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		<title>Test &amp; Measurement World - Design, Production Test, and Yield News</title>
		<link>http://www.tmworld.com</link>
		<pubDate>Sat, 26 May 2012 23:02:20 MDT</pubDate>
		<description>News and articles covering the development and test of integrated circuits, printed-circuit boards, and electronic systems. Topics include semiconductor test, wafer test and yield, automated test equipment, EDA (electronic design automation), boundary scan, BIST (built-in self-test), test-pattern compression, and defect analysis.</description>
		<language>eng</language>
		<copyright>Copyright 2012 UBM Canon. Subject to its Terms of Use (http://www.tmworld.com/info/terms-and-conditions.php)</copyright>
		


									
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			<title>PCIe JTAG controllers test up to four boards</title>
			<link>http://www.tmworld.com/article/521838-PCIe_JTAG_controllers_test_up_to_four_boards.php?rssid=20422</link>
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			<pubDate>Fri, 25 May 2012 11:00:00 GMT</pubDate>
										<description>Two JTAG controller kits for ASSET InterTech's ScanWorks platform for embedded instruments...</description>
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			<title>R&amp;S interlock unit ensures safe operation of ATE</title>
			<link>http://www.tmworld.com/article/521837-R_S_interlock_unit_ensures_safe_operation_of_ATE.php?rssid=20422</link>
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			<pubDate>Thu, 24 May 2012 11:00:00 GMT</pubDate>
										<description>The PFSC4 interlock unit from Rohde &amp; Schwarz enhances the safety of automatic test equipment...</description>
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			<title>Active probes: why they are worth buying</title>
			<link>http://www.tmworld.com/article/521865-Active_probes_why_they_are_worth_buying.php?rssid=20422</link>
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			<pubDate>Tue, 22 May 2012 21:53:11 GMT</pubDate>
										<description>Although active probes are more expensive than passive ones, they offer a superior level of...</description>
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			<title>Resistivity is the key to measuring electrical resistance</title>
			<link>http://www.tmworld.com/article/521847-Resistivity_is_the_key_to_measuring_electrical_resistance.php?rssid=20422</link>
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			<pubDate>Mon, 21 May 2012 19:28:15 GMT</pubDate>
										<description>Understanding the difference between resistance and resistivity can help you when characterizing...</description>
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			<title>Multitest offers feeder option for gravity test handler</title>
			<link>http://www.tmworld.com/article/521833-Multitest_offers_feeder_option_for_gravity_test_handler.php?rssid=20422</link>
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			<pubDate>Mon, 21 May 2012 11:00:00 GMT</pubDate>
										<description>Supporting one to four tracks and up to eight contact sites, an optional bowl feeder for...</description>
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			<title>Finding your best testcompression</title>
			<link>http://www.tmworld.com/article/521825-Finding_your_best_test_compression.php?rssid=20422</link>
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			<pubDate>Fri, 18 May 2012 15:04:36 GMT</pubDate>
										<description>When inserting embedded scan compression, you can adjust the amount of compression per...</description>
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			<title>On-chip frequency measurements reduce test time</title>
			<link>http://www.tmworld.com/article/521750-On_chip_frequency_measurements_reduce_test_time.php?rssid=20422</link>
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			<pubDate>Wed, 09 May 2012 16:48:00 GMT</pubDate>
										<description>By performing on-chip frequency measurements, device manufacturers can reduce their dependency...</description>
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			<title>Multitest Kelvin contactor suits high-power test</title>
			<link>http://www.tmworld.com/article/521706-Multitest_Kelvin_contactor_suits_high_power_test.php?rssid=20422</link>
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			<pubDate>Wed, 09 May 2012 11:00:00 GMT</pubDate>
										<description>Aimed at high-power IC test applications up to 500 A, the ecoAmp Kelvin contactor provides...</description>
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			<title>Distributors hone 'traffic' control skills</title>
			<link>http://www.tmworld.com/article/521716-Distributors_hone_traffic_control_skills.php?rssid=20422</link>
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			<pubDate>Mon, 07 May 2012 16:32:19 GMT</pubDate>
										<description>Component distributors occupy a central position in the electronics supply chain, acting like...</description>
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			<title>Goepel debuts ChipVORX JTAG I/O module</title>
			<link>http://www.tmworld.com/article/521701-Goepel_debuts_ChipVORX_JTAG_I_O_module.php?rssid=20422</link>
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			<pubDate>Mon, 07 May 2012 11:00:00 GMT</pubDate>
										<description>Offering 90 I/O channels, the FXT-X90 FPGA-based I/O module is controlled via a standard TAP to...</description>
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			<title>KLA-Tencor adds intelligence to wafer inspection</title>
			<link>http://www.tmworld.com/article/521679-KLA_Tencor_adds_intelligence_to_wafer_inspection.php?rssid=20422</link>
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			<pubDate>Wed, 02 May 2012 21:50:44 GMT</pubDate>
										<description>By adding intelligent parallel processing, KLA-Tencor has increased the throughput of its...</description>
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			<title>Article series explains op-amp measurements</title>
			<link>http://www.tmworld.com/article/521599-Article_series_explains_op_amp_measurements.php?rssid=20422</link>
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			<pubDate>Tue, 01 May 2012 04:00:00 GMT</pubDate>
										<description>Operational amplifiers require numerous measurements, both by their manufacturers and by the...</description>
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			<title>Researchers find semiconductor derivative of graphene</title>
			<link>http://www.tmworld.com/article/521641-Researchers_find_semiconductor_derivative_of_graphene.php?rssid=20422</link>
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			<pubDate>Mon, 30 Apr 2012 18:51:23 GMT</pubDate>
										<description>Until now, graphene and its derivatives have only existed as conductors and...</description>
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			<title>Introduction to IEEE 802.11ac manufacturing test requirements</title>
			<link>http://www.tmworld.com/article/521575-Introduction_to_IEEE_802_11ac_manufacturing_test_requirements.php?rssid=20422</link>
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			<pubDate>Tue, 24 Apr 2012 15:19:00 GMT</pubDate>
										<description>To be prepared, manufacturing test engineers need to ensure that their test equipment is capable...</description>
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			<title>QualiSystems' TestShell 4.7 streamlines lab testing</title>
			<link>http://www.tmworld.com/article/521566-QualiSystems_TestShell_4_7_streamlines_lab_testing.php?rssid=20422</link>
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			<pubDate>Tue, 24 Apr 2012 11:00:00 GMT</pubDate>
										<description>With TestShell 4.7 software for lab management, device provisioning, and test automation, manual...</description>
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			<title>Improve production test of high-speed RF components</title>
			<link>http://www.tmworld.com/article/521467-Improve_production_test_of_high_speed_RF_components.php?rssid=20422</link>
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			<pubDate>Wed, 11 Apr 2012 15:30:32 GMT</pubDate>
										<description>Moving component testing for any device from the bench to production ATE (automatic test...</description>
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			<title>Multi-TAP JTAG controller fits Teradyne ICTs</title>
			<link>http://www.tmworld.com/article/521435-Multi_TAP_JTAG_controller_fits_Teradyne_ICTs.php?rssid=20422</link>
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			<pubDate>Wed, 11 Apr 2012 11:00:00 GMT</pubDate>
										<description>Following the introduction of a single-channel JTAG controller, Corelis has launched the...</description>
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			<title>Fluke 62 Max+ IR thermometer uses dual lasers</title>
			<link>http://www.tmworld.com/article/521447-Fluke_62_Max_IR_thermometer_uses_dual_lasers.php?rssid=20422</link>
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			<pubDate>Mon, 09 Apr 2012 19:51:27 GMT</pubDate>
										<description>Fluke's 62 Max+ ($129.95) uses two rotating laser pointers that show you thesize of the...</description>
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			<title>E-handbook covers nano electrical measurements</title>
			<link>http://www.tmworld.com/article/521424-E_handbook_covers_nano_electrical_measurements.php?rssid=20422</link>
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			<pubDate>Mon, 09 Apr 2012 11:00:00 GMT</pubDate>
										<description>Keithley Instruments announced its latest e-handbook, Advances in Electrical Measurements for...</description>
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			<title>Tips for testing processor cores</title>
			<link>http://www.tmworld.com/article/521422-Tips_for_testing_processor_cores.php?rssid=20422</link>
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			<pubDate>Fri, 06 Apr 2012 16:41:52 GMT</pubDate>
										<description>You can structure the test aspects of the processor core in a manner that makes them effective...</description>
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			<title>Real-time control platform teams with LabView</title>
			<link>http://www.tmworld.com/article/521361-Real_time_control_platform_teams_with_LabView.php?rssid=20422</link>
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			<pubDate>Fri, 06 Apr 2012 11:00:00 GMT</pubDate>
										<description>National Instruments' Alliance Partner S.E.A. Datentechnik has launched BMX, a real-time...</description>
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			<title>Compliance and conformance: testing to new IEEE standards</title>
			<link>http://www.tmworld.com/article/521394-Compliance_and_conformance_testing_to_new_IEEE_standards.php?rssid=20422</link>
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			<pubDate>Thu, 05 Apr 2012 14:41:37 GMT</pubDate>
										<description>The IEEE Conformity Assessment Program (ICAP) bridges the gap between standards and conforming...</description>
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			<title>Boundary-scan package integrates digital oscilloscope</title>
			<link>http://www.tmworld.com/article/521358-Boundary_scan_package_integrates_digital_oscilloscope.php?rssid=20422</link>
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			<pubDate>Wed, 04 Apr 2012 11:00:00 GMT</pubDate>
										<description>XJTAG and Pico Technology have joined forces to produce XJTAG Expert, an integrated JTAG...</description>
