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		<title>Test &amp; Measurement World - Design, Production Test, and Yield News</title>
		<link>http://www.tmworld.com</link>
		<pubDate>Sat, 14 Nov 2009 08:12:08 MST</pubDate>
		<description>News and articles covering the development and test of integrated circuits, printed-circuit boards, and electronic systems. Topics include semiconductor test, wafer test and yield, automated test equipment, EDA (electronic design automation), boundary scan, BIST (built-in self-test), test-pattern compression, and defect analysis.</description>
		<language>eng</language>
		<copyright>Copyright 2009 Reed Business Information. Subject to its Terms of Use (http://www.tmworld.com/info/terms-and-conditions.php)</copyright>
		


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			<title>NI targets semiconductor test with Productronica 2009 introductions</title>
			<link>http://www.tmworld.com/article/388227-NI_targets_semiconductor_test_with_Productronica_2009_introductions.php?rssid=20422</link>
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			<pubDate>Tue, 10 Nov 2009 14:13:05 GMT</pubDate>
			<description>National Instruments chose Productronica to introduce 10 new PXI products that expand the...</description>
		</item>
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			<title>ITC 2009: OptimalTest deepens test management offerings</title>
			<link>http://www.tmworld.com/article/383241-ITC_2009_OptimalTest_deepens_test_management_offerings.php?rssid=20422</link>
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			<pubDate>Fri, 06 Nov 2009 19:09:15 GMT</pubDate>
			<description>OptimalTest announced three significant extensions to the company's suite of tester-monitoring...</description>
		</item>
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			<title>ITC 2009 panel explores future of analog test</title>
			<link>http://www.tmworld.com/article/383235-ITC_2009_panel_explores_future_of_analog_test.php?rssid=20422</link>
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			<pubDate>Fri, 06 Nov 2009 18:44:05 GMT</pubDate>
			<description>Panelists from both the semiconductor and EDA industries discuss whether there is any way for...</description>
		</item>
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			<title>Mentor Graphics combines test and yield analysis in Tessent line</title>
			<link>http://www.tmworld.com/article/367116-Mentor_Graphics_combines_test_and_yield_analysis_in_Tessent_line.php?rssid=20422</link>
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			<pubDate>Mon, 02 Nov 2009 17:26:00 GMT</pubDate>
			<description>The new Tessent product line will combine ATPG, test-vector compression, logic and memory BIST,...</description>
		</item>
										<item>
			<title>Do you know your true cost of test? (Guest commentary)</title>
			<link>http://www.tmworld.com/article/367095-Do_you_know_your_true_cost_of_test_Guest_commentary_.php?rssid=20422</link>
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			<pubDate>Mon, 02 Nov 2009 16:21:02 GMT</pubDate>
			<description>Your test strategy plays a role in maintaining your company's competitive advantage. (Part 1 of...</description>
		</item>
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			<title>Dytran impulse hammers are TEDS-enabled</title>
			<link>http://www.tmworld.com/article/367223-Dytran_impulse_hammers_are_TEDS_enabled.php?rssid=20422</link>
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			<pubDate>Mon, 02 Nov 2009 12:00:00 GMT</pubDate>
			<description>Dytran Instruments now offers impulse hammers with a TEDS (transducer electronic data sheet) and...</description>
		</item>
										<item>
			<title>AEMC's flexible current probe measures up to 3000 A RMS</title>
			<link>http://www.tmworld.com/article/367115-AEMC_s_flexible_current_probe_measures_up_to_3000_A_RMS.php?rssid=20422</link>
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			<pubDate>Mon, 02 Nov 2009 12:00:00 GMT</pubDate>
			<description>The MiniFlex from AEMC Instruments is an AC current transformer that comprises a flexible sensor...</description>
		</item>
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			<title>Keeping overseas production moving</title>
			<link>http://www.tmworld.com/article/366374-Keeping_overseas_production_moving.php?rssid=20422</link>
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			<pubDate>Sun, 01 Nov 2009 05:00:00 GMT</pubDate>
			<description>Jonathan Davis spent several years in Asia working for a fabless semiconductor company that...</description>
		</item>
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			<title>Mentor focuses on complementary DFT and BIST tools</title>
			<link>http://www.tmworld.com/article/366388-Mentor_focuses_on_complementary_DFT_and_BIST_tools.php?rssid=20422</link>
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			<pubDate>Sun, 01 Nov 2009 05:00:00 GMT</pubDate>
			<description>Mentor Graphics, with its acquisition of LogicVision last summer, is uniting BIST, ATPG, and...</description>
		</item>
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			<title>Vote for the 2010 Test Engineer of the Year</title>
			<link>http://www.tmworld.com/article/366371-Vote_for_the_2010_Test_Engineer_of_the_Year.php?rssid=20422</link>
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			<pubDate>Sun, 01 Nov 2009 05:00:00 GMT</pubDate>
			<description>To salute the engineers who play a critical role in electronics testing, Test &amp; Measurement...</description>
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			<title>Multicore competency</title>
			<link>http://www.tmworld.com/article/366383-Multicore_competency.php?rssid=20422</link>
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			<pubDate>Sun, 01 Nov 2009 05:00:00 GMT</pubDate>
			<description>Freescale Semiconductor is addressing the processing needs of wireless broadband equipment...</description>
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			<title>PXI system tests MEMS products</title>
			<link>http://www.tmworld.com/article/366378-PXI_system_tests_MEMS_products.php?rssid=20422</link>
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			<pubDate>Sun, 01 Nov 2009 05:00:00 GMT</pubDate>
			<description>Senior engineer Robert Whitehouse provided details on Analog Devices' PXI-based system for...</description>
