<?xml version="1.0" encoding="UTF-8"?>
<?xml-stylesheet type="text/xsl" media="screen" href="/~d/styles/rss2full.xsl"?><?xml-stylesheet type="text/css" media="screen" href="http://feeds.feedburner.com/~d/styles/itemcontent.css"?><rss xmlns:content="http://purl.org/rss/1.0/modules/content/" xmlns:wfw="http://wellformedweb.org/CommentAPI/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom" xmlns:sy="http://purl.org/rss/1.0/modules/syndication/" xmlns:slash="http://purl.org/rss/1.0/modules/slash/" xmlns:feedburner="http://rssnamespace.org/feedburner/ext/1.0" version="2.0">

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	<title>Package Matters</title>
	
	<link>http://javier.esilicon.com</link>
	<description>From die floorplanning to system integration, the ecosystem of the package</description>
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	<sy:updatePeriod>hourly</sy:updatePeriod>
	<sy:updateFrequency>1</sy:updateFrequency>
	<generator>http://wordpress.org/?v=3.0.1</generator>
		<atom10:link xmlns:atom10="http://www.w3.org/2005/Atom" rel="self" type="application/rss+xml" href="http://feeds.feedburner.com/PackageMatters" /><feedburner:info uri="packagematters" /><atom10:link xmlns:atom10="http://www.w3.org/2005/Atom" rel="hub" href="http://pubsubhubbub.appspot.com/" /><item>
		<title>The Future of ASICs in 3D</title>
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		<comments>http://javier.esilicon.com/2011/05/12/the-future-of-asics-in-3d/#comments</comments>
		<pubDate>Fri, 13 May 2011 01:53:50 +0000</pubDate>
		<dc:creator>javier</dc:creator>
				<category><![CDATA[Uncategorized]]></category>

		<guid isPermaLink="false">http://javier.esilicon.com/?p=313</guid>
		<description><![CDATA[<p>3D technology is generating a lot of interest as a way to reduce NRE costs and speed time to market. It is in its nascency so people are looking for a single standard in through-silicon vias (TSVs). This is mainly for reducing infrastructure costs. Unfortunately, I do not think this will be the case. There are [...]]]></description>
			<content:encoded><![CDATA[<p>3D technology is generating a lot of interest as a way to reduce NRE costs and speed time to market. It is in its nascency so people are looking for a single standard in through-silicon vias (TSVs). This is mainly for reducing infrastructure costs. Unfortunately, I do not think this will be the case. There are at least two fundamentally different applications for 3D technology that are driven by completely different incentives. The mobile space is driven mostly by the need for reduced power, height and area. The infrastructure and networking space is driven by the need for yield improvement and the ability to insert more memory than is monolithically possible — at  much lower power. Mobile devices need thin architectures and very thin packages. On the other hand, larger networking devices require thicker 3D-ICs or interposers in order to handle the flatness needed for larger die and the side-by-side architectures of the devices.</p>
<div id="attachment_319" class="wp-caption alignright" style="width: 310px"><a href="http://javier.esilicon.com/wp-content/uploads/2011/05/2-5D-sample3.jpg" rel="lightbox[313]"><img class="size-medium wp-image-319" src="http://javier.esilicon.com/wp-content/uploads/2011/05/2-5D-sample3-300x161.jpg" alt="" width="300" height="161" /></a><p class="wp-caption-text">Basic 2.5D Structure</p></div>
<p>These are really exciting times: 3D and 2.5D technology could change the entire landscape and architecture of ASICs. This has already started in FPGAs and ASSPs, but ASICs face a particular challenge. ASICs do not generally have the benefit of high volume required to secure sources, influence foundries, and gain early access to 3D technology — which they need if they want to be in a leadership role in this implementation.</p>
<p>The exponentially rising cost of tapeouts at lower nodes has resulted in fewer tapeouts at these emerging technologies. Therefore, there are fewer experts in this field. Some companies will be able to spend a lot of money developing the technology and hence developing the expertise in the field. The rest of us will need to depend on strategic partnerships to help, to hand-hold, as we cross the threshold into this technology.</p>
<p>Foundries and assembly houses are keeping their 3D-IC cards close to their chest and waiting for industry leadership to come from the users of 2.5D and 3D technology. Obviously, they do not want to spend all that money to determine later they need to change course to follow the prevailing current.</p>
<p>eSilicon has already spent a good amount of time and effort on 3D- and 2.5D-IC technology. We believe that ASICs will need what we are referring to as a menu for “tiles,” such as memories, microprocessor subsystems, integrated passive devices, FPGA die, and other devices. In the eSilicon model, tiles are proven building blocks. A 2.5D or 3D-IC implementation could include tiles in leading-edge technologies like 28nm, with a lower NRE thanks to a 65nm based interposer. The proven tiles mean the design team doesn’t have to re-invent the wheel, saving time and reducing risk.</p>
<div id="attachment_320" class="wp-caption alignright" style="width: 310px"><a href="http://javier.esilicon.com/wp-content/uploads/2011/05/3D-section1.jpg" rel="lightbox[313]"><img class="size-medium wp-image-320" src="http://javier.esilicon.com/wp-content/uploads/2011/05/3D-section1-300x164.jpg" alt="" width="300" height="164" /></a><p class="wp-caption-text">3D-IC Structure Example</p></div>
<p>We — along with our partners — are moving forward to provide leadership in the 3D-IC space. At the same time, we look within and beyond our customer base to make sure we know where the prevailing currents are flowing. I do not think any of us will have all the answers, but ongoing conversations with partners and customers are getting us closer to understanding where the need is. Once you know where the need is, the direction will be abundantly clear.</p>
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		<item>
		<title>The definition of second-sourcing gets turned on its head.</title>
		<link>http://feedproxy.google.com/~r/PackageMatters/~3/FEUraAD7A48/</link>
		<comments>http://javier.esilicon.com/2011/04/29/the-definition-of-second-sourcing-gets-turned-on-its-head/#comments</comments>
		<pubDate>Fri, 29 Apr 2011 21:39:53 +0000</pubDate>
		<dc:creator>javier</dc:creator>
				<category><![CDATA[Market commentary]]></category>

		<guid isPermaLink="false">http://javier.esilicon.com/?p=303</guid>
		<description><![CDATA[<p>Prior to the horrible tragedy that recently occurred in Japan, the definition of second sourcing was well understood. At least we all thought that was the case. Several companies had second-sourcing strategies they were very proud of for risk management and negotiating power. If we take the example of building an ASIC, the second sourcing may [...]]]></description>
			<content:encoded><![CDATA[<p>Prior to the horrible tragedy that recently occurred in Japan, the definition of second sourcing was well understood. At least we all thought that was the case. Several companies had second-sourcing strategies they were very proud of for risk management and negotiating power. If we take the example of building an ASIC, the second sourcing may mean having more than one OSAT (outsourced assembly and test) for a particular device. While it is much more difficult, a second source for a wafer fab may be possible but may be generally impractical in the ASIC space. Many of these fancy strategies turned out to be pretty useless. </p>