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			<title>Multitest publishes tutorial on Kelvin contactors</title>
			<link>http://www.tmworld.com/article/521357-Multitest_publishes_tutorial_on_Kelvin_contactors.php?rssid=20422</link>
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			<pubDate>Tue, 03 Apr 2012 11:00:00 GMT</pubDate>
										<description>Free for downloading, Multitest's 26-page illustrated tutorial not only explains how Kelvin...</description>
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			<title>Cadence webinars address functional verification</title>
			<link>http://www.tmworld.com/article/521354-Cadence_webinars_address_functional_verification.php?rssid=20422</link>
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			<pubDate>Mon, 02 Apr 2012 11:00:00 GMT</pubDate>
										<description>Now through June, Cadence will be offering a series of webinars to present the latest...</description>
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			<title>Testing opportunities</title>
			<link>http://www.tmworld.com/article/521269-Testing_opportunities.php?rssid=20422</link>
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			<pubDate>Sun, 01 Apr 2012 04:00:00 GMT</pubDate>
										<description>About 17 years ago, I joined the high-tech world of electrical engineering. Since then, I have...</description>
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			<title>iNEMI planning MEMS test initiatives</title>
			<link>http://www.tmworld.com/article/521271-iNEMI_planning_MEMS_test_initiatives.php?rssid=20422</link>
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			<pubDate>Sun, 01 Apr 2012 04:00:00 GMT</pubDate>
										<description>iNEMI (International Electronics Manufacturing Initiative) has begun driving two collaborative...</description>
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			<title>Multitest outfits pick-and-place handler for MEMS test</title>
			<link>http://www.tmworld.com/article/521297-Multitest_outfits_pick_and_place_handler_for_MEMS_test.php?rssid=20422</link>
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			<pubDate>Thu, 29 Mar 2012 11:00:00 GMT</pubDate>
										<description>Multitest has expanded its MEMS portfolio to pick-and-place applications with the introduction...</description>
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			<title>Cell-aware ATPG test methods improve test quality</title>
			<link>http://www.tmworld.com/article/521338-Cell_aware_ATPG_test_methods_improve_test_quality.php?rssid=20422</link>
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			<pubDate>Wed, 28 Mar 2012 19:17:44 GMT</pubDate>
										<description>Cell-aware testing is a new approach for production IC test. Instead of using a fault model...</description>
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			<title>Modus Test to support Wells-CTI socket tester</title>
			<link>http://www.tmworld.com/article/521291-Modus_Test_to_support_Wells_CTI_socket_tester.php?rssid=20422</link>
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			<pubDate>Tue, 27 Mar 2012 11:00:00 GMT</pubDate>
										<description>Modus Test has signed an agreement with Wells-CTI to become the exclusive supplier of interface...</description>
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			<title>Keithley 2657A tests devices at 3 kV</title>
			<link>http://www.tmworld.com/article/521281-Keithley_2657A_tests_devices_at_3_kV.php?rssid=20422</link>
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			<pubDate>Fri, 23 Mar 2012 02:25:42 GMT</pubDate>
										<description>Keithley's 2657A high-voltage-high-power source-measure unit can source or sink up to 180 W of...</description>
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			<title>The basics of testing op amps, part 3: Configurable circuit tests op amps</title>
			<link>http://www.tmworld.com/article/521255-The_basics_of_testing_op_amps_part_3_Configurable_circuit_tests_op_amps.php?rssid=20422</link>
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			<pubDate>Tue, 20 Mar 2012 20:45:01 GMT</pubDate>
										<description>Using relays, you can configure a single circuitto measure important op-amp parameters such as...</description>
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			<title>Agilent updates IC-CAP device-modeling program</title>
			<link>http://www.tmworld.com/article/521227-Agilent_updates_IC_CAP_device_modeling_program.php?rssid=20422</link>
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			<pubDate>Tue, 20 Mar 2012 11:00:00 GMT</pubDate>
										<description>IC-CAP 2012.01, the latest version of Agilent's device-modeling platform, changes the way data...</description>
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			<title>Rule out thermal issues during development</title>
			<link>http://www.tmworld.com/article/521191-Rule_out_thermal_issues_during_development.php?rssid=20422</link>
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			<pubDate>Wed, 14 Mar 2012 14:11:41 GMT</pubDate>
										<description>A real-time thermal-cycle reliability test provides immediate real-time failure feedback and...</description>
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			<title>Multitest contactor handles large digital arrays</title>
			<link>http://www.tmworld.com/article/521158-Multitest_contactor_handles_large_digital_arrays.php?rssid=20422</link>
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			<pubDate>Mon, 12 Mar 2012 11:00:00 GMT</pubDate>
										<description>Based on Multitest's Quad Tech vertical-contact probe technology, the Triton contactor tests...</description>
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			<title>Determining the best test patternsfor production test</title>
			<link>http://www.tmworld.com/article/521120-Determining_the_best_test_patterns_for_production_test.php?rssid=20422</link>
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			<pubDate>Tue, 06 Mar 2012 17:03:25 GMT</pubDate>
										<description>One way to get enoughdata to decide on your best test strategy is to apply supplemental test...</description>
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			<title>Agilent releases test tool for Altair LTE chipset</title>
			<link>http://www.tmworld.com/article/521099-Agilent_releases_test_tool_for_Altair_LTE_chipset.php?rssid=20422</link>
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			<pubDate>Tue, 06 Mar 2012 12:00:00 GMT</pubDate>
										<description>Fully integrated and automated, Agilent's N7304A-2 application software and EXT communications...</description>
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			<title>ADLink expands PXI/PXIe instrument family</title>
			<link>http://www.tmworld.com/article/521082-ADLink_expands_PXI_PXIe_instrument_family.php?rssid=20422</link>
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			<pubDate>Fri, 02 Mar 2012 15:51:22 GMT</pubDate>
										<description>Company adds a 9-slot chassis, a system controller, and two digitizer...</description>
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			<title>High-temperature effects on wafer probing</title>
			<link>http://www.tmworld.com/article/521078-High_temperature_effects_on_wafer_probing.php?rssid=20422</link>
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			<pubDate>Fri, 02 Mar 2012 14:21:00 GMT</pubDate>
										<description>Automated probe mark analysis replaces time-consuming manual analysis, delivering statistically...</description>
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			<title>Find out why LCDs fail</title>
			<link>http://www.tmworld.com/article/521050-Find_out_why_LCDs_fail.php?rssid=20422</link>
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			<pubDate>Wed, 29 Feb 2012 19:17:45 GMT</pubDate>
										<description>The simultaneous use of SEM (Scanning Electron Microscope) and EDX (Energy Dispersive X-ray...</description>
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			<title>Lake Shore expands line of cryogen-free probe stations</title>
			<link>http://www.tmworld.com/article/521001-Lake_Shore_expands_line_of_cryogen_free_probe_stations.php?rssid=20422</link>
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			<pubDate>Tue, 28 Feb 2012 12:00:00 GMT</pubDate>
										<description>Two cryogen-free probe stations from Lake Shore Cryotronics, the CRX-VF and  CRX-EM-HF, add...</description>
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			<title>Test socket accommodates 0.4-mm-pitch QFNs</title>
			<link>http://www.tmworld.com/article/521003-Test_socket_accommodates_0_4_mm_pitch_QFNs.php?rssid=20422</link>
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			<pubDate>Tue, 28 Feb 2012 12:00:00 GMT</pubDate>
										<description>Operating at bandwidths of up to 40 GHz with less than 1 dB of insertion loss, Ironwood...</description>
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			<title>Genesys software enables error-free RF system design</title>
			<link>http://www.tmworld.com/article/520999-Genesys_software_enables_error_free_RF_system_design.php?rssid=20422</link>
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			<pubDate>Mon, 27 Feb 2012 12:00:00 GMT</pubDate>
										<description>Agilent's Genesys 2012 software provides enhancements in electromagnetic, circuit, and...</description>
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			<title>Weighing-scale design: Measure signals accurately</title>
			<link>http://www.tmworld.com/article/520991-Weighing_scale_design_Measure_signals_accurately.php?rssid=20422</link>
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			<pubDate>Thu, 01 Mar 2012 05:02:00 GMT</pubDate>
										<description>The most common method for implementing weigh-scale designs uses a resistive load cell...</description>
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			<title>SIA releases roadmap</title>
			<link>http://www.tmworld.com/article/520963-SIA_releases_roadmap.php?rssid=20422</link>
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			<pubDate>Tue, 21 Feb 2012 19:50:00 GMT</pubDate>
										<description>The SIA (Semiconductor Industry Association) has publicly released its 2011 ITRS...</description>
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			<title>Texmac touts convertible single/dual-sided flying prober</title>
			<link>http://www.tmworld.com/article/520947-Texmac_touts_convertible_single_dual_sided_flying_prober.php?rssid=20422</link>
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			<pubDate>Tue, 21 Feb 2012 12:00:00 GMT</pubDate>
										<description>Setting the Takaya APT-9611CER apart from other dual-sided flying-probe systems on the market is...</description>
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			<title>CSZ test chambers employ touch-screen controller</title>
			<link>http://www.tmworld.com/article/520944-CSZ_test_chambers_employ_touch_screen_controller.php?rssid=20422</link>
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			<pubDate>Mon, 20 Feb 2012 12:00:00 GMT</pubDate>
										<description>HALT and HASS test chambers from Cincinnati Sub-Zero (CSZ) now feature the EZT-570i touch-screen...</description>
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			<title>Optimize digital patterns for worst-case testing</title>
			<link>http://www.tmworld.com/article/520941-Optimize_digital_patterns_for_worst_case_testing.php?rssid=20422</link>
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			<pubDate>Fri, 17 Feb 2012 20:46:41 GMT</pubDate>
										<description>Intersymbol interference depends on bit patterns, so finding a worst-case pattern improves...</description>