		</item>
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			<title>LTX-Credence touts production-test architecture, chip firms report success with NI characterization tools</title>
			<link>http://www.tmworld.com/article/366918-LTX_Credence_touts_production_test_architecture_chip_firms_report_success_with_NI_characterization_tools.php?rssid=20422</link>
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			<pubDate>Fri, 30 Oct 2009 14:47:57 GMT</pubDate>
			<description>Semiconductor test has been grabbing the attention of test vendors on divergent sides of the...</description>
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			<title>VarioTAP in-system emulation technology supports Freescale PowerQUICC III processors</title>
			<link>http://www.tmworld.com/article/366864-VarioTAP_in_system_emulation_technology_supports_Freescale_PowerQUICC_III_processors.php?rssid=20422</link>
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			<pubDate>Thu, 29 Oct 2009 19:42:39 GMT</pubDate>
			<description>Goepel electronic has announced the development of a model library based on Goepel's VarioTAP...</description>
		</item>
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			<title>Measurement Computing updates graphical programming environment</title>
			<link>http://www.tmworld.com/article/366316-Measurement_Computing_updates_graphical_programming_environment.php?rssid=20422</link>
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			<pubDate>Mon, 26 Oct 2009 11:00:00 GMT</pubDate>
			<description>DASYLab 11, Measurement Computing's latest graphical programming environment for test and...</description>
		</item>
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			<title>APT adds Ethernet interface to programmable AC power sources</title>
			<link>http://www.tmworld.com/article/366320-APT_adds_Ethernet_interface_to_programmable_AC_power_sources.php?rssid=20422</link>
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			<pubDate>Mon, 26 Oct 2009 11:00:00 GMT</pubDate>
			<description>An Ethernet interface joins the RS-232 and GPIB automation interfaces available for Associated...</description>
		</item>
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			<title>Sunstone offers online PCB fabrication and assembly ordering</title>
			<link>http://www.tmworld.com/article/365530-Sunstone_offers_online_PCB_fabrication_and_assembly_ordering.php?rssid=20422</link>
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			<pubDate>Wed, 21 Oct 2009 11:00:00 GMT</pubDate>
			<description>Users of Sunstone's PCBexpress quick-turn or full-feature services can now take advantage of...</description>
		</item>
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			<title>Rudolph receives order for multiple backend-inspection systems</title>
			<link>http://www.tmworld.com/article/365514-Rudolph_receives_order_for_multiple_backend_inspection_systems.php?rssid=20422</link>
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			<pubDate>Mon, 19 Oct 2009 11:00:00 GMT</pubDate>
			<description>Rudolph Technologies announced that Advanced Semiconductor Engineering has ordered a number of...</description>
		</item>
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			<title>Verigy and ISE Labs collaborate on memory</title>
			<link>http://www.tmworld.com/article/358218-Verigy_and_ISE_Labs_collaborate_on_memory.php?rssid=20422</link>
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			<pubDate>Thu, 15 Oct 2009 14:58:23 GMT</pubDate>
			<description>Verigy has announced that ISE Labs has expanded its test capabilities with the addition of...</description>
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			<title>Teradyne partners with Teseda to provide scan diagnosis tool</title>
			<link>http://www.tmworld.com/article/358213-Teradyne_partners_with_Teseda_to_provide_scan_diagnosis_tool.php?rssid=20422</link>
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			<pubDate>Thu, 15 Oct 2009 14:52:44 GMT</pubDate>
			<description>Teradyne has announced the signing of an exclusive development agreement with Teseda to produce...</description>
		</item>
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			<title>B&amp;K Precision DC supplies employ linear regulation</title>
			<link>http://www.tmworld.com/article/357873-B_K_Precision_DC_supplies_employ_linear_regulation.php?rssid=20422</link>
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			<pubDate>Tue, 13 Oct 2009 15:17:14 GMT</pubDate>
			<description>The 9150 series of single-output DC power supplies from B&amp;K Precision offers varying voltage and...</description>
		</item>
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			<title>Express Manufacturing joins Corelis' partner program</title>
			<link>http://www.tmworld.com/article/357867-Express_Manufacturing_joins_Corelis_partner_program.php?rssid=20422</link>
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			<pubDate>Tue, 13 Oct 2009 15:03:10 GMT</pubDate>
			<description>Corelis announced that EMS (electronics manufacturing services) provider Express Manufacturing...</description>
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			<title>Data I/O unveils faster memory-programming technology</title>
			<link>http://www.tmworld.com/article/357863-Data_I_O_unveils_faster_memory_programming_technology.php?rssid=20422</link>
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			<pubDate>Tue, 13 Oct 2009 14:36:30 GMT</pubDate>
			<description>Data I/O claims that its new FlashCORE III programming architecture offers significant...</description>
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			<title>QuadTech announces new president</title>
			<link>http://www.tmworld.com/article/357348-QuadTech_announces_new_president.php?rssid=20422</link>
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			<pubDate>Thu, 08 Oct 2009 18:34:36 GMT</pubDate>
			<description>QuadTech, a leading provider of power sources and electrical safety test and passive component...</description>
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			<title>ITC 2009: BIST to give way to built-in self-everything as 3-D chips emerge</title>
			<link>http://www.tmworld.com/article/357284-ITC_2009_BIST_to_give_way_to_built_in_self_everything_as_3_D_chips_emerge.php?rssid=20422</link>
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			<pubDate>Thu, 08 Oct 2009 16:59:07 GMT</pubDate>
