00 -0700 http://www.rfpmart.com/1126572-usa-baltimore-maryland-zeiss-microscopes-supply-rfp.html http://www.rfpmart.com/1126572-usa-baltimore-maryland-zeiss-microscopes-supply-rfp.html (1) Vendor needs to provide Nikon microscopes supply to the government authority located in Baltimore, MD.• Provide new and unused Olympus microscopes and accessories (including imaging accessories)• A single discount percentage is to be quoted to include microscopes and accessories• Microscopes must be warranted a minimum of one–year pai1s and labor. Manufacturer warranty must pass directly to the University• Vendors must have the capability to set–up and demonstrate the manufacturer's entire microscope line that you are quoting and be able to do this at no extra charge when deliveries are made• Vendors must quote average delivery time after receipt of order(2) The contract period will be for one year.(3) All the questions must be submitted no later than June 12, 2026  Sat, 06 Jun 2026 00:00:00 -0700 http://www.rfpmart.com/1126571-usa-baltimore-maryland-nikon-microscopes-supply-rfp.html http://www.rfpmart.com/1126571-usa-baltimore-maryland-nikon-microscopes-supply-rfp.html (1) Vendor needs to provide Leica microscopes supply to the government authority located in Baltimore, MD.• Provide new and unused Olympus microscopes and accessories (including imaging accessories)• A single discount percentage is to be quoted to include microscopes and accessories• Microscopes must be warranted a minimum of one–year pai1s and labor. Manufacturer warranty must pass directly to the University• Vendors must have the capability to set–up and demonstrate the manufacturer's entire microscope line that you are quoting and be able to do this at no extra charge when deliveries are made• Vendors must quote average delivery time after receipt of order(2) The contract period will be for one year.(3) All the questions must be submitted no later than June 12, 2026  Sat, 06 Jun 2026 00:00:00 -0700 http://www.rfpmart.com/1126570-usa-baltimore-maryland-leica-microscopes-supply-rfp.html http://www.rfpmart.com/1126570-usa-baltimore-maryland-leica-microscopes-supply-rfp.html (1) Vendor needs to provide Olympus microscopes supply to the government authority located in Baltimore, MD.• Provide new and unused Olympus microscopes and accessories (including imaging accessories)• A single discount percentage is to be quoted to include microscopes and accessories• Microscopes must be warranted a minimum of one–year pai1s and labor. Manufacturer warranty must pass directly to the University• Vendors must have the capability to set–up and demonstrate the manufacturer's entire microscope line that you are quoting and be able to do this at no extra charge when deliveries are made• Vendors must quote average delivery time after receipt of order(2) The contract period will be for one year.(3) All the questions must be submitted no later than June 12, 2026  Sat, 06 Jun 2026 00:00:00 -0700 http://www.rfpmart.com/1126490-usa-baltimore-maryland-olympus-microscopes-supply-rfp.html http://www.rfpmart.com/1126490-usa-baltimore-maryland-olympus-microscopes-supply-rfp.html (1) Vendor needs to provide fluorescence microscope services to the government authority located in St. Paul, MN.• 6.4 Megapixel capture for fine image detail. • 12–bit colour depth for high dynamic range imaging. • 60fps full HD frame rate. • 1920x1080 full HD resolution. • 2x2 binning for increased sensitivity and preview frame rate. • USB 3.1 connectivity.• Shading correction. • Multiple colour modes to accommodate any type of staining evident scientific MIS is the sole provider of the BX43 upright microscope. The BX43 delivers high performance microscopy for clinical applications.(2) All question must be submitted no later than June 08, 2026.(3) A contract period will be for one year.  Fri, 05 Jun 2026 00:00:00 -0700 http://www.rfpmart.com/1125572-usa-st-paul-minnesota-fluorescence-microscope-services-rfp.html http://www.rfpmart.com/1125572-usa-st-paul-minnesota-fluorescence-microscope-services-rfp.html Vendor needs to provide digital microscope services to the government authority located in Honolulu, HI. Mon, 18 May 2026 00:00:00 -0700 http://www.rfpmart.com/1116757-usa-honolulu-hawaii-digital-microscope-services-rfp.html http://www.rfpmart.com/1116757-usa-honolulu-hawaii-digital-microscope-services-rfp.html See attached Sources Sought Notice (SSN) for a Preventive Maintenance and unlimited repair agreement for a Thermo Fisher Tundra Transmission Electron Microscope and associated software programs for data acquisition and analysis. Fri, 08 May 2026 00:00:00 -0700 http://www.rfpmart.com/1112655-us-fed-one-year-preventive-maintenance-and-unlimited-repair-agreement-for-a-thermo-fisher-tundra-transmission-electron-microscope-and-a.html http://www.rfpmart.com/1112655-us-fed-one-year-preventive-maintenance-and-unlimited-repair-agreement-for-a-thermo-fisher-tundra-transmission-electron-microscope-and-a.html Vendor needs to provide high resolution inverted microscope services to the government authority located in South Carolina.