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			<title>Viewpoint: Memory BIST for shared-bus applications</title>
			<link>http://www.tmworld.com/article/520934-Viewpoint_Memory_BIST_for_shared_bus_applications.php?rssid=20422</link>
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			<pubDate>Thu, 16 Feb 2012 20:58:34 GMT</pubDate>
										<description>Shared-bus memory BIST has a special structure because it doesn’t interface directly to the...</description>
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			<title>Bridge software and hardware to accelerate SoC validation</title>
			<link>http://www.tmworld.com/article/520925-Bridge_software_and_hardware_to_accelerate_SoC_validation.php?rssid=20422</link>
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			<pubDate>Thu, 16 Feb 2012 15:32:28 GMT</pubDate>
										<description>Reconfigurable embedded instruments in SoCs let engineers create a debug infrastructure for...</description>
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			<title>Test board accommodates 0.3-mm dummy CVBGA</title>
			<link>http://www.tmworld.com/article/520912-Test_board_accommodates_0_3_mm_dummy_CVBGA.php?rssid=20422</link>
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			<pubDate>Wed, 15 Feb 2012 11:00:00 GMT</pubDate>
										<description>Practical Components will debut a test board for its dummyversion of Amkor Technology's...</description>
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			<title>Audio Precision offers audio seminar in Boston</title>
			<link>http://www.tmworld.com/article/520906-Audio_Precision_offers_audio_seminar_in_Boston.php?rssid=20422</link>
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			<pubDate>Tue, 14 Feb 2012 21:24:52 GMT</pubDate>
										<description>A one-day master class on advanced audio test techniques at Boston College on Thursday, March...</description>
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			<title>ACE fortifies compiler test and validation suite</title>
			<link>http://www.tmworld.com/article/520850-ACE_fortifies_compiler_test_and_validation_suite.php?rssid=20422</link>
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			<pubDate>Mon, 13 Feb 2012 12:00:00 GMT</pubDate>
										<description>SuperTest Rembrandt, a software suite for testing C, C++, Embedded C, and DSP-C compilers,...</description>
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			<title>Add-ins customize Agilent compliance software</title>
			<link>http://www.tmworld.com/article/520811-Add_ins_customize_Agilent_compliance_software.php?rssid=20422</link>
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			<pubDate>Fri, 10 Feb 2012 12:00:00 GMT</pubDate>
										<description>An enhancement to Agilent's N5467A user-defined application software gives engineers the ability...</description>
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			<title>Ironwood's 40-GHz device sockets 16×16-mm BGAs</title>
			<link>http://www.tmworld.com/article/520810-Ironwood_s_40_GHz_device_sockets_16_16_mm_BGAs.php?rssid=20422</link>
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			<pubDate>Thu, 09 Feb 2012 12:00:00 GMT</pubDate>
										<description>The SM-BGA-9006 socket is constructed with an elastomer contactor that not only offers high...</description>
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			<title>Digitizer runs 16 bits at high speed</title>
			<link>http://www.tmworld.com/article/520847-Digitizer_runs_16_bits_at_high_speed.php?rssid=20422</link>
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			<pubDate>Wed, 08 Feb 2012 20:41:00 GMT</pubDate>
										<description>The ATS 9625 digitizer card from Alazar Tech contains two analog-input channels that...</description>
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			<title>Everett Charles group offers custom connectors</title>
			<link>http://www.tmworld.com/article/520805-Everett_Charles_group_offers_custom_connectors.php?rssid=20422</link>
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			<pubDate>Tue, 07 Feb 2012 12:00:00 GMT</pubDate>
										<description>Everett Charles Technologies uses a wide range of compliant technologies to deliver custom...</description>
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			<title>Goepel adds PXI unit to LIN interface module line-up</title>
			<link>http://www.tmworld.com/article/520820-Goepel_adds_PXI_unit_to_LIN_interface_module_line_up.php?rssid=20422</link>
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			<pubDate>Mon, 06 Feb 2012 17:06:54 GMT</pubDate>
										<description>Goepel Electronic has expanded its range of LIN communication controllers for testing...</description>
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			<title>KLA-Tencor rolls out trio of wafer inspection systems</title>
			<link>http://www.tmworld.com/article/520802-KLA_Tencor_rolls_out_trio_of_wafer_inspection_systems.php?rssid=20422</link>
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			<pubDate>Mon, 06 Feb 2012 12:00:00 GMT</pubDate>
										<description>The 2900, Puma 9650, and eS800 series of inspection systems address the wide range of defect...</description>
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			<title>Waveform analyzer plug-in smokes at 50 GHz/32 Gbps so engineers can stay cool</title>
			<link>http://www.tmworld.com/article/520777-Waveform_analyzer_plug_in_smokes_at_50_GHz_32_Gbps_so_engineers_can_stay_cool.php?rssid=20422</link>
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			<pubDate>Thu, 02 Feb 2012 22:40:00 GMT</pubDate>
										<description>The 86108B precision waveform analyzer module for the Agilent Technologies 86100C/D DCA...</description>
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			<title>Panel probes T&amp;M’s tech chiefs</title>
			<link>http://www.tmworld.com/article/520776-Panel_probes_T_M_s_tech_chiefs.php?rssid=20422</link>
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			<pubDate>Thu, 02 Feb 2012 19:59:29 GMT</pubDate>
										<description>A DesignCon panel probed the leaders of the major test and measurement companies on a broad...</description>
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			<title>Multitest teams MEMS modules with test handler</title>
			<link>http://www.tmworld.com/article/520707-Multitest_teams_MEMS_modules_with_test_handler.php?rssid=20422</link>
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			<pubDate>Thu, 02 Feb 2012 12:00:00 GMT</pubDate>
										<description>Semiconductor test-equipment manufacturer Multitest announced that it has shipped the first MEMS...</description>
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			<title>T&amp;MW announceswinners of 2012 Best in Test awards</title>
			<link>http://www.tmworld.com/article/520751-T_MW_announces_winners_of_2012_Best_in_Test_awards.php?rssid=20422</link>
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			<pubDate>Wed, 01 Feb 2012 16:41:51 GMT</pubDate>
										<description>At a ceremony held January 31 in Santa Clara, CA, the editors of Test &amp; Measurement World...</description>
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			<title>Product Round-Up: Software for test and measurement applications</title>
			<link>http://www.tmworld.com/article/520694-Product_Round_Up_Software_for_test_and_measurement_applications.php?rssid=20422</link>
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			<pubDate>Thu, 26 Jan 2012 19:25:15 GMT</pubDate>
										<description>Looking for test software? Check out these recently released or updated software products that...</description>
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			<title>Microcontroller circuit calibrates current loops</title>
			<link>http://www.tmworld.com/article/520681-Microcontroller_circuit_calibrates_current_loops.php?rssid=20422</link>
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			<pubDate>Wed, 25 Jan 2012 19:33:53 GMT</pubDate>
										<description>A team of engineers designed a 4–20-mA loop calibrator that costs less than...</description>
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			<title>Circuit measures optocoupler’s response time</title>
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			<pubDate>Fri, 20 Jan 2012 19:19:53 GMT</pubDate>
										<description>Here is a simple circuit you can use to measure the attack and release times of...</description>
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			<title>Managing test code provides flexibility</title>
			<link>http://www.tmworld.com/article/520587-Managing_test_code_provides_flexibility.php?rssid=20422</link>
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			<pubDate>Tue, 17 Jan 2012 20:38:23 GMT</pubDate>
										<description>Test systems that must constantly change and adapt to different analog ICs must be flexible. A...</description>
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			<title>Build a microcontroller-based functional tester</title>
			<link>http://www.tmworld.com/article/520575-Build_a_microcontroller_based_functional_tester.php?rssid=20422</link>
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			<pubDate>Tue, 17 Jan 2012 15:51:49 GMT</pubDate>
										<description>A microcontroller-based functional tester lets you create and measure analog and digital...</description>
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			<title>MegaPhase offers private labeling for test cables</title>
			<link>http://www.tmworld.com/article/520511-MegaPhase_offers_private_labeling_for_test_cables.php?rssid=20422</link>
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			<pubDate>Thu, 12 Jan 2012 12:00:00 GMT</pubDate>
										<description>Private-labeled test and measurement cables from MegaPhase cover a frequency range of 10 MHz to...</description>
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			<title>Multitest UltraFlat process targets vertical probe cards</title>
			<link>http://www.tmworld.com/article/520522-Multitest_UltraFlat_process_targets_vertical_probe_cards.php?rssid=20422</link>
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			<pubDate>Thu, 12 Jan 2012 12:00:00 GMT</pubDate>
										<description>The UltraFlat process for vertical probe cards used in high-parallel device testing maintains...</description>
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			<title>DesignCon 2012: How can T&amp;M meet designers' needs?</title>
			<link>http://www.tmworld.com/article/520540-DesignCon_2012_How_can_T_M_meet_designers_needs_.php?rssid=20422</link>
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			<pubDate>Wed, 11 Jan 2012 15:37:55 GMT</pubDate>
										<description>A panel discussion scheduled for DesignCon 2012 will look at the nature of test and how test...</description>
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			<title>Mentor enables component-to-system thermal characterization</title>
			<link>http://www.tmworld.com/article/520407-Mentor_enables_component_to_system_thermal_characterization.php?rssid=20422</link>
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			<pubDate>Wed, 28 Dec 2011 12:00:00 GMT</pubDate>
										<description>Mentor Graphics has combined its T3Ster thermal transient tester with its FloTherm thermal...</description>
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			<title>Multitest launches trio of support services</title>
			<link>http://www.tmworld.com/article/520409-Multitest_launches_trio_of_support_services.php?rssid=20422</link>
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			<pubDate>Wed, 28 Dec 2011 12:00:00 GMT</pubDate>