			<description>Are fundamental changes needed in test? That's a question sure to stir controversy at the 40th...</description>
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			<title>Microstar's 4-channel board samples simultaneously</title>
			<link>http://www.tmworld.com/article/356831-Microstar_s_4_channel_board_samples_simultaneously.php?rssid=20422</link>
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			<pubDate>Mon, 05 Oct 2009 19:03:57 GMT</pubDate>
			<description>A four-channel SI (signal interface) module from Microstar Laboratories, the MSXB 082, protects...</description>
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			<title>Sefelec rounds out family of safety test instruments</title>
			<link>http://www.tmworld.com/article/356823-Sefelec_rounds_out_family_of_safety_test_instruments.php?rssid=20422</link>
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			<pubDate>Mon, 05 Oct 2009 18:50:53 GMT</pubDate>
			<description>Global Test Solutions and Sefelec announced the completion of the XS series of safety test...</description>
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			<title>JTAG launches PCIe version of boundary-scan controller</title>
			<link>http://www.tmworld.com/article/356804-JTAG_launches_PCIe_version_of_boundary_scan_controller.php?rssid=20422</link>
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			<pubDate>Mon, 05 Oct 2009 17:17:47 GMT</pubDate>
			<description>Extending its line of IEEE 1149.1 boundary-scan controllers, JTAG Technologies offers the...</description>
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			<title>Rebound ahead for semiconductor test (continued)</title>
			<link>http://www.tmworld.com/article/355722-Rebound_ahead_for_semiconductor_test_continued_.php?rssid=20422</link>
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			<pubDate>Thu, 01 Oct 2009 14:53:00 GMT</pubDate>
			<description>A continuation of our interview with R. Keith Lee, President and CEO of Advantest America, which...</description>
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			<title>Testing the tester components</title>
			<link>http://www.tmworld.com/article/355832-Testing_the_tester_components.php?rssid=20422</link>
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			<pubDate>Thu, 01 Oct 2009 06:00:00 GMT</pubDate>
			<description>Engineers at Peregrine Semiconductor have developed unique measurement approaches to test the...</description>
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			<title>Stand-alone vision systems get simpler</title>
			<link>http://www.tmworld.com/article/355820-Stand_alone_vision_systems_get_simpler.php?rssid=20422</link>
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			<pubDate>Thu, 01 Oct 2009 06:00:00 GMT</pubDate>
			<description>Joshua Jelonek from Keyence comments on how stand-alone machine-vision systems are changing to...</description>
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			<title>Vision system enables zero defects</title>
			<link>http://www.tmworld.com/article/355822-Vision_system_enables_zero_defects.php?rssid=20422</link>
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			<pubDate>Thu, 01 Oct 2009 06:00:00 GMT</pubDate>
			<description>Cognex and Esox helped Schneider Electric develop a vision system that has enabled the company...</description>
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			<title>Characterizing noise in voltage-reference ICs</title>
			<link>http://www.tmworld.com/article/355848-Characterizing_noise_in_voltage_reference_ICs.php?rssid=20422</link>
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			<pubDate>Thu, 01 Oct 2009 06:00:00 GMT</pubDate>
			<description>Reference voltages have decreased with the continuing drop in system power-supply voltages,...</description>
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			<title>Rebound ahead for semiconductor test</title>
			<link>http://www.tmworld.com/article/355821-Rebound_ahead_for_semiconductor_test.php?rssid=20422</link>
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			<pubDate>Thu, 01 Oct 2009 06:00:00 GMT</pubDate>
			<description>R. Keith Lee, President and CEO of Advantest America, discusses new technologies for...</description>
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			<title>OKi's modular rework system boosts productivity</title>
			<link>http://www.tmworld.com/article/355807-OKi_s_modular_rework_system_boosts_productivity.php?rssid=20422</link>
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			<pubDate>Tue, 29 Sep 2009 18:26:21 GMT</pubDate>
			<description>OK International claims that by integrating a number of rework technologies, the MRS-1000...</description>
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			<title>Call for nominations for T&amp;MW's annual awards</title>
			<link>http://www.tmworld.com/article/355649-Call_for_nominations_for_T_MW_s_annual_awards.php?rssid=20422</link>
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			<pubDate>Mon, 28 Sep 2009 19:34:53 GMT</pubDate>
			<description>The editors of Test &amp; Measurement World are now seeking nominations for the 2010 Best in Test...</description>
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			<title>Corelis broadens processor support for functional test</title>
			<link>http://www.tmworld.com/article/354719-Corelis_broadens_processor_support_for_functional_test.php?rssid=20422</link>
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			<pubDate>Mon, 21 Sep 2009 15:38:00 GMT</pubDate>
			<description>The latest update to the Corelis ScanExpress JET library has pushed processor support to over...</description>
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			<title>LeCroy introduces high-bandwidth differential probes</title>
			<link>http://www.tmworld.com/article/339982-LeCroy_introduces_high_bandwidth_differential_probes.php?rssid=20422</link>
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			<pubDate>Sat, 12 Sep 2009 13:00:00 GMT</pubDate>
			<description>WaveLink differential solder-in probes provide superior rise time performance with very low...</description>
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			<title>Agilent differential probes enable floating-signal measurements</title>
			<link>http://www.tmworld.com/article/339964-Agilent_differential_probes_enable_floating_signal_measurements.php?rssid=20422</link>