• Inverted metallurgical microscope platform suitable for opaque materials and mounted specimens.• Brightfield and polarized light imaging capability for metallographic analysis.• Wide magnification range (from 5x to l00x objectives) to support imaging at different length scales.• High– quality optical system for high resolution and contrast imaging.• Ergonomic viewing system with binocular eyepieces and protective accessories.• Stable stage with specimen holders for mounted samples and metallurgical specimens.• Integrated digital imaging system with microscope camera for image acquisition and documentation.• Computer workstation and high – resolution monitor for image processing and analysis.• Advanced imaging and analysis software for grain size measurement, phase analysis, extended depth of focus, and HDR imaging.• Modular and upgradable system architecture to support future teaching and research needs.  Fri, 08 May 2026 00:00:00 -0700 http://www.rfpmart.com/1112222-usa-south-carolina-high-resolution-inverted-microscope-services-rfp.html http://www.rfpmart.com/1112222-usa-south-carolina-high-resolution-inverted-microscope-services-rfp.html Notice ID Number: NIST–SS26–107Title: Plasma Cleaner for Transmission Electron Microscope HoldersThe purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government`s anticipated needs.BACKGROUNDTo support of the CHIPS for America Act, the NIST Precision Imaging Facility (PIF) requires a plasma cleaner system to clean hydrocarbons and other contaminants from transmission electron microscopy (TEM) holders and other bulk items/specimens. The plasma cleaner tool is intended to support the scanning electron microscope, focused ion beam, and transmission electron microscope instruments (among others) in the PIF.NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described above, in addition to the following essential requirements:TECHNICAL REQUIREMENTS:Line Item 0001: Plasma cleaner to remove hydrocarbons from transmission electron microscope holders and bulk itemsQuantity: One (1)Technical Specifications:FunctionThe system shall be capable of removing hydrocarbons and other contaminants using a radio frequency plasma using one or more process gases.The system shall have a graphical user interface that allows the user to select processing parameters.The graphical user interface shall control all functions of the system.CapacityThe system shall be able to accommodate two transmission electron microscope (TEM) holders that are compatible with a Thermo Fisher Talos F200X TEM and a Thermo Fisher Spectra 300 TEM.The system shall be able to accommodate specimens, parts, or items other than a TEM holder for plasma cleaning.Process Gasses:The system shall be able to accommodate at least three process gasses, including (but not limited to) argon, oxygen, and hydrogen.The system shall include mass flow controllers (or similar) to allow arbitrary combinations of the process gasses. Sat, 18 Apr 2026 00:00:00 -0700 http://www.rfpmart.com/1102914-us-fed-plasma-cleaner-for-transmission-electron-microscope-holders.html http://www.rfpmart.com/1102914-us-fed-plasma-cleaner-for-transmission-electron-microscope-holders.html Notice ID Number: NIST–SS26–109Title: Ion mill for transmission electron microscope specimensThe purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government`s anticipated needs.BACKGROUNDTo support the CHIPS for America Act, the NIST Precision Imaging Facility (PIF) requires an ion milling system to provide final thinning to transmission electron microscope specimens. The coating system is intended to support the scanning electron microscope, focused ion beam, and transmission electron microscope instruments (among others) in the PIF.NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described above, in addition to the following essential requirements:TECHNICAL REQUIREMENTS:Line Item 0001: Sputter coater for scanning electron microscopyQuantity: One (1)Technical Specifications:FunctionThe system shall be capable of milling/polishing specimens for transmission electron microscopy using one or more ion beams.Chamber/StageThe system shall be able to hold standard 3 mm diameter transmission electron microscope grids and/or half grids which are typically used during focused ion beam preparation.The stage shall rotate 360°Offerors shall comment on the ability of the stage to be cooled using liquid nitrogenIon Source(s)The system shall have two or more independently adjustable ion sources.The energy of the ion sources shall be adjustable. Offerors shall comment on the ion source energy range.The angle of the ion sources shall be adjustable relative to the specimen. Sat, 18 Apr 2026 00:00:00 -0700 http://www.rfpmart.com/1102911-us-fed-ion-mill-for-transmission-electron-microscope-specimens.html http://www.rfpmart.com/1102911-us-fed-ion-mill-for-transmission-electron-microscope-specimens.html (1) Vendor needs to provide state–of–the–art optical clarity, intraoperative visualization, and seamless digital integration to enhance surgical precision, efficiency, and teaching capability within a veterinary ophthalmology service to the government authority located in Minneapolis, MN.