										<description>The Pro support program from Multitest comprises three after-sales support services to increase...</description>
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			<title>Corelis adds JET support for TI Sitara processors</title>
			<link>http://www.tmworld.com/article/520366-Corelis_adds_JET_support_for_TI_Sitara_processors.php?rssid=20422</link>
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			<pubDate>Thu, 22 Dec 2011 12:00:00 GMT</pubDate>
										<description>ScanExpress JET software from Corelis enables JTAG embedded testing of Texas Instruments' Sitara...</description>
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			<title>Design test software for platform independence</title>
			<link>http://www.tmworld.com/article/520374-Design_test_software_for_platform_independence.php?rssid=20422</link>
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			<pubDate>Mon, 19 Dec 2011 20:19:55 GMT</pubDate>
										<description>Legacy software can often hinder development of new and better test systems. Using a layered...</description>
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			<title>Emerging technologies drive test advances</title>
			<link>http://www.tmworld.com/article/520357-Emerging_technologies_drive_test_advances.php?rssid=20422</link>
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			<pubDate>Fri, 16 Dec 2011 17:29:49 GMT</pubDate>
										<description>Linda Rae of Keithley Instruments explains that new power requirements present challenges for...</description>
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			<title>The quest for ever-better primary standards is a fascinating story</title>
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			<pubDate>Thu, 15 Dec 2011 19:48:41 GMT</pubDate>
										<description>I just finished reading World in the Balance: The Historic Quest for an Absolute System of...</description>
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			<title>NIST tool aids “circuit-aware” reliability testing</title>
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			<pubDate>Wed, 14 Dec 2011 20:45:39 GMT</pubDate>
										<description>Researchers in the Physical Measurement Laboratory at the National Institute of Standards and...</description>
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			<title>Agilent inks acquisition agreement with Accelicon</title>
			<link>http://www.tmworld.com/article/520278-Agilent_inks_acquisition_agreement_with_Accelicon.php?rssid=20422</link>
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			<pubDate>Wed, 14 Dec 2011 12:00:00 GMT</pubDate>
										<description>Agilent announced that is has signed a definitive agreement to acquire Accelicon Technologies, a...</description>
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			<title>Altatech Semiconductor enters LED inspection market</title>
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			<pubDate>Thu, 08 Dec 2011 14:48:21 GMT</pubDate>
										<description>The AltaSight LEDMax system detects, classifies, and characterizes defects on wafers used in...</description>
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			<title>Acromag's AXM-A75 I/O module plugs into FPGA card</title>
			<link>http://www.tmworld.com/article/520217-Acromag_s_AXM_A75_I_O_module_plugs_into_FPGA_card.php?rssid=20422</link>
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			<pubDate>Mon, 05 Dec 2011 12:00:00 GMT</pubDate>
										<description>The AXM-A75 extension module interfaces a number of analog voltage signals to and from the FPGA,...</description>
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			<title>Cascade's InfinityQuad multicontact probe addresses small pads</title>
			<link>http://www.tmworld.com/article/520212-Cascade_s_InfinityQuad_multicontact_probe_addresses_small_pads.php?rssid=20422</link>
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			<pubDate>Fri, 02 Dec 2011 19:06:20 GMT</pubDate>
										<description>The new InfinityQuad probe from Cascade Microtech ensures reliable measurement results up to...</description>
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			<title>Kontron fanless PC operates 24/7 for 10 years</title>
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			<pubDate>Thu, 01 Dec 2011 12:00:00 GMT</pubDate>
										<description>The Microspace MPC-pONE embedded PC from Kontron occupies a footprint that is smaller than a CD...</description>
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			<title>m+p's VibRunner acquires noise and vibration data</title>
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			<pubDate>Thu, 01 Dec 2011 12:00:00 GMT</pubDate>
										<description>Housed in a 1U desktop or rack-mount enclosure, the VibRunner from m+p international furnishes...</description>
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			<title>Corelis ScanExpress JET supports Freescale processors</title>
			<link>http://www.tmworld.com/article/520127-Corelis_ScanExpress_JET_supports_Freescale_processors.php?rssid=20422</link>
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			<pubDate>Tue, 29 Nov 2011 12:00:00 GMT</pubDate>
										<description>ScanExpress JET software from Corelis enables at-speed JTAG embedded testing of all members of...</description>
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			<title>Teseda software tools aid silicon failure analysis</title>
			<link>http://www.tmworld.com/article/520126-Teseda_software_tools_aid_silicon_failure_analysis.php?rssid=20422</link>
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			<pubDate>Mon, 28 Nov 2011 12:00:00 GMT</pubDate>
										<description>The Broken Chain Analyzer, Diagnostic Manager NetXY, and DC Field Triage Package from Teseda aim...</description>
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			<title>Goepel and Rohde bring JTAG into TSVP platform</title>
			<link>http://www.tmworld.com/article/520036-Goepel_and_Rohde_bring_JTAG_into_TSVP_platform.php?rssid=20422</link>
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			<pubDate>Wed, 16 Nov 2011 16:41:20 GMT</pubDate>
										<description>Goepel Electronic and Rohde &amp; Schwarz have developed an extended boundary-scan option for the...</description>
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			<title>KEMA opens Smart Grid Interop Lab</title>
			<link>http://www.tmworld.com/article/519999-KEMA_opens_Smart_Grid_Interop_Lab.php?rssid=20422</link>
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			<pubDate>Tue, 15 Nov 2011 12:00:00 GMT</pubDate>
										<description>KEMA, an independent energy consulting, testing, and certification company with US headquarters...</description>
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			<title>NI SwitchBlock relays form custom PXI ATE systems</title>
			<link>http://www.tmworld.com/article/519973-NI_SwitchBlock_relays_form_custom_PXI_ATE_systems.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/519973-NI_SwitchBlock_relays_form_custom_PXI_ATE_systems.php?rssid=20422</guid>
			<pubDate>Wed, 09 Nov 2011 22:49:24 GMT</pubDate>
										<description>Eight new relay cards join National Instruments' SwitchBlock line of high-density switching...</description>
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			<title>Ironwood socket handles e-MMC BGA devices</title>
			<link>http://www.tmworld.com/article/519939-Ironwood_socket_handles_e_MMC_BGA_devices.php?rssid=20422</link>
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			<pubDate>Tue, 08 Nov 2011 12:00:00 GMT</pubDate>
										<description>With the SG-BGA-7219 elastomer socket from Ironwood Electronics, you can test Samsung e-MMC...</description>
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			<title>Goepel TAPChecker extends BSDL testbench generation</title>
			<link>http://www.tmworld.com/article/519936-Goepel_TAPChecker_extends_BSDL_testbench_generation.php?rssid=20422</link>
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			<pubDate>Mon, 07 Nov 2011 12:00:00 GMT</pubDate>
										<description>The new TAPChecker options extend the software's flexibility in terms of handling pin groups and...</description>
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			<title>Multitest hones contacting integrity with Quad Tech</title>
			<link>http://www.tmworld.com/article/519937-Multitest_hones_contacting_integrity_with_Quad_Tech.php?rssid=20422</link>
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			<pubDate>Mon, 07 Nov 2011 12:00:00 GMT</pubDate>
										<description>Multitest claims that its Quad Tech vertical-contact probe technology offers superior test yield...</description>
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			<title>QuadTech CaptivATE 3.6 automates safety testing</title>
			<link>http://www.tmworld.com/article/519810-QuadTech_CaptivATE_3_6_automates_safety_testing.php?rssid=20422</link>
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			<pubDate>Tue, 01 Nov 2011 15:37:28 GMT</pubDate>
										<description>Intended for manufacturers who do not have the time or resources to create and validate their...</description>
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			<title>Corelis ScanExpress JET supports AMD processors</title>
			<link>http://www.tmworld.com/article/519808-Corelis_ScanExpress_JET_supports_AMD_processors.php?rssid=20422</link>
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			<pubDate>Tue, 01 Nov 2011 15:10:09 GMT</pubDate>
										<description>The JTAG Embedded Test software extends boundary-scan structural test coverage to virtually...</description>
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			<title>Who should be the 2012 Test Engineer of the Year?</title>
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			<pubDate>Tue, 01 Nov 2011 04:06:00 GMT</pubDate>
										<description>Help choose the winner for this prestigious award by voting online for one of the six finalists....</description>
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			<title>Evaluating inertial measurement units</title>
			<link>http://www.tmworld.com/article/519726-Evaluating_inertial_measurement_units.php?rssid=20422</link>
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			<pubDate>Tue, 01 Nov 2011 04:03:00 GMT</pubDate>
										<description>Some simple equations can help you evaluate the effects an IMU’s error specifications will...</description>
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			<title>Testing times bring opportunities</title>
			<link>http://www.tmworld.com/article/519701-Testing_times_bring_opportunities.php?rssid=20422</link>
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			<pubDate>Tue, 01 Nov 2011 04:00:00 GMT</pubDate>
										<description>I had the good fortune of being able to drop by and visit with Tektronix at the recent...</description>
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			<title>Design series covers electromagnetic compatibility</title>
			<link>http://www.tmworld.com/article/519709-Design_series_covers_electromagnetic_compatibility.php?rssid=20422</link>
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			<pubDate>Tue, 01 Nov 2011 04:00:00 GMT</pubDate>
										<description>Consultant Daryl Gerke has written a series of articles that provides an introduction to EMC,...</description>
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			<title>IC tools show integration progress</title>
			<link>http://www.tmworld.com/article/519704-IC_tools_show_integration_progress.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/519704-IC_tools_show_integration_progress.php?rssid=20422</guid>