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			<pubDate>Wed, 09 Sep 2009 13:00:00 GMT</pubDate>
			<description>Agilent Technologies offers two high-voltage differential probes that allow the company's...</description>
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			<title>Grieve streamlines testing with two-zone, top-loading oven</title>
			<link>http://www.tmworld.com/article/338998-Grieve_streamlines_testing_with_two_zone_top_loading_oven.php?rssid=20422</link>
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			<pubDate>Wed, 02 Sep 2009 13:00:00 GMT</pubDate>
			<description>The No. 1012 oven from Grieve features two zones, each 96 in. wide by 12 in. deep by 12 in....</description>
		</item>
										<item>
			<title>Production test evolves with PXI</title>
			<link>http://www.tmworld.com/article/328847-Production_test_evolves_with_PXI.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/328847-Production_test_evolves_with_PXI.php?rssid=20422</guid>
			<pubDate>Tue, 01 Sep 2009 06:00:00 GMT</pubDate>
			<description>In a recent interview, Mike Dewey of Geotest discussed the collaboration of JTAG's boundary-scan...</description>
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			<title>CAST supports cooperation among ATE firms</title>
			<link>http://www.tmworld.com/article/328876-CAST_supports_cooperation_among_ATE_firms.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/328876-CAST_supports_cooperation_among_ATE_firms.php?rssid=20422</guid>
			<pubDate>Tue, 01 Sep 2009 06:00:00 GMT</pubDate>
			<description>Despite economic pressure, semiconductor test firms remain committed to R&amp;D, according to...</description>
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			<title>Test system upgrades can expose problems</title>
			<link>http://www.tmworld.com/article/328877-Test_system_upgrades_can_expose_problems.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/328877-Test_system_upgrades_can_expose_problems.php?rssid=20422</guid>
			<pubDate>Tue, 01 Sep 2009 06:00:00 GMT</pubDate>
			<description>When you upgrade a legacy test system, be prepared to uncover new problems or to revisit...</description>
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										<item>
			<title>Daat's thermal analysis software slashes modeling time</title>
			<link>http://www.tmworld.com/article/338988-Daat_s_thermal_analysis_software_slashes_modeling_time.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/338988-Daat_s_thermal_analysis_software_slashes_modeling_time.php?rssid=20422</guid>
			<pubDate>Mon, 31 Aug 2009 13:00:00 GMT</pubDate>
			<description>Version 9 of Coolit thermal and flow analysis software from Daat Research allows you to build...</description>
		</item>
										<item>
			<title>Vicor 28-V wide-input DC/DC converters squeeze into ¼-brick package</title>
			<link>http://www.tmworld.com/article/338997-Vicor_28_V_wide_input_DC_DC_converters_squeeze_into_brick_package.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/338997-Vicor_28_V_wide_input_DC_DC_converters_squeeze_into_brick_package.php?rssid=20422</guid>
			<pubDate>Mon, 31 Aug 2009 13:00:00 GMT</pubDate>
			<description>The 28-V Wide-Input Micro family of DC/DC converters from Vicor offers output power of up to...</description>
		</item>
										<item>
			<title>Digital Power's ATCA power system delivers up to 1500 W</title>
			<link>http://www.tmworld.com/article/338994-Digital_Power_s_ATCA_power_system_delivers_up_to_1500_W.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/338994-Digital_Power_s_ATCA_power_system_delivers_up_to_1500_W.php?rssid=20422</guid>
			<pubDate>Mon, 31 Aug 2009 13:00:00 GMT</pubDate>
			<description>The ATCA power system accommodates universal AC input, ranging from 85 VAC to 264 VAC, with...</description>
		</item>
										<item>
			<title>Agilent Technologies launches Medalist i3070 Series 5 in-circuit test series</title>
			<link>http://www.tmworld.com/article/338777-Agilent_Technologies_launches_Medalist_i3070_Series_5_in_circuit_test_series.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/338777-Agilent_Technologies_launches_Medalist_i3070_Series_5_in_circuit_test_series.php?rssid=20422</guid>
			<pubDate>Fri, 28 Aug 2009 18:21:00 GMT</pubDate>
			<description>Agilent Technologies has introduced the Medalist i3070 Series 5 in-circuit test (ICT) platform,...</description>
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										<item>
			<title>Johnstech releases Low-Force XL test contacts for NiPdAu-plated IC packages</title>
			<link>http://www.tmworld.com/article/328221-Johnstech_releases_Low_Force_XL_test_contacts_for_NiPdAu_plated_IC_packages.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/328221-Johnstech_releases_Low_Force_XL_test_contacts_for_NiPdAu_plated_IC_packages.php?rssid=20422</guid>
			<pubDate>Fri, 21 Aug 2009 18:52:00 GMT</pubDate>
			<description>Johnstech International has announced the release of its new Low-Force XL contacts for Pad...</description>
		</item>
										<item>
			<title>Aries adds new CSP test socket with adjustable pressure pad</title>
			<link>http://www.tmworld.com/article/328217-Aries_adds_new_CSP_test_socket_with_adjustable_pressure_pad.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/328217-Aries_adds_new_CSP_test_socket_with_adjustable_pressure_pad.php?rssid=20422</guid>
			<pubDate>Fri, 21 Aug 2009 18:28:00 GMT</pubDate>
			<description>Aries Electronics has expanded its line of CSP (chip scale package) and MicroBGA (ball grid...</description>
		</item>
										<item>
			<title>Sonoscan performs effective acoustic imaging of stacked die</title>
			<link>http://www.tmworld.com/article/327702-Sonoscan_performs_effective_acoustic_imaging_of_stacked_die.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/327702-Sonoscan_performs_effective_acoustic_imaging_of_stacked_die.php?rssid=20422</guid>
			<pubDate>Wed, 19 Aug 2009 13:00:00 GMT</pubDate>
			<description>SonoLab Division now offers a new service that employs Sonoscan's proprietary software to image...</description>
		</item>
										<item>
			<title>Data Translation's acquisition board supplies 32 isolated channels</title>