– The system must support a broad range of ophthalmic microsurgical procedures across species and patient sizes while facilitating high–quality intraoperative imaging and postoperative case review. The microscope must deliver distortion–free, high–resolution intraoperative imaging with guided optimization of illumination intensity and magnification. Illumination and visualization should support precise tissue differentiation and consistent clarity throughout anterior and posterior segment procedures.(2) All question must be submitted no later than April 6, 2026. Tue, 31 Mar 2026 00:00:00 -0700 http://www.rfpmart.com/1092876-usa-minneapolis-minnesota-ophthalmology-operating-microscope-services-rfp.html http://www.rfpmart.com/1092876-usa-minneapolis-minnesota-ophthalmology-operating-microscope-services-rfp.html (1) Vendor needs to provide confocal, industrial inspection, and 3D optical profilometry microscopy systems to the government authority located in Eugene, OR.• Microscopy systems to expand its advanced imaging and materials analysis capacity.• These systems must support applications ranging from biological live–cell imaging to industrial inspection and Nano–scale surface metrology.• Spinning Disk Confocal Microscope For fast, high–sensitivity imaging of live and fixed biological samples, including super–resolution functionality via optical reassignment• Point–Scanning Confocal Microscope For high–resolution, spectrally flexible imaging of biological samples and tissues, with modular capabilities to add multiphoton (MP), FLIM, and SHG for advanced applications• Industrial Inspection Microscope (accommodating 8–inch wafers) For semiconductor, wafer, and material inspection using reflected and transmitted light with motorized contrast switching, ergonomic optics, and digital capture• High–speed live–cell imaging, super–resolution• High–sensitivity, low–noise detectors• Simultaneous dual–camera, multi–channel acquisition• Fully motorized microscope frame: Encoded XYZ motorized stage High–precision Z–control(2) The contract period will be for one year.  Fri, 20 Mar 2026 00:00:00 -0700 http://www.rfpmart.com/1087922-usa-eugene-oregon-confocal-industrial-inspection-and-3d-optical-profilometry-microscopy-systems-rfp.html http://www.rfpmart.com/1087922-usa-eugene-oregon-confocal-industrial-inspection-and-3d-optical-profilometry-microscopy-systems-rfp.html Vendor needs to provide microscopes, accessories, and maintenance services to the government authority located in Wisconsin.• Service calls received before noon must be acknowledged by end of the day and the equipment must be serviced within seventy–two (72) hours of initial call whenever possible.  In circumstances where replacement parts aren’t already on hand, the Contractor should be able to order and provide those parts within five (5) days. • Except under extenuating circumstances, Contractor must complete all maintenance or repair services within two (2) weeks of the initial call.  If Contractor cannot complete all services within this time, the Contractor must provide a progress report of the repair to the department. • The service representative shall leave with the ordering department a copy of a dated, written report indicating the service performed.  This report must be signed by the University employee in charge of the machine. Fri, 13 Mar 2026 00:00:00 -0700 http://www.rfpmart.com/1084941-usa-wisconsin-microscopes-accessories-and-maintenance-services-rfp.html http://www.rfpmart.com/1084941-usa-wisconsin-microscopes-accessories-and-maintenance-services-rfp.html NOTICE OF INTENT TO AWARD A SOLE SOURCEThis Notice of Intent is not a request for competitive proposals. This is not a solicitation or request for offers. Only one responsible source and no other supplies or services will satisfy agency requirements.The Naval Research Laboratory (NRL) intends to award a sole source purchase order to JEOL to furnish:F200 TRANSMISSION ELECTRON MICROSCOPE MAINTENANCE AND SERVICESThe North American Industry Classification System Code (NAICS) for this requirement is 811210 with the size standard of $34,000,000 . The Federal Supply Code (FSC) / Product Service