<p>That second sourcing general concept did not mitigate any risk at all when the earthquake, tsunami, nuclear meltdown, loss of life, destruction of infrastructure and power outages hit eastern Japan. We all watched in horror as the people in that region suffered. I was particularly glued to the news channels while one problem after another affected the area near Sendai and Fukushima. While none of my friends and colleagues in Japan nor their families were impacted by anything other than power outages, it was tough not to feel connected with the suffering. </p>
<p>None of our direct supply partners were affected. In fact, none of their suppliers were significantly affected either. The problem occurred several links down in the supply chain. Unfortunately, even though we were greatly diversified in supply partnerships based throughout the world, once you go a few links deeper in the various supply chains, we realized that many of these companies shared the same links. It was the common links that were directly affected by the disaster. Materials such as the glass fiber used in BGA laminates; the fillers used in soldermask and underfill materials; and the big whammy — the main source in the world for BT (bizmalemide triazine) raw material was shut down. Mitsubishi Gas Chemical (MGC) held about a 70-percent market share and Hitachi held an additional 20 percent. When the crisis occurred both of the plants were closed. Hitachi returned to operation after a couple of weeks but was subject to rolling blackouts like every other company in the area. MGC stayed shutdown a while longer with only a small percentage of production starting a few weeks after the disaster. The industry collectively held its breath and readied itself for a gut-shot. </p>
<p>It took a few days before we were able to get details on what factories were affected as it is generally difficult to jump more than a few links in the supply chain to get precise information. Luckily our strong strategic partnerships helped with getting the necessary info, and we formed what we called a &#8220;tiger team&#8221; to understand our exposure and deploy a disaster recovery plan with our supply partners and customers. A dozen members of our eSilicon team had a new half-time job ensuring continuity of supply for our production customers as well as those entering proto-validation phase. This often required the need to change material sets before all of the reliability could be collected. Luckily, there was usually existing data on similar parts that could be leveraged to gain confidence. Those already second-sourced projects were just as affected as the sole-sourced products since the various supply partners shared common supply chain links. So much for good disaster recovery planning prior to the disaster! </p>
<p>Given that we were not the only ones finding alternate sources, the suppliers of the alternate materials became overloaded with new requests. This was an incredible opportunity for tier-two suppliers to gain market share. In order to ensure the supply, we had to occasionally prepare documentation and tooling for triple sourcing, given the fluidity of the loading at these alternate suppliers. Details changed on a near-daily basis. Luckily, a characteristic of our VCP (value chain producer) model requires relationships with a broad range of suppliers.  This helped us navigate the crisis in a way that other companies, large or small, would have had a much more difficult time with.</p>
<p> Our customers were kept informed and given recommendations and options. This seemed to keep everyone focused on the end-goal of overcoming the supply problem. So far, we have been able to execute to forecasts with some products requiring material changes. At this point, the worst of the impact will just be an occasional delivery delay of a couple of weeks, which is far better than the customer base expected when the news of the supply problems began to emerge. We are not through the supply crisis, but we appear to be over the hump.</p>
<p> While we can manage the supply side very well, we have little control over the demand side. In other words, if the world&#8217;s supply of mobile phone microphones is wiped out as an example, no one will ship cell phones. This means that even though a company may fully meet their production commitments, they are still potentially victim to the delivery performance of other companies, if they have a common customer. It is clear, we are all in this together.</p>
<p> Once the dust completely settles, the industry will need to focus on what we learned from this crisis. Our highly globalized industry can easily be impacted yet again if industry clusters like the ones in Taiwan, Korea, Singapore, Japan and the US have a major catastrophe. We, as an industry, need to define second sourcing through many more links in the supply chain than we have in the past.</p>
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		<title>Thru-Silicon Vias, Current State of the Technology</title>
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		<comments>http://javier.esilicon.com/2011/01/30/thru-silicon-vias-current-state-of-the-technology/#comments</comments>
		<pubDate>Sun, 30 Jan 2011 12:04:37 +0000</pubDate>
		<dc:creator>javier</dc:creator>
				<category><![CDATA[In the crystal ball]]></category>
		<category><![CDATA[Tech Bits]]></category>

		<guid isPermaLink="false">http://javier.esilicon.com/?p=150</guid>
		<description><![CDATA[<p class="wp-caption-text">Cross Section of TSVs, source: P. Leduc, LETI, D43D, 2010</p>
Ready for primetime in ASICs&#8230;almost
<p>Thru-silicon-vias (TSVs) have become a very hot topic in in recent months. Ever since Xilinx reported that they are using a 2.5D TSV approach for their Virtex-7 FPGAs (http://bit.ly/ayfOgy), the industry started to salivate with the prospects of this new technology. While this [...]]]></description>
			<content:encoded><![CDATA[<div id="attachment_282" class="wp-caption alignright" style="width: 310px"><a href="http://javier.esilicon.com/wp-content/uploads/2011/01/tsv-x-section2.jpg" rel="lightbox[150]"><img class="size-medium wp-image-282" src="http://javier.esilicon.com/wp-content/uploads/2011/01/tsv-x-section2-300x207.jpg" alt="" width="300" height="207" /></a><p class="wp-caption-text">Cross Section of TSVs, source: P. Leduc, LETI, D43D, 2010</p></div>
<h2>Ready for primetime in ASICs&#8230;almost</h2>
<p>Thru-silicon-vias (TSVs) have become a very hot topic in in recent months. Ever since Xilinx reported that they are using a 2.5D TSV approach for their Virtex-7 FPGAs (<a href="http://bit.ly/ayfOgy" target="_blank">http://bit.ly/ayfOgy</a>), the industry started to salivate with the prospects of this new technology. While this technology may be accessible for larger stacked memory, FPGAs, MEMS devices, and CMOS image sensors, this does not inherently mean it is ready for ASIC applications. Before we get into some of the details, it is important we take a moment to calibrate with the terminology used in this space.</p>
<h2>Terminology</h2>
<ul>
<li>2.5D: refers to having one or several die mounted to another inactive die with thru-silicon vias in order to route nets between the active die and to the substrate.</li>
<li>3D-IC: refers to one or several die mounted to the backside of an active silicon die through these TSVs</li>
<li>Glass interposer: A die made of glass with vias that connect both sides of glass die together for signal/power transmission.</li>
<li>Silicon interposer: A die made of silicon with vias that connect both sides of glass die together for signal/power transmission.</li>
<li>Tile: a die mounted to a glass-interposer, silicon interposer or 3D-IC. These generally have microbump pitches of 30-80um.