			<link>http://www.tmworld.com/article/327699-Data_Translation_s_acquisition_board_supplies_32_isolated_channels.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/327699-Data_Translation_s_acquisition_board_supplies_32_isolated_channels.php?rssid=20422</guid>
			<pubDate>Wed, 19 Aug 2009 13:00:00 GMT</pubDate>
			<description>The DT9818-32-OEM gives users the ability to embed up to 32 analog-input channels into their...</description>
		</item>
										<item>
			<title>Mentor Graphics acquires LogicVision</title>
			<link>http://www.tmworld.com/article/327959-Mentor_Graphics_acquires_LogicVision.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/327959-Mentor_Graphics_acquires_LogicVision.php?rssid=20422</guid>
			<pubDate>Wed, 19 Aug 2009 12:07:00 GMT</pubDate>
			<description>Mentor Graphics and LogicVision have announced that LogicVision stockholders have voted to...</description>
		</item>
										<item>
			<title>Seica's breakout box identifies faults in the field</title>
			<link>http://www.tmworld.com/article/327704-Seica_s_breakout_box_identifies_faults_in_the_field.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/327704-Seica_s_breakout_box_identifies_faults_in_the_field.php?rssid=20422</guid>
			<pubDate>Tue, 18 Aug 2009 13:00:00 GMT</pubDate>
			<description>Seica offers the PTE-100 portable breakout box for performing functional testing and...</description>
		</item>
										<item>
			<title>Corelis extends ScanDIMM family to include DDR3 support</title>
			<link>http://www.tmworld.com/article/327556-Corelis_extends_ScanDIMM_family_to_include_DDR3_support.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/327556-Corelis_extends_ScanDIMM_family_to_include_DDR3_support.php?rssid=20422</guid>
			<pubDate>Thu, 13 Aug 2009 19:22:00 GMT</pubDate>
			<description>Corelis has released two DDR3 ScanDIMM modules that provide interconnect testability for DDR3...</description>
		</item>
										<item>
			<title>Fulitech joins Goepel technology partner program</title>
			<link>http://www.tmworld.com/article/327355-Fulitech_joins_Goepel_technology_partner_program.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/327355-Fulitech_joins_Goepel_technology_partner_program.php?rssid=20422</guid>
			<pubDate>Wed, 12 Aug 2009 12:11:00 GMT</pubDate>
			<description>Goepel Electronic has announced the incorporation of Fulitech, based in Shenzhen, China, into...</description>
		</item>
										<item>
			<title>Emulation Technology's test clips work with popular probes</title>
			<link>http://www.tmworld.com/article/327005-Emulation_Technology_s_test_clips_work_with_popular_probes.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/327005-Emulation_Technology_s_test_clips_work_with_popular_probes.php?rssid=20422</guid>
			<pubDate>Tue, 11 Aug 2009 13:00:00 GMT</pubDate>
			<description>High-speed microgrippers from Emulation Technology allow direct connection between Agilent and...</description>
		</item>
										<item>
			<title>NI VeriStand 2009 test and simulation software debuts at NIWeek</title>
			<link>http://www.tmworld.com/article/327020-NI_VeriStand_2009_test_and_simulation_software_debuts_at_NIWeek.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/327020-NI_VeriStand_2009_test_and_simulation_software_debuts_at_NIWeek.php?rssid=20422</guid>
			<pubDate>Mon, 10 Aug 2009 15:13:00 GMT</pubDate>
			<description>National Instruments at NIWeek announced NI VeriStand 2009, an open, configuration-based...</description>
		</item>
										<item>
			<title>Suss adds 1MX technology to |Z| Probe line</title>
			<link>http://www.tmworld.com/article/326979-Suss_adds_1MX_technology_to_Z_Probe_line.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/326979-Suss_adds_1MX_technology_to_Z_Probe_line.php?rssid=20422</guid>
			<pubDate>Mon, 10 Aug 2009 10:56:00 GMT</pubDate>
			<description>Suss MicroTec has announced its new 1MX probe technology, which enhances the company's |Z| Probe...</description>
		</item>
										<item>
			<title>Corelis launches Solution Partner Program</title>
			<link>http://www.tmworld.com/article/326382-Corelis_launches_Solution_Partner_Program.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/326382-Corelis_launches_Solution_Partner_Program.php?rssid=20422</guid>
			<pubDate>Fri, 07 Aug 2009 13:00:00 GMT</pubDate>
			<description>The Solution Partner Program establishes direct communication with Corelis' customers to openly...</description>
		</item>
										<item>
			<title>Goepel model library expands support for Infineon and ARM CPUs</title>
			<link>http://www.tmworld.com/article/326271-Goepel_model_library_expands_support_for_Infineon_and_ARM_CPUs.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/326271-Goepel_model_library_expands_support_for_Infineon_and_ARM_CPUs.php?rssid=20422</guid>
			<pubDate>Tue, 04 Aug 2009 13:00:00 GMT</pubDate>
			<description>Goepel electronic recently developed model libraries for both Infineon XC16x processors and ARM...</description>
		</item>
										<item>
			<title>Micro Control's burn-in system tests logic and memory devices</title>
			<link>http://www.tmworld.com/article/326275-Micro_Control_s_burn_in_system_tests_logic_and_memory_devices.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/326275-Micro_Control_s_burn_in_system_tests_logic_and_memory_devices.php?rssid=20422</guid>
			<pubDate>Mon, 03 Aug 2009 13:00:00 GMT</pubDate>
			<description>Able to accommodate as many as 64 burn-in boards, the LC-2 from Micro Control provides burn-in...</description>
		</item>
										<item>
			<title>RTL approach supports memory BIST and repair insertion</title>
			<link>http://www.tmworld.com/article/321560-RTL_approach_supports_memory_BIST_and_repair_insertion.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321560-RTL_approach_supports_memory_BIST_and_repair_insertion.php?rssid=20422</guid>
			<pubDate>Sat, 01 Aug 2009 06:00:00 GMT</pubDate>
			<description>Traditionally, you would implement MBIST (memory BIST) and repair functionality for SOC...</description>
		</item>
										<item>
			<title>Semicon West: Data suggests semiconductor recovery</title>
			<link>http://www.tmworld.com/article/324114-Semicon_West_Data_suggests_semiconductor_recovery.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324114-Semicon_West_Data_suggests_semiconductor_recovery.php?rssid=20422</guid>
			<pubDate>Sat, 01 Aug 2009 06:00:00 GMT</pubDate>