Code (PSC) procurement is J066 .This purchase will be made utilizing Simplified Acquisition Procedures in accordance with:Federal Acquisition Regulation (FAR) Part 13.106–1(b) for purchases not exceeding the simplified acquisition threshold of $350,000.Interested parties may identify their interests and capability to respond to this requirement within fifteen (15) calendar days of the publication of this notice. Any response to this notice must show clear and convincing evidence that competition would be advantageous to the Government. Information received will be considered solely for the purpose of determining whether or not to conduct a competitive procurement. A determination by the Government not to compete this proposed purchase order based upon response to this notice is solely within the discretion of the Government. No reimbursement for any cost connected with providing capability information will be provided.The point of contact is: Richard Key , email: [email? redacted]Please reference this Notice of Intent number on your correspondence and in the “Subject“ line of your email. Sun, 25 Jan 2026 00:00:00 -0800 http://www.rfpmart.com/1065590-us-fed-jeol-f200-transmission-electron-microscope-services.html http://www.rfpmart.com/1065590-us-fed-jeol-f200-transmission-electron-microscope-services.html (1) Vendor needs to provide field emission scanning electron microscope service to the government authority located in North Kelowna, BC.– The Contractor / Consultant / Supplier / Vendor will provide the following Project deliverables:– Field emission scanning electron microscope (FEG–SEM)– Laboratory Equipment– The FEG SEM system required for the scope of work should be a compact, desktop field emissionscanning electron microscope designed for installation on a standard laboratory table without special floor isolation. – The system should provide high resolution imaging using a Schottky field emission sourceto enable stable, high brightness electron beams for imaging across an accelerating voltage range of 1 20kV, allowing analysis of both beam sensitive and high–resolution samples.– The microscope shall support sensitive imaging using multiple detector types, including secondary electron, backscattered electron, and STEM detectors, within a fully integrated, non–destructive workflow.– The system should enable efficient analysis of multiple sample regions through automated stage control, optical navigation, and automated focus, alignment and calibration.– The instrument should be compatible with a wide rangeof sample types, including conductive e and nonconductive materials, through integrated high, medium and low vacuum operation. – The proposed system should include integrated software for instrumentcontrol, image acquisition, analysis, and visualization, enabling comprehensive reporting andin perpetration of results. Software should support high resolution image capture, live signal mixing,elemental analysis and mapping via an integrated EDS detector, and export of data and reports incommonly used formats(2) All the questions must be submitted no later than February 12, 2026 (3) The contract period will be for one year. Fri, 23 Jan 2026 00:00:00 -0800 http://www.rfpmart.com/1064848-canada-kelowna-british-columbia-field-emission-scanning-electron-microscope-service-rfp.html http://www.rfpmart.com/1064848-canada-kelowna-british-columbia-field-emission-scanning-electron-microscope-service-rfp.html Request for Information (RFI) 473958This is a REQUEST FOR INFORMATION (RFI) NOTICE open to all companies that meet all the requirements/specifications of the attached RFI document for this requirement. This RFI is solely for information and planning purposes for the effort described herein and is not to be construed as a commitment by the U.S. Government, nor will the U.S. Government pay for information solicited. The information from this notice will help the Department of Energy (DOE) survey available resources.PLEASE NOTE THAT THIS IS NOT A REQUEST FOR PROPOSAL, NO SOLICITATION EXISTS AT THIS TIME.Brookhaven Science Associates, LLC (herein known as “BSA“), operator of Brookhaven National Laboratory (BNL) under a Prime Contract with the U.S. Department of Energy (DOE) herewith requests your capabilities, as outlined in the attached RFI document for the subject requirement. The information being solicited includes, but is not limited to, the following:a) Indication of your interest in bidding on the services outlined in the attached RFI document.b) A brief Statement of Capabilities detailing how your company meets the requirements outlined in the attached RFI document.c) Answers to the questions stated in the attached RFI document.Submittals must be received by BSA no later than 3:00 PM Eastern Time, on January 6, 2026. Any information received after