<div id="attachment_288" class="wp-caption alignright" style="width: 310px"><a href="http://javier.esilicon.com/wp-content/uploads/2011/01/smallbump6.jpg" rel="lightbox[150]"><img class="size-medium wp-image-288" src="http://javier.esilicon.com/wp-content/uploads/2011/01/smallbump6-300x225.jpg" alt="" width="300" height="225" /></a><p class="wp-caption-text">Short flat microbumps, source: KK Tzu, ITRI, RTI 2010</p></div></li>
<li>TSV: Thru-silicon-via, a via that connects two opposite sides of a silicon die/wafer.  This can be seen in the image in the upper right corner.</li>
</ul>
<h2>EDA tool infrastructure</h2>
<p>The market for the design of 3D-IC and 2.5D interposers really started with several niche players making stand-alone tools to address this need. Most of these are on open-architecture platforms so they share data with some other EDA tools. It is not clear if these niche EDA tool companies will gain significant market share before the larger EDA tool companies have a chance to surpass them. At least one of the major EDA tool companies is already presenting a solution at tradeshows. The lack of design kits from the wafer fabs has given these large EDA companies a chance to catch up and apply their greater resources to enter this 3D-IC and 2.5D design space.</p>
<p>One interesting observation I made after seeing some of these tools in action is that they appear to be built on package design platforms instead of physical design platforms. This may be because 2.5D solutions look like miniature package substrates that then get inserted into other more-conventional package substrates. Therefore, from an EDA tool perspective, this can appear much more like a stacked-die package design rather than a physical design on silicon. What has not been clearly demonstrated is the solution for 3D-IC in ASIC designs, by a major EDA tool company. This would appear much less like a stacked-die layout and more like a physical design, so there is still some more evolution needed in the tool space to address this 3D-IC technology. Critical steps such as LVS (layout versus schematic) checking still have limitations with this technology.  Additionally, timing analysis of nets between chips in this space is further complicated by the TSV connections and routing on different die without signal buffering.</p>
<p><div id="attachment_289" class="wp-caption alignright" style="width: 310px"><a href="http://javier.esilicon.com/wp-content/uploads/2011/01/medbump2.jpg" rel="lightbox[150]"><img class="size-medium wp-image-289" src="http://javier.esilicon.com/wp-content/uploads/2011/01/medbump2-300x211.jpg" alt="" width="300" height="211" /></a><p class="wp-caption-text">Short copper posts with solder, source: E. Beyne, IMEC, RTI 2010</p></div>
<p>Most sources agree that 3D-IC will not likely be mature enough for wide adoption for another two years or so in the ASIC space. On the other hand, 2.5D is much further along with regards to EDA tool readiness, likely due to the silicon-interposer&#8217;s similarity to an embedded package substrate.</p>
<h2>Interposer supply</h2>
<p>The good news here is that there are several interposer suppliers in the market enabling the 2.5D marketplace. The bad news is that their solutions are considerably different from one another and so are their cost structures. The major wafer fabs are keeping their cards close to their chest until clear standards emerge in order to avoid the expense of re-tooling at a later date. For those of us in the ASIC space, this poses some interesting questions. Either partner with new suppliers for early access to the technology or wait until the major industry players open their doors with standard design kits. Only a select few are being given a sneak preview of the incomplete design kits as early adopters. The rest either end up waiting by the sidelines or partnering with the select few able to access these design kits.</p>
<h2>Wafer probe</h2>
<p>Probing of the tiles that interface to the silicon interposer or 3D-IC die cannot be done with conventional vertical-probe or cantilever probe technology. After all, these microbump pitches of 30-80um are too tight for these conventional approaches. Instead, several companies are devising new families of probe cards, which are ge</p>
<div id="attachment_290" class="wp-caption alignright" style="width: 310px"><a href="http://javier.esilicon.com/wp-content/uploads/2011/01/tall-bump2.jpg" rel="lightbox[150]"><img class="size-medium wp-image-290 " src="http://javier.esilicon.com/wp-content/uploads/2011/01/tall-bump2-300x212.jpg" alt="" width="300" height="212" /></a><p class="wp-caption-text">Tall posts with solder tips, source: P. Royannez, et.al., IME, RTI2010</p></div>
<p>nerally based on MEMS technology. This means that the up-front cost for a probe card may go up considerably. MEMS probe cards have been available for some time, but the finer technology needed may make these a little more difficult to manufacture and maintain. The production cost structure here is not well understood yet, but at least a solution exists.</p>
<h2>Assembly</h2>
<p>Assembly is one of the hurdles that has been addressed, but unfortunately there is little uniformity in how this is done. Some solutions in the wafer-to-wafer (W2W) format utilize a multitude of bonding techniques, but in the ASIC space, this should not be a major concern. It is unlikely that W2W bonding will be used in ASICs other than embedding stacked memory die in a 2.5D or 3D ASIC solution. At this point, the wafers are already bonded to each other and will likely be delivered by the memory suppliers in tape-and-reel format.</p>
<p>The two options for ASIC assembly of TSV devices will be die-to-wafer (D2W) and die-to-die (D2D), but I expect D2D to be the prevalent format for ASIC solutions. The reason I expect D2D to be the dominant format for ASIC assembly is that this allows the greatest flexibility of what to put on the TSV wafer, and it also eliminates the difficult thin-wafer handling. Wafers with TSV will be somewhere in the 50-150um thick range, and, if given the option, the assembly sites would surely opt for the more robust D2D solution.</p>
<p>There are no clear assembly standards. Standards are being initiated for wafer handling as well as reliability, but assembly still has a hole in standards coverage. For example, some TSV technologies have copper posts with solder on the end, others have round bumps, while others may have relatively flat connections that are meant for having copper posts on both die in order to form the interconnect. Examples of these can be seen on the lower three images in this post. The assembly for these different formats may require different assembly strategies that may not be easily mixed. In addition, the gap between the die may be different resulting in different underfilling (plastic gap-filling between the die) materials and methodologies. In order to have multiple die capable of assembly on the same 2.5D or 3D-IC device, the assembly processes need to be compatible. At the moment, ASSP and FPGA providers design all of the die in the package, but this may not be the case in the ASIC space. For this, standards will be required to enable this technology for those of us the in ASIC realm.</p>
<h2>Reliability</h2>
<p>JEDEC’s JC-14.3 committee is working on the reliability standards required for this technology. This will clearly address concerns currently preventing wider adoption of the technology. Having standards that clearly define reliable packaging will help us all, so we are looking forward to the output of this committee.</p>