			<description>Semicon West 2009 wrapped up with mixed messages on the economic prospects for the semiconductor...</description>
		</item>
										<item>
			<title>Testing right from the start</title>
			<link>http://www.tmworld.com/article/325740-Testing_right_from_the_start.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/325740-Testing_right_from_the_start.php?rssid=20422</guid>
			<pubDate>Sat, 01 Aug 2009 06:00:00 GMT</pubDate>
			<description>To make sure all of their billions of bits of data reach their destinations, Internet service...</description>
		</item>
										<item>
			<title>Analyzing prober defects in-line</title>
			<link>http://www.tmworld.com/article/325999-Analyzing_prober_defects_in_line.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/325999-Analyzing_prober_defects_in_line.php?rssid=20422</guid>
			<pubDate>Sat, 01 Aug 2009 06:00:00 GMT</pubDate>
			<description>The reduction in the size of bond pads used as contacts during electrical testing has prompted...</description>
		</item>
										<item>
			<title>Teaming up on design and test</title>
			<link>http://www.tmworld.com/article/324054-Teaming_up_on_design_and_test.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324054-Teaming_up_on_design_and_test.php?rssid=20422</guid>
			<pubDate>Sat, 01 Aug 2009 06:00:00 GMT</pubDate>
			<description>Powerful high-level software tools give domain experts in such diverse fields as aerospace...</description>
		</item>
										<item>
			<title>Seeking growth in embedded instrumentation</title>
			<link>http://www.tmworld.com/article/326000-Seeking_growth_in_embedded_instrumentation.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/326000-Seeking_growth_in_embedded_instrumentation.php?rssid=20422</guid>
			<pubDate>Fri, 31 Jul 2009 06:00:00 GMT</pubDate>
			<description>Tim Dehne, until recently a longtime executive with National Instruments where he held positions...</description>
		</item>
										<item>
			<title>Advantest's T5385 DRAM wafer test system offers 768-DUT parallel test capacity</title>
			<link>http://www.tmworld.com/article/326002-Advantest_s_T5385_DRAM_wafer_test_system_offers_768_DUT_parallel_test_capacity.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/326002-Advantest_s_T5385_DRAM_wafer_test_system_offers_768_DUT_parallel_test_capacity.php?rssid=20422</guid>
			<pubDate>Thu, 30 Jul 2009 13:37:00 GMT</pubDate>
			<description>The Advantest T5385 memory test system for DRAM wafer test offers a parallel test capability of...</description>
		</item>
										<item>
			<title>Keithley adds 6x16 matrix card to switch/multimeter line</title>
			<link>http://www.tmworld.com/article/319920-Keithley_adds_6x16_matrix_card_to_switch_multimeter_line.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/319920-Keithley_adds_6x16_matrix_card_to_switch_multimeter_line.php?rssid=20422</guid>
			<pubDate>Thu, 30 Jul 2009 13:00:00 GMT</pubDate>
			<description>The latest addition to Keithley Instrument's plug-in switch and control cards is a two-pole...</description>
		</item>
										<item>
			<title>Decoupling network meets IEC and ANSI specs</title>
			<link>http://www.tmworld.com/article/326001-Decoupling_network_meets_IEC_and_ANSI_specs.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/326001-Decoupling_network_meets_IEC_and_ANSI_specs.php?rssid=20422</guid>
			<pubDate>Wed, 29 Jul 2009 17:48:00 GMT</pubDate>
			<description>The CDN 3083-S100M portable coupling/decoupling network from Teseq lets you test power supplies,...</description>
		</item>
										<item>
			<title>Agilent releases application notes on DC power products</title>
			<link>http://www.tmworld.com/article/318720-Agilent_releases_application_notes_on_DC_power_products.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/318720-Agilent_releases_application_notes_on_DC_power_products.php?rssid=20422</guid>
			<pubDate>Wed, 29 Jul 2009 13:00:00 GMT</pubDate>
			<description>Agilent Technologies offers a free series of power-supply hints and tips, application notes, and...</description>
		</item>
										<item>
			<title>Semicon West: What leading vendors predict</title>
			<link>http://www.tmworld.com/article/320438-Semicon_West_What_leading_vendors_predict.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/320438-Semicon_West_What_leading_vendors_predict.php?rssid=20422</guid>
			<pubDate>Tue, 28 Jul 2009 15:00:00 GMT</pubDate>
			<description>During the Executive Test Summit, held during Semicon West 2009, executives from LTX-Credence,...</description>
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										<item>
			<title>Gore rolls out low-profile copper cable for QSFP assemblies</title>
			<link>http://www.tmworld.com/article/320501-Gore_rolls_out_low_profile_copper_cable_for_QSFP_assemblies.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/320501-Gore_rolls_out_low_profile_copper_cable_for_QSFP_assemblies.php?rssid=20422</guid>
			<pubDate>Tue, 28 Jul 2009 13:00:00 GMT</pubDate>
			<description>W.L. Gore &amp; Associates announced the general availability of a very-low-profile QSFP...</description>
		</item>
										<item>
			<title>Gamma Scientific's light source is spectrally programmable</title>
			<link>http://www.tmworld.com/article/324526-Gamma_Scientific_s_light_source_is_spectrally_programmable.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324526-Gamma_Scientific_s_light_source_is_spectrally_programmable.php?rssid=20422</guid>
			<pubDate>Mon, 27 Jul 2009 13:00:00 GMT</pubDate>
			<description>The RS-5H digital light source from Gamma Scientific is a high-power, color-tunable system that...</description>
		</item>
										<item>
			<title>Semicon West Wrap-up: Market expectations; products on exhibit</title>
			<link>http://www.tmworld.com/article/320478-Semicon_West_Wrap_up_Market_expectations_products_on_exhibit.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/320478-Semicon_West_Wrap_up_Market_expectations_products_on_exhibit.php?rssid=20422</guid>
			<pubDate>Wed, 22 Jul 2009 15:05:00 GMT</pubDate>
			<description>Semicon West 2009 offered mixed messages on the economic prospects for the semiconductor...</description>
		</item>
										<item>
			<title>Aeroflex debuts multi UE test capability</title>
			<link>http://www.tmworld.com/article/323011-Aeroflex_debuts_multi_UE_test_capability.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/323011-Aeroflex_debuts_multi_UE_test_capability.php?rssid=20422</guid>