			<pubDate>Tue, 01 Nov 2011 04:00:00 GMT</pubDate>
										<description>Presentations at the 2011 International Test Conference illustrated the growing level of...</description>
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			<title>Vintage controller runs environmental tests</title>
			<link>http://www.tmworld.com/article/519741-Vintage_controller_runs_environmental_tests.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/519741-Vintage_controller_runs_environmental_tests.php?rssid=20422</guid>
			<pubDate>Thu, 27 Oct 2011 11:01:00 GMT</pubDate>
										<description>At Tektronix, an environmental test of oscilloscope probes uses a vintage HP 9000 series...</description>
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			<title>Goepel readies System Cascon for IJTAG</title>
			<link>http://www.tmworld.com/article/519692-Goepel_readies_System_Cascon_for_IJTAG.php?rssid=20422</link>
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			<pubDate>Fri, 21 Oct 2011 16:24:00 GMT</pubDate>
										<description>Goepel Electronic recently introduced a prototype version of its System Cascon boundary-scan...</description>
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			<title>Corelis customizes JTAG hardware for Teradyne ICTs</title>
			<link>http://www.tmworld.com/article/519599-Corelis_customizes_JTAG_hardware_for_Teradyne_ICTs.php?rssid=20422</link>
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			<pubDate>Thu, 13 Oct 2011 15:05:35 GMT</pubDate>
										<description>The Corelis USB-1149.1/CFM module integrates boundary-scan test patterns into Teradyne...</description>
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			<title>AWGs simplify characterization of digital-interface semiconductors</title>
			<link>http://www.tmworld.com/article/519589-AWGs_simplify_characterization_of_digital_interface_semiconductors.php?rssid=20422</link>
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			<pubDate>Wed, 12 Oct 2011 13:05:20 GMT</pubDate>
										<description>New semiconductor designs must be verified to meet performance targets, and even mature designs...</description>
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			<title>What I learned at the International Electronics Forum 2011</title>
			<link>http://www.tmworld.com/article/519577-What_I_learned_at_the_International_Electronics_Forum_2011.php?rssid=20422</link>
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			<pubDate>Tue, 11 Oct 2011 14:15:17 GMT</pubDate>
										<description>For over 20 years, Future Horizons, a UK-based market-research firm run by Malcolm Penn, has...</description>
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			<title>NI revises real-time test and simulation software</title>
			<link>http://www.tmworld.com/article/519551-NI_revises_real_time_test_and_simulation_software.php?rssid=20422</link>
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			<pubDate>Thu, 06 Oct 2011 16:02:10 GMT</pubDate>
										<description>VeriStand 2011 has been enhanced with a stimulus profile editor and the Inertia test-cell...</description>
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			<title>ASSET puts board tester in your FPGA</title>
			<link>http://www.tmworld.com/article/519548-ASSET_puts_board_tester_in_your_FPGA.php?rssid=20422</link>
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			<pubDate>Thu, 06 Oct 2011 15:37:26 GMT</pubDate>
										<description>ScanWorks FCT lets you select embedded instruments—such as a bit-error-rate tester or memory...</description>
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			<title>Tackling multiple domains</title>
			<link>http://www.tmworld.com/article/519433-Tackling_multiple_domains.php?rssid=20422</link>
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			<pubDate>Sat, 01 Oct 2011 04:05:00 GMT</pubDate>
										<description>Sophisticated new multiple-domain instruments complement venerable standbys to help Prototype...</description>
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			<title>SMUs simplify LVR measurements</title>
			<link>http://www.tmworld.com/article/519434-SMUs_simplify_LVR_measurements.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/519434-SMUs_simplify_LVR_measurements.php?rssid=20422</guid>
			<pubDate>Sat, 01 Oct 2011 04:03:00 GMT</pubDate>
										<description>You can characterize some common DC electrical parameters of both conventional and low-dropout...</description>
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			<title>Testing 18-bit ADCs</title>
			<link>http://www.tmworld.com/article/519435-Testing_18_bit_ADCs.php?rssid=20422</link>
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			<pubDate>Sat, 01 Oct 2011 04:02:00 GMT</pubDate>
										<description>You can construct and verify your own test setup for testing the fidelity of a high-resolution...</description>
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			<title>It was 30 years ago today. . .</title>
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			<pubDate>Sat, 01 Oct 2011 04:00:00 GMT</pubDate>
										<description>Well, not actually today. Fall 1981 saw the first issue of Test &amp; Measurement World. We recently...</description>
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			<title>Open-standard systems enhance ATE</title>
			<link>http://www.tmworld.com/article/519439-Open_standard_systems_enhance_ATE.php?rssid=20422</link>
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			<pubDate>Sat, 01 Oct 2011 04:00:00 GMT</pubDate>
										<description>David Oka of Test Evolution discusses the value of automated-test systems based on AXIe and PXI...</description>
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			<title>Math functions reveal circuit parameters</title>
			<link>http://www.tmworld.com/article/519448-Math_functions_reveal_circuit_parameters.php?rssid=20422</link>
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			<pubDate>Sat, 01 Oct 2011 04:00:00 GMT</pubDate>
										<description>You can download a paper that explains how to multiply voltage and current on an oscilloscope in...</description>
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			<title>Failure analysis of 3-D packages speeds up</title>
			<link>http://www.tmworld.com/article/519455-Failure_analysis_of_3_D_packages_speeds_up.php?rssid=20422</link>
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			<pubDate>Sat, 01 Oct 2011 04:00:00 GMT</pubDate>
										<description>In 3-D packaging integration, stacking wafers and dies of mixed, heterogeneous technologies is...</description>
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			<title>Agilent enhances in-circuit tester</title>
			<link>http://www.tmworld.com/article/519480-Agilent_enhances_in_circuit_tester.php?rssid=20422</link>
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			<pubDate>Wed, 28 Sep 2011 19:39:55 GMT</pubDate>
										<description>Agilent Technologies has added several capabilities to its Medalist i1000D in-circuit test...</description>
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			<title>AutoBuzz tool simplifies boundary-scan test</title>
			<link>http://www.tmworld.com/article/519479-AutoBuzz_tool_simplifies_boundary_scan_test.php?rssid=20422</link>
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			<pubDate>Wed, 28 Sep 2011 18:45:38 GMT</pubDate>
										<description>Like other products JTAG Technologies, the new AutoBuzz tool does not require a netlist in...</description>
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			<title>Asset teams boundary-scan software with Teradyne hardware</title>
			<link>http://www.tmworld.com/article/519470-Asset_teams_boundary_scan_software_with_Teradyne_hardware.php?rssid=20422</link>
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			<pubDate>Tue, 27 Sep 2011 16:16:35 GMT</pubDate>
										<description>The two companies have integrated Asset’s ScanWorks software for embedded instruments into...</description>
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			<title>Positional probe measures current in PCB tracks</title>
			<link>http://www.tmworld.com/article/519349-Positional_probe_measures_current_in_PCB_tracks.php?rssid=20422</link>
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			<pubDate>Thu, 15 Sep 2011 17:31:13 GMT</pubDate>
										<description>Aim-TTi has launched the I-prober 520, a positional current probe that allows you to observe...</description>
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			<title>PXI modules enable semiconductor characterization</title>
			<link>http://www.tmworld.com/article/519346-PXI_modules_enable_semiconductor_characterization.php?rssid=20422</link>
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			<pubDate>Thu, 15 Sep 2011 17:18:33 GMT</pubDate>
										<description>National Instruments has expanded the capabilities of its PXI platform for semiconductor...</description>
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			<title>Giga-tronics extends switching family to 67 GHz</title>
			<link>http://www.tmworld.com/article/519306-Giga_tronics_extends_switching_family_to_67_GHz.php?rssid=20422</link>
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			<pubDate>Thu, 08 Sep 2011 16:49:58 GMT</pubDate>
										<description>The addition of 50-GHz and 67-GHz switching options to the Series 8000 and Series 8800...</description>
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			<title>Call for nominations: Best in Test and Test of Time</title>
			<link>http://www.tmworld.com/article/519274-Call_for_nominations_Best_in_Test_and_Test_of_Time.php?rssid=20422</link>
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			<pubDate>Tue, 06 Sep 2011 17:42:47 GMT</pubDate>
										<description>Test &amp; Measurement World's editors are now seeking nominations for the 2012 Best in Test and...</description>
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			<title>Keeping the measurements flowing</title>
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			<pubDate>Thu, 01 Sep 2011 04:05:00 GMT</pubDate>
										<description>The engineers at GE Measurement &amp; Control Solutions design and test flow meters and moisture...</description>
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			<title>Charge-pumping measurements</title>
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			<pubDate>Thu, 01 Sep 2011 04:03:00 GMT</pubDate>
										<description>To make charge-pumping current measurements on semiconductor devices, you must pulse a gate...</description>
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			<title>Speeding SOC test</title>
			<link>http://www.tmworld.com/article/519155-Speeding_SOC_test.php?rssid=20422</link>
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			<pubDate>Thu, 01 Sep 2011 04:02:00 GMT</pubDate>
										<description>Protocol-aware ATE hardware boosts the efficiency of parallel-site and concurrent tests for SIP,...</description>
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			<title>Automation keeps RFICs in spec</title>
			<link>http://www.tmworld.com/article/519174-Automation_keeps_RFICs_in_spec.php?rssid=20422</link>
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			<pubDate>Thu, 01 Sep 2011 04:00:00 GMT</pubDate>
										<description>NXP Semiconductors' Andy Street works with design engineers and production engineers to...</description>
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			<title>Meeting the grand challenges</title>