<h2>Shipment of TSV wafer and die</h2>
<p>Semi and Sematech have been working on standards primarily for handling these delicate TSV wafers and die. The current directions include bonded wafers, bare die, W2W attachment methods, etc. These standards normally take about a half-year to release, so expect to see the fruit of this effort towards the middle of 2011. This happens to coincide with the expected release of the wide-IO memory standard being developed  by JEDEC. This means that the end of 2011 should see a significant flurry of activity.</p>
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		<title>The Turning Point… Can MCM’s be less expensive than single die solutions?</title>
		<link>http://feedproxy.google.com/~r/PackageMatters/~3/XUsFu_nDTuw/</link>
		<comments>http://javier.esilicon.com/2010/12/30/the-turning-point-can-mcms-be-less-expensive-than-single-die-solutions/#comments</comments>
		<pubDate>Thu, 30 Dec 2010 23:01:40 +0000</pubDate>
		<dc:creator>javier</dc:creator>
				<category><![CDATA[In the crystal ball]]></category>

		<guid isPermaLink="false">http://javier.esilicon.com/?p=205</guid>
		<description><![CDATA[<p>In the epic battle of cost and performance, MCM&#8217;s (multi-chip modules) had generally lost to SoC&#8217;s (system on chips) due to higher package assembly costs and lower performance.  The tides are turning.  Several factors have been in play in recently:</p>

Package assembly costs of MCM&#8217;s have been dropping in recent years
MCM package technologies are becoming commonplace instead of [...]]]></description>
			<content:encoded><![CDATA[<p><a href="http://javier.esilicon.com/wp-content/uploads/2010/12/fcwb3.jpg" rel="lightbox[205]"></a><a href="http://javier.esilicon.com/wp-content/uploads/2010/12/stfbga1.jpg" rel="lightbox[205]"></a><a href="http://javier.esilicon.com/wp-content/uploads/2010/12/mem2.jpg" rel="lightbox[205]"></a><a href="http://javier.esilicon.com/wp-content/uploads/2010/12/sidebyside1.jpg" rel="lightbox[205]"></a><a href="http://javier.esilicon.com/wp-content/uploads/2010/12/tsv2.jpg" rel="lightbox[205]"></a><a href="http://javier.esilicon.com/wp-content/uploads/2010/12/bar.jpg" rel="lightbox[205]"></a><a href="http://javier.esilicon.com/wp-content/uploads/2010/12/bar2.jpg" rel="lightbox[205]"><img class="alignright size-full wp-image-250" src="http://javier.esilicon.com/wp-content/uploads/2010/12/bar2.jpg" alt="" width="259" height="707" /></a>In the epic battle of cost and performance, <a href="http://javier.esilicon.com/wp-content/uploads/2010/12/a42.jpg" rel="lightbox[205]"></a>MCM&#8217;s (multi-chip modules) had generally lost to SoC&#8217;s (system on chips) due to higher package assembly costs and lower performance.  The tides are turning.  Several factors have been in play in recently:</p>
<ul>
<li>Package assembly costs of MCM&#8217;s have been dropping in recent years</li>
<li>MCM package technologies are becoming commonplace instead of being relegated to certain applications such as memory or image sensors.</li>
<li>Emerging technologies are eliminating performance limits on MCM&#8217;s</li>
<li>Tapeout costs are increasing exponentially as wafer technology nodes shrink<a href="http://javier.esilicon.com/wp-content/uploads/2010/12/fcwb2.jpg" rel="lightbox[205]"></a></li>
</ul>
<p>Tapeouts that only cost about $200k a few nodes ago now run in the <a href="http://javier.esilicon.com/wp-content/uploads/2010/12/f2f2.jpg" rel="lightbox[205]"></a>millions of dollars at 28nm.  This means, companies will need to have fewer tapeouts in order to support their <a href="http://javier.esilicon.com/wp-content/uploads/2010/12/amkor2.jpg" rel="lightbox[205]"></a>product lines.  The risk <a href="http://javier.esilicon.com/wp-content/uploads/2010/12/sip2.jpg" rel="lightbox[205]"></a>with each tapeout is higher and there is not much room for adding different flavors of product unless there is a considerable market for each individual product.  MCM&#8217;s may serve as a solution for this issue.  One approach for MCM&#8217;s is to create a base chip that can interface with several different devices to make a family of products.  The base chip can remain the same, but be paired with complementary devices and potentially different packages in order to gain the variety of interfaces or functionality needed to serve multiple markets or customer requirements. </p>
<h2>What drives the cost?</h2>
<p>The interconnect between these chips is the main cost factor.  Direct die-to-die wirebonding can be the least expensive assuming the die are planned for MCM integration.  This can be seen as the top-most two images on the right.  That means there are no funky wirebond angles or dense traces on a laminate acting as jumpers to move a signal from one side of the die to the other.  Mixing interconnect methodologies such as flipchip and wirebond, can drive up cost, but even this option is becoming main-stream. </p>
<p><span style="color: #800080">The single most expensive cost-driver is poor planning.</span>  If two die are designed in isolation, integrating them into a low-cost mcm will be more expensive (possibly much more) than if at least one of the die was <span style="color: #800080">designed with an awareness of the interconnectivity of the other die in the mcm package</span>.</p>
<h2>Area Benefit</h2>
<p>Package-on-Package (PoP) technologies have been mainstream for some time.  The last Apple iPhone A4 processor used a flipchip die on the bottom package and two wirebonded stacked memories for the upper package.  The benefit here was driven mainly by board area, but this volume application is also helping to drive down cost for this approach in the industry. </p>
<p>Applications such as high-end network processors are not as cost sensitive.  For these applications, the adoption of MCM packaging has really been driven by area reduction and external pin count reduction.  By bringing the memory devices into the package, the number of balls needed to connect to the PCB is considerably reduced.  While this does not appear initially to be a cost-incentivized action on the package, it does reduce the overall system cost.  Depending upon how this is executed, bringing external memory (bare die or packaged memory) into the MCM may actually be a much less expensive option under some circumstances.</p>
<h2>What will drive MCM adoption?</h2>
<p>Cost and area savings are clear and valid reasons for moving towards MCM&#8217;s, but a drive towards <span style="color: #800080">flexibility </span>may be the next large factor.  The ever-increasing costs of a tapeout means that it may no longer be practical to have a family of parts that serve various segments in a market.  Instead, a single tapeout that integrates other devices to add flexibility may offer the opportunity to have a family of parts with a single tapeout.  This is a new angle on design-and-reuse.  Design-and-reuse which was a cornerstone of SoC IP, but now the reuse may come from die that are shared across multiple packages in order to mix and match interfaces or additional functionality.  We have already seen many of these strategies in the market as well as in our own activity.  This driver, may not tackle the unit-cost challenge, but it certainly addresses the issue of rising NRE costs for the most advanced nodes.  The difficulty here is changing the mindset of ASIC design teams so that they start with this end-game strategy in mind.  This MCM activity requires much more concurrent activity with what was once considered downstream activity such as packaging, thermal management, signal integrity, etc.  Some companies will understand this and take advantage of it sooner.  Once they&#8217;ve established a critical mass of complementary die to use in adding flexibility to their ASIC&#8217;s they will have an advantage over those who underestimated the extent of  the potenial benefits of MCM adoption.</p>