			<pubDate>Tue, 21 Jul 2009 19:21:00 GMT</pubDate>
			<description>Aeroflex has announced the TM500 TD-LTE Multi-UE, which adds multiple-handset (multi-UE) testing...</description>
		</item>
										<item>
			<title>Semicon West: Teradyne touts RF market share, displays Eagle Test systems</title>
			<link>http://www.tmworld.com/article/325887-Semicon_West_Teradyne_touts_RF_market_share_displays_Eagle_Test_systems.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/325887-Semicon_West_Teradyne_touts_RF_market_share_displays_Eagle_Test_systems.php?rssid=20422</guid>
			<pubDate>Thu, 16 Jul 2009 15:30:00 GMT</pubDate>
			<description>Teradyne's wireless device test instruments, the Gen4 Microwave and UltraWave 12G, handle test...</description>
		</item>
										<item>
			<title>Agilent probe positioners allow hands-free probing</title>
			<link>http://www.tmworld.com/article/321136-Agilent_probe_positioners_allow_hands_free_probing.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321136-Agilent_probe_positioners_allow_hands_free_probing.php?rssid=20422</guid>
			<pubDate>Thu, 16 Jul 2009 13:00:00 GMT</pubDate>
			<description>Agilent Technologies has introduced four new oscilloscope probe...</description>
		</item>
										<item>
			<title>Snaptron station tests force displacement of tactile switches</title>
			<link>http://www.tmworld.com/article/321130-Snaptron_station_tests_force_displacement_of_tactile_switches.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321130-Snaptron_station_tests_force_displacement_of_tactile_switches.php?rssid=20422</guid>
			<pubDate>Wed, 15 Jul 2009 13:00:00 GMT</pubDate>
			<description>The TruTac force-displacement test station from Snaptron performs accurate, repeatable force...</description>
		</item>
										<item>
			<title>QuadTech upgrades safety-test-automation software</title>
			<link>http://www.tmworld.com/article/321431-QuadTech_upgrades_safety_test_automation_software.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321431-QuadTech_upgrades_safety_test_automation_software.php?rssid=20422</guid>
			<pubDate>Wed, 15 Jul 2009 13:00:00 GMT</pubDate>
			<description>CaptivATE 3.3, the latest version of QuadTech's automation software for its electrical safety...</description>
		</item>
										<item>
			<title>Semicon West: Industry takes aim at 22-nm interconnect stack</title>
			<link>http://www.tmworld.com/article/324279-Semicon_West_Industry_takes_aim_at_22_nm_interconnect_stack.php?rssid=20422</link>
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			<pubDate>Tue, 14 Jul 2009 21:51:00 GMT</pubDate>
			<description>Ron Wilson of EDN reports that researchers are discovering that 22 nm may be beyond the end of...</description>
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			<title>Pintail offers free test-time optimization program</title>
			<link>http://www.tmworld.com/article/318074-Pintail_offers_free_test_time_optimization_program.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/318074-Pintail_offers_free_test_time_optimization_program.php?rssid=20422</guid>
			<pubDate>Tue, 14 Jul 2009 13:00:00 GMT</pubDate>
			<description>TestVision/6 is a set of analytical tools that enables users to analyze historical test-data...</description>
		</item>
										<item>
			<title>Spectronics' UV lamp delivers high intensity</title>
			<link>http://www.tmworld.com/article/319489-Spectronics_UV_lamp_delivers_high_intensity.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/319489-Spectronics_UV_lamp_delivers_high_intensity.php?rssid=20422</guid>
			<pubDate>Tue, 14 Jul 2009 13:00:00 GMT</pubDate>
			<description>Spectronics claims that its recently improved Spectroline BIB-150P UV lamp is one of the highest...</description>
		</item>
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			<title>Polatis unveils low-loss all-optical switch</title>
			<link>http://www.tmworld.com/article/324360-Polatis_unveils_low_loss_all_optical_switch.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324360-Polatis_unveils_low_loss_all_optical_switch.php?rssid=20422</guid>
			<pubDate>Mon, 13 Jul 2009 13:00:00 GMT</pubDate>
			<description>Polatis announced the availability of its 2000i instrumentation-grade all-optical switch as part...</description>
		</item>
										<item>
			<title>Basler starts production of Aviator area-scan cameras</title>
			<link>http://www.tmworld.com/article/321261-Basler_starts_production_of_Aviator_area_scan_cameras.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321261-Basler_starts_production_of_Aviator_area_scan_cameras.php?rssid=20422</guid>
			<pubDate>Fri, 10 Jul 2009 13:44:00 GMT</pubDate>
			<description>Progressive-scan readout and global shutter technology combined with a Camera Link data...</description>
		</item>
										<item>
			<title>Semicon West to feature Executive Test Summit</title>
			<link>http://www.tmworld.com/article/320141-Semicon_West_to_feature_Executive_Test_Summit.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/320141-Semicon_West_to_feature_Executive_Test_Summit.php?rssid=20422</guid>
			<pubDate>Fri, 10 Jul 2009 13:10:00 GMT</pubDate>
			<description>During the July 14 event, four industry leaders will discuss how economic challenges threaten...</description>
		</item>
										<item>
			<title>Switch card handles I-V testing</title>
			<link>http://www.tmworld.com/article/322613-Switch_card_handles_I_V_testing.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/322613-Switch_card_handles_I_V_testing.php?rssid=20422</guid>
			<pubDate>Thu, 09 Jul 2009 15:06:00 GMT</pubDate>
			<description>Keithley Instruments has added the Model 3731 switch-matrix card to its Series 3700...</description>
		</item>
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			<title>Verigy introduces V101 zero-footprint tester for cost-sensitive ICs</title>
			<link>http://www.tmworld.com/article/318267-Verigy_introduces_V101_zero_footprint_tester_for_cost_sensitive_ICs.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/318267-Verigy_introduces_V101_zero_footprint_tester_for_cost_sensitive_ICs.php?rssid=20422</guid>
			<pubDate>Wed, 08 Jul 2009 13:42:00 GMT</pubDate>
			<description>Verigy has introduced the V101 zero-footprint, 100-MHz system for wafer sort and final test of...</description>
		</item>