this time and date may not be considered.Electronic submissions will be accepted by the following method:- Submissions must include the information noted above. Emails shall be sent to lgonz[email? redacted] with “BSA RFI–473958“ in the subject line.We trust that the information contained herein is sufficient to permit your company to prepare a submittal outlining your capabilities, however, should you have any questions, please direct questions to the email address listed above. All questions must be submitted via email. Tue, 23 Dec 2025 00:00:00 -0800 http://www.rfpmart.com/1056196-us-fed-473958-request-for-information-rfi-200kv-workhorse-transmission-electron-microscope.html http://www.rfpmart.com/1056196-us-fed-473958-request-for-information-rfi-200kv-workhorse-transmission-electron-microscope.html Attachment: Notice of Intent to Sole Source Thu, 18 Dec 2025 00:00:00 -0800 http://www.rfpmart.com/1054178-us-fed-service-contract-for-thermofisher-fei-tecnal-t20-transmission-electron-microscope.html http://www.rfpmart.com/1054178-us-fed-service-contract-for-thermofisher-fei-tecnal-t20-transmission-electron-microscope.html The Commander Fleet Readiness Centers (COMFRC) Procurement Group, Patuxent River, MD 20670 hereby gives notice of their intent to award a purchase order to JEOL USA, Inc., 11 Dearborn Road Peabody, MA 01960 (Cage Code: 51043) on a sole source basis in accordance with the Federal Acquisition Regulation (FAR) Subpart 13.106–1(b)(i), only one source reasonably available and no other supplies or services will satisfy agency requirements.The Fleet Readiness Center East (FRCE) has a requirement for maintenance of electron microscopes. This requirement provides an unlimited number of emergency visits with the contractor arriving on–site based on standard industry of mean time to respond. The services shall include, but are not limited to the following: Inspection, adjustment, and operational verification of all system components for proper operation; Resolution checks; and Replacement of parts as deemed necessary by qualified personnel. The hardware, system components, and associated software for the JEOL USA, Inc. models JSM–6610LV (serial number MP13710018), JSM–IT300LV (serial number MP137200065), and JSM–IT500HRLV (serial number MP1511000530053) were developed by the Original Equipment Manufacturer (OEM) at private expense for the commercial market and are sold to non–governmental customers. As such, the OEM retains all data rights for the equipment and software. The hardware and software associated with the JEOL SEMs are proprietary, and therefore, maintenance and repairs must be performed exclusively by the OEM (JEOL USA, Inc.) to ensure the equipment remains fully functional. For this reason, the government intends to procure these products on a sole source basis from JEOL USA, Inc. (CAGE Code: 51043).THIS NOTICE OF INTENT IS NOT A REQUEST FOR COMPETITIVE QUOTES. However, all responsible sources may submit a capability statement, which, if received within two (2) calendar days after the date of the publication of this synopsis, will be considered. Information received will be considered solely for the purpose of determining whether to conduct a competitive procurement. A determination by the Government not to compete this requirement based upon responses received as a result of this notice is solely within the discretion of the Government.Point of contact for this requirement is Kara Marie Ridgell at [email? redacted]. Tue, 02 Dec 2025 00:00:00 -0800 http://www.rfpmart.com/1048668-us-fed-electron-microscopes.html http://www.rfpmart.com/1048668-us-fed-electron-microscopes.html (1) Vendor needs to provide cytogenetic testing genetic imaging system to the government authority located in Edmonton, AB. – List of Microscopes:• Manufacturer: Zeiss– Models:– Axiostar Plus, Qty. 2– Axioskop 40, Qty. 10– Axioskop 2, Qty. 3– Axio Imager.A1, Qty. 4– Axio Imager.Z2, Qty. 7– Imager D1, Qty. 1– Axioplan 2, Qty. 4– Axiophot, Qty. 1• Manufacturer: Olympus– Model: BX50F4, Qty. 1(2) All the questions must be submitted no later than December 12, 2025.  Sat, 29 Nov 2025 00:00:00 -0800 http://www.rfpmart.com/1048131-canada-edmonton-alberta-cytogenetic-testing-genetic-imaging-system-rfp.html http://www.rfpmart.com/1048131-canada-edmonton-alberta-cytogenetic-testing-genetic-imaging-system-rfp.html (1) Vendor needs to provide 3D virtual comparison microscopy system to the government authority located in Honolulu, HI.Minimum Technical / Performance Requirements– 3D High–Capacity Scanning– Perform fast, accurate, and high–resolution 3D scans of cartridge cases and bullets.– Conduct automated batch acquisitions without requiring manual reloading between scans.