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		<title>What’s the cheapest package that will work?</title>
		<link>http://feedproxy.google.com/~r/PackageMatters/~3/bWjXuCVKsDE/</link>
		<comments>http://javier.esilicon.com/2010/11/30/whats-the-cheapest-package-that-will-work/#comments</comments>
		<pubDate>Tue, 30 Nov 2010 15:25:23 +0000</pubDate>
		<dc:creator>javier</dc:creator>
				<category><![CDATA[Tech Bits]]></category>

		<guid isPermaLink="false">http://javier.esilicon.com/?p=201</guid>
		<description><![CDATA[A low cost package may end up raising your system costs. [...]]]></description>
			<content:encoded><![CDATA[<p><span style="font-size: large"><span style="color: #808080">&#8230; is not right question to ask.</span></span></p>
<p><span style="font-size: medium"><span style="color: #800080">A low cost package may end up raising your system costs.</span></span></p>
<p>So often, I come across questions from customers asking the the lowest cost package technology that will work.  The package by itself should not be the singular focus when considering the lowest-cost solution for a new ASIC.  The best approach is to take a few steps back and consider the system, and what would work best for that given system, from a  variety of standpoints such as routability, thermal, signal integrity, etc. </p>
<p>Let&#8217;s take an example of a basic WiFi enabled ASIC.  What is the lowest cost solution?  Well, it depends upon what it is going into.  If the part is going into a handheld device such as a smartphone, then the lowest cost solution would likely be a WLCSP (wafer-level chip-scale-package) which is much like a bumped die without a package.  Given that the PCBs (printed circuit boards) used by smart phones can handle this smaller bump pitch and trace/space geometry, this makes a lot of sense.  On the other hand, if this was going into a home internet router, a WLCSP would be enormously expensive since it would require utilizing PCB design rules that are uncommon for these larger PCB&#8217;s found in typical home routers.  It would end up making the system cost go up as the PCB required to route the WLCSP would be likely cost several dollars more.  Instead going to a larger conventional TFBGA with something like 0.8mm or 1.0mm ball pitch makes sense.  This is a clear example of how a more expensive package is a better cost solution. </p>
<p>There are many tradeoffs to be made.  The previous example is based on exit routing rules.  Let&#8217;s consider an example of thermal and signal integrity considerations on a processor-type device.  When making the tradeoffs between a thermally-enhanced PBGA (HSBGA) or a flipchip BGA (FCBGA), the HSBGA may be less expensive from a packaging cost standpoint.  They may both work thermally and electrically, and the HSBGA may be less expensive, so that may appear as the more logical choice, right?  Maybe not!  With a deeper analysis, you may find that the more expensive FCBGA may be a more prudent solution.  The FCBGA will likely end up consuming less of the signal integrity budget (reflection and loss) and would also be considerably more thermally efficient then a HSBGA.  This may end up requiring a less expensive PCB and a smaller heatsink.  It may also require less airflow or none at all.</p>
<p>Please make sure to consider the cost of the system above all else.  The cost of the individual component may not be nearly as relevant.  Having all of the resources available to make decisions at multiple levels upfront is paramount.  If you do not have these resources easily available, finding a partner than can bring these vantage points to the table will work to your advantage.</p>
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		<title>What’s with that big package?</title>
		<link>http://feedproxy.google.com/~r/PackageMatters/~3/I6MfbgH48XE/</link>
		<comments>http://javier.esilicon.com/2010/09/21/what%e2%80%99s-with-that-big-package/#comments</comments>
		<pubDate>Tue, 21 Sep 2010 20:33:07 +0000</pubDate>
		<dc:creator>javier</dc:creator>
				<category><![CDATA[Uncategorized]]></category>

		<guid isPermaLink="false">http://javier.esilicon.com/?p=179</guid>
		<description><![CDATA[<p>As serdes data rates have been going up for years, and 10-Gbps interfaces have been becoming commonplace, I figured a few years ago that pin counts on packages would start going down.  Boy, was I wrong on that prediction!  The trend instead was to put more of those high-speed interfaces on devices.</p>
<p>For years, a 45x45mm body size [...]]]></description>
			<content:encoded><![CDATA[<p>As serdes data rates have been going up for years, and 10-Gbps interfaces have been becoming commonplace, I figured a few years ago that pin counts on packages would start going down.  Boy, was I wrong on that prediction!  The trend instead was to put more of those high-speed interfaces on devices.</p>
<p><a href="http://javier.esilicon.com/wp-content/uploads/2010/09/cross-section.jpg" rel="lightbox[179]"></a><a href="http://javier.esilicon.com/wp-content/uploads/2010/09/cross-section1.jpg" rel="lightbox[179]"><img class="alignleft size-medium wp-image-185" src="http://javier.esilicon.com/wp-content/uploads/2010/09/cross-section1-300x152.jpg" alt="" width="300" height="152" /></a>For years, a 45x45mm body size was really the upper limit on organic flipchip packages (HFCBGA). The reason for this was the curvature of the package laminate that occurred due to the thermal expansion mismatch between the silicon (2.5ppm/°C) and the substrate (17ppm/°C).  As the package grew, this curvature caused a flatness problem for the field of solderballs on the package.  This spec is referred to as coplanarity and is governed by JEDEC standards.  For these larger packages, the spec for coplanarity is 0.2mm.  This is a very important and seldom discussed dimension in larger packages, since it will determine whether or not a part will be solderable to a PCB.  Generally this number is pretty conservative, and it needs to be since JEDEC does not know how thick or thin of a solder stencil will be used at PCB assembly.  A thick stencil means a thicker deposit of solder will be made on the PCB at assembly, which would accommodate a more warped package.  This ignores the fact that as parts reach solder melt temperatures, they tend to flatten out again since this high temperature is a much lower stress condition for a package in general.  The “ddd” dimension in the dimensioned image shows how this coplanarity dimension is specified.</p>
<p>Ceramics had always been a solution to maintaining acceptable flatness for larger devices, but the inordinately high cost made this tradeoff difficult to swallow.  Stiffener rings have also been used, but they are difficult to manage on a laminate prior to flipchip assembly, and are only usable on more expensive assembly lines.  Lower-cost flipchip assembly subcontractors do not use devices with stiffener rings, given that they do not fit well into their assembly processes.</p>