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			<pubDate>Thu, 01 Sep 2011 04:00:00 GMT</pubDate>
										<description>The National Academy of Engineering’s 14 grand engineering challenges received well-deserved...</description>
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			<title>Software key to effective use of ATE hardware</title>
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			<pubDate>Thu, 01 Sep 2011 04:00:00 GMT</pubDate>
										<description>...</description>
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			<title>Geotest enters sales agreement with Robson Technologies</title>
			<link>http://www.tmworld.com/article/519249-Geotest_enters_sales_agreement_with_Robson_Technologies.php?rssid=20422</link>
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			<pubDate>Wed, 31 Aug 2011 23:13:39 GMT</pubDate>
										<description>Expanding its sales force in North America, Geotest has announced it has selected RTI as its...</description>
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			<title>VarioTAP IP supports DaVinci</title>
			<link>http://www.tmworld.com/article/519240-VarioTAP_IP_supports_DaVinci.php?rssid=20422</link>
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			<pubDate>Wed, 31 Aug 2011 13:16:48 GMT</pubDate>
										<description>Goepel electronic has announced that it has developed VarioTAP IP for Texas Instruments'...</description>
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			<title>Call for nominations: Test Engineer of the Year</title>
			<link>http://www.tmworld.com/article/519193-Call_for_nominations_Test_Engineer_of_the_Year.php?rssid=20422</link>
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			<pubDate>Wed, 24 Aug 2011 20:38:46 GMT</pubDate>
										<description>The editors of Test &amp; Measurement World are now accepting nominations for the annual Test...</description>
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			<title>IDM reports Multitest's Mercury boosts yields</title>
			<link>http://www.tmworld.com/article/519126-IDM_reports_Multitest_s_Mercury_boosts_yields.php?rssid=20422</link>
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			<pubDate>Thu, 18 Aug 2011 12:10:21 GMT</pubDate>
										<description>Multitest has announced that its Mercury contactor boosts FPY (first-pass yield) by 2 to 6%,...</description>
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			<title>LabView 2011 goes for productivity</title>
			<link>http://www.tmworld.com/article/518979-LabView_2011_goes_for_productivity.php?rssid=20422</link>
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			<pubDate>Mon, 01 Aug 2011 14:41:01 GMT</pubDate>
										<description>LabView 2011 has functions that make the programming environment easier to use and require fewer...</description>
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			<title>2011 Buyer's Guide</title>
			<link>http://www.tmworld.com/article/518966-2011_Buyer_s_Guide.php?rssid=20422</link>
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			<pubDate>Mon, 01 Aug 2011 04:10:00 GMT</pubDate>
										<description>Find the electronics test, measurement, and inspection vendors who make the products you...</description>
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			<title>Test comes roaring back</title>
			<link>http://www.tmworld.com/article/518934-Test_comes_roaring_back.php?rssid=20422</link>
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			<pubDate>Mon, 01 Aug 2011 04:04:00 GMT</pubDate>
										<description>As the old saying goes, the bigger they are, the harder they fall. But there’s a flip side...</description>
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			<title>Test &amp; Measurement World's Top 50 of 2011</title>
			<link>http://www.tmworld.com/article/518932-Test_Measurement_World_s_Top_50_of_2011.php?rssid=20422</link>
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			<pubDate>Mon, 01 Aug 2011 04:02:00 GMT</pubDate>
										<description>Our editors have identified these 50 products as the hottest test, measurement, and inspection...</description>
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			<title>Electronic ecosystem needs support</title>
			<link>http://www.tmworld.com/article/518926-Electronic_ecosystem_needs_support.php?rssid=20422</link>
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			<pubDate>Mon, 01 Aug 2011 04:00:00 GMT</pubDate>
										<description>An expanding electronic ecosystem offers good news for semiconductor and related...</description>
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			<title>3-D x-ray microscopy aids failure analysis of complex packages</title>
			<link>http://www.tmworld.com/article/518954-3_D_x_ray_microscopy_aids_failure_analysis_of_complex_packages.php?rssid=20422</link>
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			<pubDate>Mon, 01 Aug 2011 04:00:00 GMT</pubDate>
										<description>Isolating and characterizing defects in complex 3-D and stacked-die IC packages can be nearly...</description>
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			<title>2011 Buyers' Guide: Electrical &amp; Physical Environmental Test</title>
			<link>http://www.tmworld.com/article/518961-2011_Buyers_Guide_Electrical_Physical_Environmental_Test.php?rssid=20422</link>
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			<pubDate>Mon, 01 Aug 2011 04:00:00 GMT</pubDate>
										<description>Find the vendors who make the products you need for environmental test, EMC test, and ESD...</description>
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			<title>2011 Buyer's Guide: ATE/DFT/BIST</title>
			<link>http://www.tmworld.com/article/518959-2011_Buyer_s_Guide_ATE_DFT_BIST.php?rssid=20422</link>
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			<pubDate>Mon, 01 Aug 2011 04:00:00 GMT</pubDate>
										<description>Find the ATE vendors you make the products you need for production...</description>
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			<title>The Tel-Ohmike</title>
			<link>http://www.tmworld.com/article/518927-The_Tel_Ohmike.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/518927-The_Tel_Ohmike.php?rssid=20422</guid>
			<pubDate>Mon, 01 Aug 2011 04:00:00 GMT</pubDate>
										<description>I can’t prove it, but I’ll wager that capacitors are near the tops of everyone’s...</description>
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			<title>CSZ acquires HALT &amp; HASS Systems</title>
			<link>http://www.tmworld.com/article/518899-CSZ_acquires_HALT_HASS_Systems.php?rssid=20422</link>
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			<pubDate>Mon, 25 Jul 2011 20:38:09 GMT</pubDate>
										<description>The acquisition will enable Cincinnati Sub-Zero to broaden its product...</description>
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			<title>Pickering PXI modules simulate fault conditions</title>
			<link>http://www.tmworld.com/article/518868-Pickering_PXI_modules_simulate_fault_conditions.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/518868-Pickering_PXI_modules_simulate_fault_conditions.php?rssid=20422</guid>
			<pubDate>Thu, 21 Jul 2011 15:37:20 GMT</pubDate>
										<description>The modules can be used within an automatic test system to simulate common fault conditions,...</description>
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			<title>Advantest, Verigy extend existing platforms</title>
			<link>http://www.tmworld.com/article/518834-Advantest_Verigy_extend_existing_platforms.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/518834-Advantest_Verigy_extend_existing_platforms.php?rssid=20422</guid>
			<pubDate>Tue, 19 Jul 2011 13:20:03 GMT</pubDate>
										<description>Advantest's purchase of Verigy is, at least for now, not altering the innovative development...</description>
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			<title>Multitest names new president</title>
			<link>http://www.tmworld.com/article/518773-Multitest_names_new_president.php?rssid=20422</link>
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			<pubDate>Tue, 12 Jul 2011 12:56:25 GMT</pubDate>
										<description>Multitest has announced that Reinhart Richter has been promoted to president of the Multitest...</description>
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			<title>Geotest debuts PXI semiconductor test system</title>
			<link>http://www.tmworld.com/article/518744-Geotest_debuts_PXI_semiconductor_test_system.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/518744-Geotest_debuts_PXI_semiconductor_test_system.php?rssid=20422</guid>
			<pubDate>Thu, 07 Jul 2011 11:23:58 GMT</pubDate>
										<description>Geotest has announced the TS-900, a new PXI-based test system for component, SoC, and SiP test...</description>
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			<title>IDM chooses Multitest's DuraKelvin contactor</title>
			<link>http://www.tmworld.com/article/518725-IDM_chooses_Multitest_s_DuraKelvin_contactor.php?rssid=20422</link>
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			<pubDate>Wed, 06 Jul 2011 12:55:48 GMT</pubDate>
										<description>Multiest has announced that an IDM has chosen Multitest DuraKelvin contactors for use at a...</description>
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			<title>Tektronix acquires Veridae Systems</title>
			<link>http://www.tmworld.com/article/518724-Tektronix_acquires_Veridae_Systems.php?rssid=20422</link>
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			<pubDate>Wed, 06 Jul 2011 12:44:01 GMT</pubDate>
										<description>Tektronix has announced the acquisition of Veridae Systems, which offers ASIC and FPGA debug...</description>
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			<title>JTAG adds capabilities to Buzz boundary-scan tool</title>
			<link>http://www.tmworld.com/article/518711-JTAG_adds_capabilities_to_Buzz_boundary_scan_tool.php?rssid=20422</link>
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			<pubDate>Tue, 05 Jul 2011 16:25:44 GMT</pubDate>
										<description>The Buzz-plus extension finds the boundary-scan connections for two drivers...</description>
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			<title>PXI boosts IC test</title>
			<link>http://www.tmworld.com/article/518683-PXI_boosts_IC_test.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/518683-PXI_boosts_IC_test.php?rssid=20422</guid>
			<pubDate>Wed, 01 Jun 2011 04:04:00 GMT</pubDate>
										<description>Digital-isolation and broadcast-receiver device-test examples illustrate the capabilities of a...</description>
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			<title>Prospects for RF MEMS</title>
			<link>http://www.tmworld.com/article/518630-Prospects_for_RF_MEMS.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/518630-Prospects_for_RF_MEMS.php?rssid=20422</guid>
			<pubDate>Fri, 01 Jul 2011 04:00:00 GMT</pubDate>
										<description>Are RF MEMS devices commercially viable, or will they become so soon? That question was...</description>
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			<title>Measurements demonstrate transceiver quality</title>
			<link>http://www.tmworld.com/article/518643-Measurements_demonstrate_transceiver_quality.php?rssid=20422</link>
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			<pubDate>Fri, 01 Jul 2011 04:00:00 GMT</pubDate>
										<description>Ousama Hage provides technical support to engineers who design systems with Xilinx FPGAs that...</description>
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			<title>Build a tester around a microcontroller</title>