– Automatically adjust focus and lighting during image capture of cartridge cases and bullets Software– Provide imaging, database, and analysis software with capabilities for 3D visualization, image annotation, image export, database management, multi–threaded 3D–topography database searches, and match scoring.– Include remote viewer software that allows examiners to view scans and access the 3D image database from their workstations remotely.– Store images in a format accessible to the agency even after the hardware reaches end of life.– Create a searchable database that supports automated comparisons.– Enable independent and synchronous manipulation of samples.– Allow overlapping, moving, and rotating of 3D images in both locked and free modes.– Highlight regions of interest on scanned 3D images.– Support hairline–precision movements across overlapping images.  Fri, 07 Nov 2025 00:00:00 -0800 http://www.rfpmart.com/1041061-usa-honolulu-hawaii-3d-virtual-comparison-microscopy-system-rfp.html http://www.rfpmart.com/1041061-usa-honolulu-hawaii-3d-virtual-comparison-microscopy-system-rfp.html (1) Vendor needs to provide microscope and centrifuge annual preventive maintenance service to the government authority located in Honolulu, HI.– Microscope Preventive Maintenance– Visual and Mechanical Inspection• Inspect the overall microscope condition for damage, wear, or missing components.• Check mechanical parts, including focus knobs, stage controls, and mechanical stage movement, for smooth operation.• Inspect all adjustment mechanisms, locks, and tension controls for proper function.• Verify the stability of the base, arm, and head assemblies– Optical System Cleaning and Inspection• Clean all accessible optical components (eyepieces, objectives, condenser, mirrors, and filters) using approved lens cleaning materials.• Check optical surfaces for scratches, fogging, or contamination.• Inspect objective turret alignment and secure mounting.• Verify condenser alignment and iris diaphragm function– Illumination System Check• Inspect the light source housing and optics.• Check bulb or LED condition, brightness, and color temperature.• Verify intensity control and illumination uniformity.• Inspect the power supply, cord, and connectors for wear or damage– Functional and Alignment Verification• Verify optical alignment and image cantering.• Confirm parfocality and focus accuracy between objectives.• Test stage travel limits and smoothness of movement.• Confirm condenser cantering and Kohler illumination  Fri, 07 Nov 2025 00:00:00 -0800 http://www.rfpmart.com/1041057-usa-honolulu-hawaii-microscope-and-centrifuge-annual-preventive-maintenance-service-rfp.html http://www.rfpmart.com/1041057-usa-honolulu-hawaii-microscope-and-centrifuge-annual-preventive-maintenance-service-rfp.html (1) Vendor needs to provide microspectrophotometer supply to the government authority located in IA.Microspectrophotometer Requirements– Visible spectral range ~400nm–1000nm– Sub 5nm spectral resolution– Approximately 2 um or less sampling area (preferably adjustable)– Transmission, reflectance, fluorescence, polarization micro spectroscopy– Includes necessary components (microscope and objectives) or is compatible with existing polarized light microscope Leica DM2500P– High resolution camera with compatible software for imaging (~5 Megapixel with greater than 30fps)– Manual or automated operation– Modular with refractive index measurements (possible to be added in the future)– Installation and training for instrumentation– New system must be compatible with Leica DM2500 microscope currently used by DPS.  Thu, 23 Oct 2025 00:00:00 -0700 http://www.rfpmart.com/1035159-usa-iowa-microspectrophotometer-supply-rfp.html http://www.rfpmart.com/1035159-usa-iowa-microspectrophotometer-supply-rfp.html Vendor needs to provide scanning nitrogen–vacancy diamond microscope supplies to the government authority located in WI. – Agency needs to purchase a scanning NV (nitrogen–vacancy) diamond microscope • Scanning NV (nitrogen–vacancy) microscope requirements: – Scanning magneto–optic Kerr effect (MOKE) imaging mode and atomic force microscopy (AFM) mode– Option allowing hysteresis loop measurements with MOKE– Cooler option to control the sample temperature from room temperature to negative 50 degrees– Vector electromagnet (true 3D vector field) exceeding a minimum of 80mT in an arbitrary direction of space– Scanning NV (nitrogen–vacancy) imaging including minimally the following modes: ODMR, Rabi, Echo, CPMG, XY, Ramsey– Widefield imaging– Temperature regulated enclosure to reduce scanning drift below 5 nm/h– Option to heat the sample to 100 degrees Celsius Wed, 17 Sep 2025 00:00:00 -0700 http://www.rfpmart.com/1022692-usa-wisconsin-scanning-nitrogen-vacancy-diamond-microscope-supplies-rfp.html http://www.rfpmart.com/1022692-usa-wisconsin-scanning-nitrogen-vacancy-diamond-microscope-supplies-rfp.html