<p><a href="http://javier.esilicon.com/wp-content/uploads/2010/09/gorilla21.jpg" rel="lightbox[179]"><img class="alignright size-full wp-image-189" src="http://javier.esilicon.com/wp-content/uploads/2010/09/gorilla21.jpg" alt="" width="80" height="105" /></a>Several recent events have broadened the horizon for organic flipchip packages.  There are now newer package dielectric materials that have a lower thermal expansion rate.  This makes a part warp less after flipchip attach reflow.  Another key point is that some assembly houses are using much thicker heatspreaders to reflatten a package and keep it flatter.  This seems to have opened the door to flipchip packages up to the 55x55mm range. </p>
<p>As the available size of a package grows and the interfaces continue to utilize more high-speed serdes, you just can’t ignore the 800-pound gorilla in the room, heat dissipation!  Pulling the heat out of these devices is rapidly becoming a bottleneck in this trend.  The cost of pulling the heat out of these devices has been an afterthought, but really needs to be considered up front when planning for a device.  Thermal estimates are not always accurate early on, so planning for a worst-case scenario may be prudent.</p>
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		<title>Should you be leadfree? Maybe not!</title>
		<link>http://feedproxy.google.com/~r/PackageMatters/~3/l83qgbScU2I/</link>
		<comments>http://javier.esilicon.com/2010/08/14/should-you-be-leadfree-maybe-not/#comments</comments>
		<pubDate>Sat, 14 Aug 2010 17:05:27 +0000</pubDate>
		<dc:creator>javier</dc:creator>
				<category><![CDATA[Tech Bits]]></category>

		<guid isPermaLink="false">http://javier.esilicon.com/?p=173</guid>
		<description><![CDATA[<p>The European Union (EU) has certainly led the charge in the elimination of many hazardous chemical for semiconductor devices with the RoHS legislation (Reduction of Hazardous Substances.)  Most of these were not present in the first place or were more easily eliminated or substituted with environmentally safer materials.  One material, lead, had proven to be a [...]]]></description>
			<content:encoded><![CDATA[<p>The European Union (EU) has certainly led the charge in the elimination of many hazardous chemical for semiconductor devices with the RoHS legislation (Reduction of Hazardous Substances.)  Most of these were not present in the first place or were more easily eliminated or substituted with environmentally safer materials.  One material, lead, had proven to be a thorn in the side of flipchip packaging technologies for some time.  Lead was instrumental in flipchip technology development since its inception.  The lead-tin alloys used have proven to be the most robust interconnection material for flipchip interconnects.  Many materials have been developed to substitute non-hazardous materials but they have all proven to be less reliable than the lead-tin alloys that the RoHS legislation originally hoped to eliminate.  This has caused the EU to postpone the deadline for the elimination of lead.  The use of lead was originally slated to be eliminated by 2006, then 2010 and most recently by 2014.  Follow-on addendums to the RoHS regulations listed the materials and particular uses that were either exempted or had delayed implementation deadlines.  This moving deadline was really caused by the inability of the semiconductor industry to find a reliable, equivalent substitute for lead-tin alloys.  This issue is exacerbated with larger flipchip die sizes.</p>
<p><span style="font-size: medium">RoHS5</span><br />
Unofficially, the use of a term deemed &#8220;RoHS5&#8243; was developed to describe package that had external leadfree interconnects (usually solder balls) but had lead in the first level interconnect.  The original RoHS regulation sought to eliminate six materials from use in products, but given that lead in the die-to-package interconnect was exempted, these parts were referred to as RoHS5.  This RoHS5 term, though widely used, is not documented anywhere in the RoHS regulation.  It appears to have been started by Cisco to describe their devices with leaded bumps, and the term just caught on.</p>
<p>Truly leadfree flipchip devices do exist.  Devices with smaller die, generally less than 16mm on a side can pass reliability testing with completely leadfree bumps.  The assembly plants and third-party bumping facilities were on-board quickly with this capability years ago, but the reliability was always in question given the lack of production experience and long term reliability data.  Wafer fabs were late to the party with most of them lacking their own captive bumping resources.  Many of the major wafer foundries still do not have leadfree bumping capabilities available whereas they were the dominant source for leaded bumping. </p>
<p>Commercial parts with shorter lifespans were really the first to adopt leadfree bumping processes as longer product lifetimes were not needed.  These commercial flipchip devices generally have smaller die where there is much less stress introduced from thermal expansion mismatches compared to larger die.   The &#8220;green&#8221; product programs which were most popular in Japan and with Japanese manufacturers also encouraged leadfree assembly but were mostly targeted to commercial products with shorter lifespans as well.  The product types that proved to be the most difficult to migrate to leadfree bumping solutions were larger silicon products that needed longer life spans such as network and storage devices.  These devices generally need to last for 20 years.  This seems to be the last frontier on completely leadfree flipchip devices.  So, if you are in this space, should you take the risk on leadfree bumping?</p>
<p><span style="font-size: medium">Big Leadfree Die and the Strategy</span><br />
Currently, the design rules used for leadfree and conventional leaded bumps are the same.  That means, there is a minimal expense needed to change the alloy from RoHS5 to fully RoHS compliant at a later date.  This expense may include a lower cost bumping mask at the bumping facility, a solder stencil change at the substrate manufacturer and perhaps another stencil at the assembly house for the solder paste used for the passive on the substrate if there are any.  These costs are small compared to the risk taken to use leadfree solder paste on large die in long-life applications.  Why bother when you can just change it later when the EU decides to stop extending the lead exemptions for bumps.  Wait a minute! I obviously neglected the high cost of requalifying the system at a later date when the change is made to leadfree.  While this may be a large expense, I argue that this is a requalification that will happen anyway.  The main difference I see with larger network processors is that they tend to have a lot of familiar company on a PCB.  Chances are, your device would not likely be the only one with lead in the bump alloy on the die.  Therefore, once the EU stops moving the line in the sand, these other component suppliers will update their parts, assuming good leadfree reliability data is available then.  Therefore, the requalification will need to happen at that time anyway, and this is the right time to convert the components to full leadfree configurations, using the latest leadfree bump alloy available and the latest reliability data.</p>
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		<title>Misuse of thermal numbers</title>
		<link>http://feedproxy.google.com/~r/PackageMatters/~3/VcfwGUBeriU/</link>