			<link>http://www.tmworld.com/article/518650-Build_a_tester_around_a_microcontroller.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/518650-Build_a_tester_around_a_microcontroller.php?rssid=20422</guid>
			<pubDate>Fri, 01 Jul 2011 04:00:00 GMT</pubDate>
										<description>Some test applications call for embedded intelligence to be built into a test fixture or...</description>
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			<title>Analyzer performs simultaneous hipot/ground testing</title>
			<link>http://www.tmworld.com/article/518636-Analyzer_performs_simultaneous_hipot_ground_testing.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/518636-Analyzer_performs_simultaneous_hipot_ground_testing.php?rssid=20422</guid>
			<pubDate>Tue, 28 Jun 2011 11:00:00 GMT</pubDate>
										<description>Associated Research's model 8204 electrical safety compliance analyzer is a 4-in-1 unit that...</description>
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			<title>FEI's plasma FIB system speeds material removal</title>
			<link>http://www.tmworld.com/article/518632-FEI_s_plasma_FIB_system_speeds_material_removal.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/518632-FEI_s_plasma_FIB_system_speeds_material_removal.php?rssid=20422</guid>
			<pubDate>Mon, 27 Jun 2011 11:00:00 GMT</pubDate>
										<description>FEI claims that its Vion PFIB (plasma focused ion beam) system removes material more than 20...</description>
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			<title>STMicroelectronics collaborates with McGill University</title>
			<link>http://www.tmworld.com/article/518589-STMicroelectronics_collaborates_with_McGill_University.php?rssid=20422</link>
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			<pubDate>Wed, 22 Jun 2011 11:00:00 GMT</pubDate>
										<description>Semiconductor-device manufacturer STMicroelectronics and Canada's McGill University have...</description>
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			<title>Online event looks at DUT complexity's effects on test engineers</title>
			<link>http://www.tmworld.com/article/518566-Online_event_looks_at_DUT_complexity_s_effects_on_test_engineers.php?rssid=20422</link>
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			<pubDate>Mon, 20 Jun 2011 16:24:32 GMT</pubDate>
										<description>Frost &amp; Sullivan's industry director Jessy Cavazos and industry analyst Prathima Bommakanti and...</description>
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			<title>IMS2011: CST adds HPC capabilities</title>
			<link>http://www.tmworld.com/article/518504-IMS2011_CST_adds_HPC_capabilities.php?rssid=20422</link>
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			<pubDate>Mon, 13 Jun 2011 18:40:57 GMT</pubDate>
										<description>Computer Simulation Technology (CST) at IMS2011 announced the release of new...</description>
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			<title>IMS2011: Agilent demonstrates instruments and software</title>
			<link>http://www.tmworld.com/article/518489-IMS2011_Agilent_demonstrates_instruments_and_software.php?rssid=20422</link>
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			<pubDate>Mon, 13 Jun 2011 11:23:25 GMT</pubDate>
										<description>After focusing on LTE at a Tuesday June 7 press conference, Agilent Technologies highlighted a...</description>
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			<title>Sealevel HMI panel computer is NEMA-protected</title>
			<link>http://www.tmworld.com/article/518395-Sealevel_HMI_panel_computer_is_NEMA_protected.php?rssid=20422</link>
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			<pubDate>Thu, 09 Jun 2011 11:00:00 GMT</pubDate>
										<description>The SeaPAC R9-8.4 from Sealevel Systems combines a RISC-based embedded computer with a TFT LCD...</description>
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			<title>Omega's wireless IP65 device transmits RH readings</title>
			<link>http://www.tmworld.com/article/518394-Omega_s_wireless_IP65_device_transmits_RH_readings.php?rssid=20422</link>
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			<pubDate>Wed, 08 Jun 2011 11:00:00 GMT</pubDate>
										<description>Housed in a NEMA-4X/IP65 weather-resistant enclosure, the UWRH-2-NEMA wireless transmitter from...</description>
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			<title>Agilent debuts peak-power analyzer</title>
			<link>http://www.tmworld.com/article/518441-Agilent_debuts_peak_power_analyzer.php?rssid=20422</link>
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			<pubDate>Tue, 07 Jun 2011 19:22:26 GMT</pubDate>
										<description>Targeting the test of devices including power amplifiers, transceivers, and satellite...</description>
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			<title>Inspection system tackles TSV packaging</title>
			<link>http://www.tmworld.com/article/518435-Inspection_system_tackles_TSV_packaging.php?rssid=20422</link>
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			<pubDate>Tue, 07 Jun 2011 15:27:09 GMT</pubDate>
										<description>The NSX 320 automated macro-inspection system from Rudolph Technologies is designed for the...</description>
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			<title>Ironwood’s 40-GHz socket handles 23x23-mm BGAs</title>
			<link>http://www.tmworld.com/article/518433-Ironwood_s_40_GHz_socket_handles_23x23_mm_BGAs.php?rssid=20422</link>
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			<pubDate>Mon, 06 Jun 2011 22:48:04 GMT</pubDate>
										<description>Using Ironwood Electronics’ SM-BGA-9000, you can socket 23x23-mm, 0.8-mm-pitch PBGA packages...</description>
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			<title>T&amp;MW announces award winners for 2011</title>
			<link>http://www.tmworld.com/article/518317-T_MW_announces_award_winners_for_2011.php?rssid=20422</link>
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			<pubDate>Wed, 01 Jun 2011 04:02:00 GMT</pubDate>
										<description>On May 4, during a ceremony held in conjunction with the Embedded Systems Conference Silicon...</description>
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			<title>ESC 2011: Scope strategies charted at embedded design show</title>
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			<pubDate>Wed, 01 Jun 2011 04:00:00 GMT</pubDate>
										<description>...</description>
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			<title>How to tame high-speed systems</title>
			<link>http://www.tmworld.com/article/518347-How_to_tame_high_speed_systems.php?rssid=20422</link>
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			<pubDate>Wed, 01 Jun 2011 04:00:00 GMT</pubDate>
										<description>Dr. Julio Perdomo of Centellax discusses the challenges associated with characterizing...</description>
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			<title>Diamond's I/O modules offer choice of expansion format</title>
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			<pubDate>Mon, 30 May 2011 11:00:00 GMT</pubDate>
										<description>A family of analog and digital I/O expansion modules from Diamond Systems targets systems based...</description>
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			<title>Acromag's industrial PC certified for hazardous use</title>
			<link>http://www.tmworld.com/article/518279-Acromag_s_industrial_PC_certified_for_hazardous_use.php?rssid=20422</link>
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			<pubDate>Fri, 27 May 2011 11:00:00 GMT</pubDate>
										<description>The Acromag I/O Server industrial PC now adds UL certifications for Class I, Division 2, Group...</description>
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			<title>Teklatech tackles EMI in wireless IC design</title>
			<link>http://www.tmworld.com/article/518266-Teklatech_tackles_EMI_in_wireless_IC_design.php?rssid=20422</link>
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			<pubDate>Wed, 25 May 2011 11:18:47 GMT</pubDate>
										<description>In an effort to address EMI issues at the chip level, Teklatech has announced the release of...</description>
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			<title>Goepel and SPEA team up on boundary scan</title>
			<link>http://www.tmworld.com/article/518262-Goepel_and_SPEA_team_up_on_boundary_scan.php?rssid=20422</link>
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			<pubDate>Tue, 24 May 2011 17:25:09 GMT</pubDate>
										<description>Goepel electronic and SPEA announced that they have developed a boundary-scan option for the...</description>
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			<title>Digitaltest boosts flying-prober throughput</title>
			<link>http://www.tmworld.com/article/518248-Digitaltest_boosts_flying_prober_throughput.php?rssid=20422</link>
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			<pubDate>Mon, 23 May 2011 19:24:06 GMT</pubDate>
										<description>Digitaltest reports that on behalf of customer EKM Elektronik, Digitaltest was able to augment a...</description>
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			<title>Rohde &amp; Schwarz and Synopsys team up on LTE</title>
			<link>http://www.tmworld.com/article/518233-Rohde_Schwarz_and_Synopsys_team_up_on_LTE.php?rssid=20422</link>
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			<pubDate>Mon, 23 May 2011 12:55:03 GMT</pubDate>
										<description>Rohde &amp; Schwarz and Synopsys have announced a collaborative effort to accelerate LTE and...</description>
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			<title>OriginLab adds new tools to graphing software</title>
			<link>http://www.tmworld.com/article/518240-OriginLab_adds_new_tools_to_graphing_software.php?rssid=20422</link>
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			<pubDate>Mon, 23 May 2011 11:00:00 GMT</pubDate>
										<description>Origin 8.5.1 and OriginPro 8.5.1, the latest versions of OriginLab's graphing and data-analysis...</description>
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			<title>Agilent software performs I-V curve tracing</title>
			<link>http://www.tmworld.com/article/518197-Agilent_software_performs_I_V_curve_tracing.php?rssid=20422</link>
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			<pubDate>Thu, 19 May 2011 11:00:00 GMT</pubDate>
										<description>Parametric Measurement Manager Pro works with the Agilent's U2722A and U2723A USB modular SMUs...</description>
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			<title>Worldwide microwave community to convene in Baltimore for IMS2011</title>
			<link>http://www.tmworld.com/article/518184-Worldwide_microwave_community_to_convene_in_Baltimore_for_IMS2011.php?rssid=20422</link>
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			<pubDate>Wed, 18 May 2011 12:25:30 GMT</pubDate>
										<description>The 2011 MTT-S International Microwave Symposium will commence June 5 in Baltimore, with this...</description>
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			<title>Build a tester around a microcontroller</title>
			<link>http://www.tmworld.com/article/518118-Build_a_tester_around_a_microcontroller.php?rssid=20422</link>
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			<pubDate>Fri, 13 May 2011 14:20:00 GMT</pubDate>
										<description>Some test applications call for embedded intelligence built into a test fixture or stand-alone...</description>
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			<title>XTX manages IC power dissipation during test</title>
			<link>http://www.tmworld.com/article/518144-XTX_manages_IC_power_dissipation_during_test.php?rssid=20422</link>