		<comments>http://javier.esilicon.com/2010/06/21/misuse-of-thermal-numbers/#comments</comments>
		<pubDate>Mon, 21 Jun 2010 20:17:36 +0000</pubDate>
		<dc:creator>javier</dc:creator>
				<category><![CDATA[Analysis zone]]></category>
		<category><![CDATA[Tech Bits]]></category>

		<guid isPermaLink="false">http://javier.esilicon.com/?p=104</guid>
		<description><![CDATA[<p>So many of us in the semiconductors realm are guilty of using JEDEC thermal data incorrectly.  I often get questions such as &#8220;how much power can this package handle&#8221; or &#8220;what&#8217;s the thermal efficiency of this package.&#8221;  Unfortunately, in almost all situations these questions cannot be generally answered. </p>
<p>The numbers we throw around for thermal performance come from the [...]]]></description>
			<content:encoded><![CDATA[<p>So many of us in the semiconductors realm are guilty of using JEDEC thermal data incorrectly.  I often get questions such as <em>&#8220;how much power can this package handle&#8221;</em> or <em>&#8220;what&#8217;s the thermal efficiency of this package.&#8221;</em>  Unfortunately, in almost all situations these questions cannot be generally answered. </p>
<p>The numbers we throw around for thermal performance come from the JEDEC JESD51 thermal standard.  This spec was really created to compare one package to another.  Many folks have used this to determine the thermal performance of their package in their system, which is not correct.  The following statement is contained in the twelfth chapter in the spec, and is commonly overlooked:</p>
<p style="padding-left: 30px"><em><span style="color: #993366">“While standardized thermal test information cannot apply directly to the many specific applications, the standardized results can help compare the relative thermal performance of different packages. A more meaningful comparison is possible if the test conditions are understood along with the factors affecting package thermal performance&#8230;</span></em></p>
<p style="padding-left: 30px"><em><span style="color: #993366">Several factors affect the thermal performance of a device in a user’s application. These include power dissipation in the component; airflow velocity, direction and turbulence level; power in adjacent components; two-sided vs. one-sided active component mounting; printed circuit board (PCB) orientation; and adjacent boards and their power dissipation.”.</span></em></p>
<p>Therefore, even the JEDEC committee that compiled this standard did not intend for these theta-ja and theta-jc numbers to be used the way they commonly are.  These really are intended to compare one package to another.   They do happen to be helpful indicators of approximate performance.</p>
<p>Let&#8217;s take a common example of how data may be misused in an application.  Assume you have a device that is going into a handheld device such as a cell phone.  Most folks will assume that theta-ja (thermal resistance from junction to ambient air) without airflow would make the most sense.  This is actually a poor indicator of performance.  First of all, the circuit boards used in a handheld device are generally smaller than the JEDEC 100mm x 100mm test boards, and hence have a much lower ability to absorb heat (lower thermal mass.)  More importantly, the JEDEC condition of no airflow is actually more accurately described as no forced-airflow.  <a href="http://javier.esilicon.com/wp-content/uploads/2010/06/no-airflow2.gif" rel="lightbox[104]"><img class="alignright size-medium wp-image-157" src="http://javier.esilicon.com/wp-content/uploads/2010/06/no-airflow2-300x142.gif" alt="" width="300" height="142" /></a><a href="http://javier.esilicon.com/wp-content/uploads/2010/06/no-airflow1.gif" rel="lightbox[104]"></a>The JEDEC condition does allow for natural airflow to occur since the board is in a 300mm x 300mm x 300mm cube, so heat can rise from the device (shown in purple in the image,) cool off as it rises and then fall again, causing a natural air circulation in this large enclosure.  This would not be the environment inside of a handheld device (unless your target market had really large hands).  Therefore, there are several reasons why theta-ja is not a good indicator of thermal performance in this particular system.</p>
<p>This particular example has an interesting thermal solution.  I&#8217;m sure most people reading this have had long conversations on a mobile phone when they notice their ear gets hot.  Rest assured this is not caused by radiation.  Instead, mobile phone system designers use one of the few components inside of their system that can spread heat effectively, which is the LCD display housing inside of the phone.  Many of the most power hungry devices are located there and are in contact with the display to dissipate heat from the sealed interior of the phone to the exterior.  Unfortunately, your ear is generally in contact with this same LCD display, so your ear ends up being the heatsink for these power devices.  This is just another good reason to use a hands-free set while on a long discussion.</p>
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		<title>Going MCM?  Do it backwards!</title>
		<link>http://feedproxy.google.com/~r/PackageMatters/~3/mgeoNa5iA9E/</link>
		<comments>http://javier.esilicon.com/2010/04/01/going-mcm-do-it-backwards/#comments</comments>
		<pubDate>Thu, 01 Apr 2010 14:03:58 +0000</pubDate>
		<dc:creator>javier</dc:creator>
				<category><![CDATA[Tech Bits]]></category>

		<guid isPermaLink="false">http://javier.esilicon.com/?p=14</guid>
		<description><![CDATA[<p>As packages evolve into the 3D space or other formats of SiP (System-in-Package) integration, one thing is clear.  The integration has to be planned first.  This integration has to be considered from the system-level and die floorplan concurrently.  I often see prospective clients with SiP solutions where various components were designed in isolation of the complementary [...]]]></description>
			<content:encoded><![CDATA[<p><a href="http://javier.esilicon.com/wp-content/uploads/2010/03/MCMBGA.jpg" rel="lightbox[14]"><img class="alignright size-full wp-image-127" src="http://javier.esilicon.com/wp-content/uploads/2010/03/MCMBGA.jpg" alt="" width="283" height="191" /></a>As packages evolve into the 3D space or other formats of <a href="http://www.esilicon.com">SiP (System-in-Package)</a> integration, one thing is clear.  The integration has to be planned first.  This integration has to be considered from the system-level and die floorplan concurrently.  I often see prospective clients with SiP solutions where various components were designed in isolation of the complementary components.  For example, if an ASIC is being designed to be integrated with memory device, and the memory device is pre-existing, then the ASIC must be designed with the awareness of how it must be connected to that memory.  ASIC physical designers are trained to perform die layout to optimize for area, timing, and cost/schedule efficiencies.  These should not be the primary focus in MCM design.  With an MCM, a larger die may be needed for manufacturability, and hence larger/older wafer technology nodes may be more appropriate.  The floorplan may also need to be completed in such a way that the on-chip timing may be difficult to close, such as having the memory address lines on the opposite side of the die from the data bits.  These counterintuitive practices are part of the tradeoffs needed when an ASIC will be integrated into an MCM.</p>
<p><a href="http://javier.esilicon.com/wp-content/uploads/2010/03/pip.png" rel="lightbox[14]"><img class="alignleft size-medium wp-image-128" src="http://javier.esilicon.com/wp-content/uploads/2010/03/pip-300x148.png" alt="" width="194" height="109" /></a>If there is an interest in using <a href="http://www.esilicon.com/offerings/services.php">an ASIC in an MCM</a>, then designs need to start from the integration of the chip then work backwards to the die floorplan.  This is a reversal of the standard flow and hence may be difficult to drive into the design team mentality.  Many design teams have fallen victim to working on the stand-alone version of a chip without the later MCM integration in mind, which ends up costing much more.  There is a package technology that exists just to fix this oversight seen to the left.  PiP (Package-in-Package) technology integrates an interior package just to reposition the die interfaces to a location what works well with an another die.  Had these ASICs been planned with the MCM in mind, PiP technology would likely not exist.</p>
<p>Tool vendors have proposed integration tools that would help with this system level integration, but tools alone are not the answer.  The <a href="http://www.esilicon.com/offerings/design.php ">ASIC design</a> mindset and culture need to be addressed before any tools are introduced to remedy the issue. </p>
<p>Another gotcha lurking in the shadows is heat dissipation.  Some of the techniques that allow for better integration lead to thermal barriers.  For example, with stacked die in a package, the maximum specified junction temperature on one die will impose the same restriction on the other die.  Furthermore stacking one wirebond die above a flipchip die eliminates the primary thermal dissipation paths on the package.  In this case, things like thermal vias for the wirebond die or backside expose for the flipchip cannot be used.</p>
<p>A little handholding with an experienced consultant or value chain producer (VCP) with knowledge of MCM and SiP planning may prevent some headaches and schedule slips from occurring.  The design team education and guidance must be introduced early in any MCM program.  Once a design has a solid floorplan, valuable guidance becomes difficult and expensive to implement.</p>
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		<title>Flipchip – heatspreader or go naked?</title>
		<link>http://feedproxy.google.com/~r/PackageMatters/~3/xMIGD4Qtbuc/</link>
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		<pubDate>Mon, 22 Mar 2010 14:02:05 +0000</pubDate>
		<dc:creator>javier</dc:creator>
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<p>Questions and debate are common with the use of heatspreaders on flipchip BGA (FCBGA) packages.   This is one of those topics where “it depends” is said far too often.  From a cost standpoint, it is clear that the use of a heatspreader should be avoided.  On the other hand, there are many valid reasons why they [...]]]></description>
			<content:encoded><![CDATA[<p><a href="http://javier.esilicon.com/wp-content/uploads/2010/02/HFCBGA.jpg" rel="lightbox[102]"><img class="alignleft size-medium wp-image-116" src="http://javier.esilicon.com/wp-content/uploads/2010/02/HFCBGA-300x157.jpg" alt="" width="300" height="157" /></a><a href="http://javier.esilicon.com/wp-content/uploads/2010/02/DSC_9811.jpg" rel="lightbox[102]"><img class="alignright size-medium wp-image-106" src="http://javier.esilicon.com/wp-content/uploads/2010/02/DSC_9811-300x199.jpg" alt="" width="240" height="159" /></a></p>
<p>Questions and debate are common with the use of heatspreaders on <a href="http://www.esilicon.com/offerings/packaging.php">flipchip BGA (FCBGA) packages</a>.   This is one of those topics where “it depends” is said far too often.  From a cost standpoint, it is clear that the use of a heatspreader should be avoided.  On the other hand, there are many valid reasons why they should be used.<br />
One good reason to use a heatspreader is that the tips of the solderballs on FCBGAs or any other BGA have to be in the same plane within a certain tolerance.  This standard tolerance is dictated by JEDEC and  depending upon the package size, materials used, die size, etc. may not be achieved without a heatspreader.  A  larger package with a large die would have a hard time falling within the JEDEC coplanarity tolerance without the stiffness provided by the heatspreader.  Depending upon where the packages are assembled, the heatspreader may actually be used to correct warpage after the flipchip die attach processes.  The warped package may be clamped to the flat heatspreader during heatspreader attach process cure to re-flatten it.  <br />
Another common reason to use a heatspreader is in its name.  A heatspreader can more efficiently exchange heat with the air than an exposed die can, by spreading it to a larger surface.  This is only valid when a subsequent heatsink is not present.  The heatspreader actually impedes heat transfer to the heatsink when it is present.  Thermally, you really can’t beat having a heatsink (or cold-plate, etc.) attached to the backside of the die directly.  The main reason for this is that with only very few exceptions, there is a gap-filler material between the die and heatspreader.  This gap-filler is often refered to as TIM (thermal interface material) or thermal compound.  This TIM material is not a good thermal conductor, but it would be better than air which is what would be present between two nearly flat solid surfaces without the TIM.   To put this in perspective, the gap filler, though thin, is about 100X worse than copper with regard to thermal conductivity.  By keeping this TIM thin, the thermal resistance contributed by the TIM is less than one degree Celsius per watt.  If a heatspreader and a heatsink are used, then there are two TIM interfaces each contributing to the thermal resistance.  That second TIM interface is attributed to the adhesive or grease material between the heatsink and heatspreader.<br />
<a href="http://javier.esilicon.com/wp-content/uploads/2010/03/FCBGA-xsect.gif" rel="lightbox[102]"><img class="alignleft size-medium wp-image-136" src="http://javier.esilicon.com/wp-content/uploads/2010/03/FCBGA-xsect-300x177.gif" alt="" width="300" height="177" /></a>Other reasons exist for using heatspreaders such as providing a larger area for the vacuum pick-and-place tools used in PCB-level assembly.  There is also a much larger area for device marking and tracking information on a heatspreader.  Without a heatspreader, the marking (logo, part numbers, country of origin, lot numbers, etc.) are all restricted to the area on the backside of the die which can be rather small and difficult to read.<br />
With all of the valid reasons to have a heatspreader, the 800-pound gorilla in the room is cost.  Those heatspreaders are not cheap!  Therefore, trade-off  analysis to determine if a given application really needs a heatspreader should be considered very early in a program to work on eliminating later consequences on manufacturability and cost. <br />
Package substrate manufacturers are working diligently to release materials that are more closely matched to the die (regarding the coefficient of thermal expansion) so that there is less stress and hence less warpage of substrates.  Expect to see more <a href="http://www.esilicon.com/offerings/productization.php">flipchip packages</a> to go naked in the near future.</p>
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