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			<pubDate>Thu, 12 May 2011 13:44:16 GMT</pubDate>
										<description>Multitest has announced that its MT9510 handler now provides extended temperature control with...</description>
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			<title>ScanFlex gang tester applies boundary scan in mass production</title>
			<link>http://www.tmworld.com/article/518143-ScanFlex_gang_tester_applies_boundary_scan_in_mass_production.php?rssid=20422</link>
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			<pubDate>Thu, 12 May 2011 13:23:02 GMT</pubDate>
										<description>Goepel electronic has introduced the SFX-TAP16/G modular gang test system with integrated UUT...</description>
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			<title>Powercast’s wireless sensor system is RF-powered</title>
			<link>http://www.tmworld.com/article/518116-Powercast_s_wireless_sensor_system_is_RF_powered.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/518116-Powercast_s_wireless_sensor_system_is_RF_powered.php?rssid=20422</guid>
			<pubDate>Wed, 11 May 2011 11:00:00 GMT</pubDate>
										<description>Powercast estimates that a batteryless, wirelessly powered Lifetime Power sensor system could...</description>
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			<title>Kozio debuts language-based environment for embedded-system verification</title>
			<link>http://www.tmworld.com/article/518098-Kozio_debuts_language_based_environment_for_embedded_system_verification.php?rssid=20422</link>
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			<pubDate>Tue, 10 May 2011 13:21:23 GMT</pubDate>
										<description>Kozio has announced ValidationAssistant, a unified, interactive, embedded-hardware verification...</description>
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			<title>T&amp;MW announces winners of 2011 Best in Test awards</title>
			<link>http://www.tmworld.com/article/518061-T_MW_announces_winners_of_2011_Best_in_Test_awards.php?rssid=20422</link>
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			<pubDate>Thu, 05 May 2011 15:56:19 GMT</pubDate>
										<description>On May 4, Test &amp; Measurement World announced the winners of the 2011 Test Engineer of the...</description>
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			<title>Giga-tronics' switching platform spans DC to 50 GHz</title>
			<link>http://www.tmworld.com/article/518019-Giga_tronics_switching_platform_spans_DC_to_50_GHz.php?rssid=20422</link>
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			<pubDate>Tue, 03 May 2011 11:00:00 GMT</pubDate>
										<description>The Ascor Series 8800 from Giga-tronics provides a modular RF/LF/DC switching platform that is...</description>
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			<title>Advantech fanless computers gain faster processor</title>
			<link>http://www.tmworld.com/article/518020-Advantech_fanless_computers_gain_faster_processor.php?rssid=20422</link>
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			<pubDate>Tue, 03 May 2011 11:00:00 GMT</pubDate>
										<description>The UNO-2050G, UNO-2053GL, and UNO-2059GL embedded automation fanless computers from Advantech...</description>
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			<title>Advantech's server board provides 24/7 operation</title>
			<link>http://www.tmworld.com/article/518023-Advantech_s_server_board_provides_24_7_operation.php?rssid=20422</link>
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			<pubDate>Mon, 02 May 2011 11:00:00 GMT</pubDate>
										<description>Compliant with the SSI CEB form factor, the ASMB-3101R dual-processor server board from...</description>
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			<title>Optimizing the SOC test-development effort</title>
			<link>http://www.tmworld.com/article/517947-Optimizing_the_SOC_test_development_effort.php?rssid=20422</link>
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			<pubDate>Sun, 01 May 2011 04:00:00 GMT</pubDate>
										<description>Every product or process can benefit from an ROI (return-on-investment) analysis that enables...</description>
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			<title>Vendors target LTE design and deployment</title>
			<link>http://www.tmworld.com/article/517943-Vendors_target_LTE_design_and_deployment.php?rssid=20422</link>
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			<pubDate>Sun, 01 May 2011 04:00:00 GMT</pubDate>
										<description>Test-equipment vendors are gearing up to facilitate the design and deployment of LTE systems,...</description>
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			<title>The designer who automates tests</title>
			<link>http://www.tmworld.com/article/517937-The_designer_who_automates_tests.php?rssid=20422</link>
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			<pubDate>Sun, 01 May 2011 04:00:00 GMT</pubDate>
										<description>Kenneth Schnebly is an analog and digital controls engineer at AML Communications, a maker of...</description>
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			<title>Ametek's programmable supply delivers 1500 W</title>
			<link>http://www.tmworld.com/article/517978-Ametek_s_programmable_supply_delivers_1500_W.php?rssid=20422</link>
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			<pubDate>Thu, 28 Apr 2011 11:00:00 GMT</pubDate>
										<description>Housed in a 1U form factor, the Sorensen XG 1500 from Ametek is a 1500-W programmable DC power...</description>
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			<title>Omega’s wireless device transmits process signals</title>
			<link>http://www.tmworld.com/article/517969-Omega_s_wireless_device_transmits_process_signals.php?rssid=20422</link>
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			<pubDate>Wed, 27 Apr 2011 11:00:00 GMT</pubDate>
										<description>The UWPC-2-NEMA from Omega Engineering converts standard voltage and current process signals...</description>
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			<title>Geotest names western regional sales manager</title>
			<link>http://www.tmworld.com/article/517931-Geotest_names_western_regional_sales_manager.php?rssid=20422</link>
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			<pubDate>Mon, 25 Apr 2011 11:00:00 GMT</pubDate>
										<description>Michael Schraeder will manage Geotest's sales forces in the western and Rocky Mountain...</description>
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			<title>CyberOptics' wafer sensor monitors airborne particles</title>
			<link>http://www.tmworld.com/article/517900-CyberOptics_wafer_sensor_monitors_airborne_particles.php?rssid=20422</link>
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			<pubDate>Wed, 20 Apr 2011 11:00:00 GMT</pubDate>
										<description>After a year of beta testing and product analysis, CyberOptics Semiconductor has released the...</description>
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			<title>Baumer pressure transmitter works up to 150 degrees C</title>
			<link>http://www.tmworld.com/article/517840-Baumer_pressure_transmitter_works_up_to_150_degrees_C.php?rssid=20422</link>
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			<pubDate>Thu, 14 Apr 2011 11:00:00 GMT</pubDate>
										<description>Based on a thick-film ceramic measuring cell, the PBSN general-purpose pressure transmitter from...</description>
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			<title>DDC's oscillator cards drive high inductive loads</title>
			<link>http://www.tmworld.com/article/517806-DDC_s_oscillator_cards_drive_high_inductive_loads.php?rssid=20422</link>
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			<pubDate>Wed, 13 Apr 2011 11:00:00 GMT</pubDate>
										<description>Based on a PC/104 form factor, the SB-36350CX series of sine-reference oscillator cards from...</description>
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			<title>Goepel extends ScanFlex with multifunctional controller</title>
			<link>http://www.tmworld.com/article/517719-Goepel_extends_ScanFlex_with_multifunctional_controller.php?rssid=20422</link>
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			<pubDate>Thu, 07 Apr 2011 13:12:50 GMT</pubDate>
										<description>Goepel Electronic has introduced its SFX/COMBO1149-(x), the first desktop compact controller for...</description>
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			<title>Keithley puts Webinars on CD</title>
			<link>http://www.tmworld.com/article/517543-Keithley_puts_Webinars_on_CD.php?rssid=20422</link>
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			<pubDate>Fri, 01 Apr 2011 11:00:00 GMT</pubDate>
										<description>"Tips and Techniques for Today's Challenging Electrical Measurements" from Keithley Instruments...</description>
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			<title>The chips almost test themselves</title>
			<link>http://www.tmworld.com/article/517517-The_chips_almost_test_themselves.php?rssid=20422</link>
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			<pubDate>Fri, 01 Apr 2011 04:00:00 GMT</pubDate>
										<description>PCIe data rates of 8 GT/s and Ethernet data rates of 10 Gbps produce signal degradations in...</description>
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			<title>Ensuring high-quality ICs</title>
			<link>http://www.tmworld.com/article/517518-Ensuring_high_quality_ICs.php?rssid=20422</link>
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			<pubDate>Fri, 01 Apr 2011 04:03:00 GMT</pubDate>
										<description>Suppose you were given the assignment to find a basketball in the Los Angeles area—just one...</description>
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			<title>The measure of thought</title>
			<link>http://www.tmworld.com/article/517489-The_measure_of_thought.php?rssid=20422</link>
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			<pubDate>Fri, 01 Apr 2011 04:00:00 GMT</pubDate>
										<description>What, exactly, did Watson do on...</description>
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			<title>Sigurd chooses MT2168 handler</title>
			<link>http://www.tmworld.com/article/517592-Sigurd_chooses_MT2168_handler.php?rssid=20422</link>
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			<pubDate>Thu, 31 Mar 2011 11:40:27 GMT</pubDate>
										<description>Multitest has announced that Sigurd Microelectronics has become the first user of the Multitest...</description>
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			<title>Kistler triaxial accelerometer handles up to ±2000 g</title>
			<link>http://www.tmworld.com/article/517540-Kistler_triaxial_accelerometer_handles_up_to_2000_g.php?rssid=20422</link>
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			<pubDate>Tue, 29 Mar 2011 11:00:00 GMT</pubDate>
										<description>The Type 8763B miniature IEPE accelerometer from Kistler provides simultaneous shock and...</description>
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			<title>Mentor Graphics demonstrates IC failure and yield analysis at Fujitsu</title>
			<link>http://www.tmworld.com/article/517424-Mentor_Graphics_demonstrates_IC_failure_and_yield_analysis_at_Fujitsu.php?rssid=20422</link>
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			<pubDate>Fri, 18 Mar 2011 13:50:28 GMT</pubDate>
										<description>Mentor Graphics announced evaluation results at Fujitsu Semiconductor Ltd. that shows the...</description>
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