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			<title>Empirix launches custom quality-assurance test platform</title>
			<link>http://www.tmworld.com/article/322492-Empirix_launches_custom_quality_assurance_test_platform.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/322492-Empirix_launches_custom_quality_assurance_test_platform.php?rssid=20422</guid>
			<pubDate>Tue, 07 Jul 2009 13:00:00 GMT</pubDate>
			<description>Empirix Testing as a Service is a quality-assurance solution for business-critical contact...</description>
		</item>
										<item>
			<title>Corelis unveils stand-alone in-system programming bundles</title>
			<link>http://www.tmworld.com/article/317373-Corelis_unveils_stand_alone_in_system_programming_bundles.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/317373-Corelis_unveils_stand_alone_in_system_programming_bundles.php?rssid=20422</guid>
			<pubDate>Mon, 06 Jul 2009 19:31:00 GMT</pubDate>
			<description>Corelis has announced the availability of two new product bundles for stand-alone in-system...</description>
		</item>
										<item>
			<title>Saelig offers network-oriented development cards</title>
			<link>http://www.tmworld.com/article/319382-Saelig_offers_network_oriented_development_cards.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/319382-Saelig_offers_network_oriented_development_cards.php?rssid=20422</guid>
			<pubDate>Mon, 06 Jul 2009 13:00:00 GMT</pubDate>
			<description>Aimed to provide design shortcuts in embedded and networked applications, the ARM7-based Model...</description>
		</item>
										<item>
			<title>Online networking site connects Comsol Multiphysics users</title>
			<link>http://www.tmworld.com/article/324912-Online_networking_site_connects_Comsol_Multiphysics_users.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324912-Online_networking_site_connects_Comsol_Multiphysics_users.php?rssid=20422</guid>
			<pubDate>Mon, 06 Jul 2009 13:00:00 GMT</pubDate>
			<description>Comsol, the maker of Comsol Multiphysics modeling and simulation software, has launched a...</description>
		</item>
										<item>
			<title>Cascade Microtech addresses power semiconductors and RFICs</title>
			<link>http://www.tmworld.com/article/321799-Cascade_Microtech_addresses_power_semiconductors_and_RFICs.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321799-Cascade_Microtech_addresses_power_semiconductors_and_RFICs.php?rssid=20422</guid>
			<pubDate>Thu, 02 Jul 2009 11:58:00 GMT</pubDate>
			<description>Cascade debuted probes that make Tesla compatible with the Agilent B1505A, and it introduced 60-...</description>
		</item>
										<item>
			<title>NI introduces PXI modules and chassis for automated test</title>
			<link>http://www.tmworld.com/article/324045-NI_introduces_PXI_modules_and_chassis_for_automated_test.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324045-NI_introduces_PXI_modules_and_chassis_for_automated_test.php?rssid=20422</guid>
			<pubDate>Wed, 01 Jul 2009 19:30:00 GMT</pubDate>
			<description>The NI PXIe-6544/45 digital waveform generator/analyzers, which support clock rates of up to...</description>
		</item>
										<item>
			<title>Verigy introduces redundancy analysis option for its V6000 WS memory test system</title>
			<link>http://www.tmworld.com/article/325161-Verigy_introduces_redundancy_analysis_option_for_its_V6000_WS_memory_test_system.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/325161-Verigy_introduces_redundancy_analysis_option_for_its_V6000_WS_memory_test_system.php?rssid=20422</guid>
			<pubDate>Wed, 01 Jul 2009 12:43:00 GMT</pubDate>
			<description>Verigy has introduced SmartRA (Scalable Memory Redundancy Technology), a memory redundancy...</description>
		</item>
										<item>
			<title>ATE/DFT/BIST: 2009 Buyer's Guide</title>
			<link>http://www.tmworld.com/article/318612-ATE_DFT_BIST_2009_Buyer_s_Guide.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/318612-ATE_DFT_BIST_2009_Buyer_s_Guide.php?rssid=20422</guid>
			<pubDate>Wed, 01 Jul 2009 06:00:00 GMT</pubDate>
			<description>Use our updated buyer's guide to find the products you...</description>
		</item>
										<item>
			<title>Electrical &amp; Physical Environmental Test: 2009 Buyer's Guide</title>
			<link>http://www.tmworld.com/article/320580-Electrical_Physical_Environmental_Test_2009_Buyer_s_Guide.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/320580-Electrical_Physical_Environmental_Test_2009_Buyer_s_Guide.php?rssid=20422</guid>
			<pubDate>Wed, 01 Jul 2009 06:00:00 GMT</pubDate>
			<description>Use our updated buyer's guide to find the products you...</description>
		</item>
										<item>
			<title>2009 Tops in Test: Weathering the storm</title>
			<link>http://www.tmworld.com/article/321582-2009_Tops_in_Test_Weathering_the_storm.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321582-2009_Tops_in_Test_Weathering_the_storm.php?rssid=20422</guid>
			<pubDate>Wed, 01 Jul 2009 06:00:00 GMT</pubDate>
			<description>The electronics test industry started 2008 battling very choppy business seas and ended it...</description>
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										<item>
			<title>2009 Buyer's Guide</title>
			<link>http://www.tmworld.com/article/323181-2009_Buyer_s_Guide.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/323181-2009_Buyer_s_Guide.php?rssid=20422</guid>
			<pubDate>Wed, 01 Jul 2009 06:00:00 GMT</pubDate>
			<description>Our 2009 Buyer's Guide contains more than 60 product and service categories, divided into five...</description>
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										<item>
			<title>When robots meet vision</title>
			<link>http://www.tmworld.com/article/325338-When_robots_meet_vision.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/325338-When_robots_meet_vision.php?rssid=20422</guid>
			<pubDate>Wed, 01 Jul 2009 06:00:00 GMT</pubDate>
			<description>Adding machine vision to a production process presents a challenge to most engineers, but what...</description>
		</item>
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			<title>Design and test firms address microwave challenges</title>
			<link>http://www.tmworld.com/article/325570-Design_and_test_firms_address_microwave_challenges.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/325570-Design_and_test_firms_address_microwave_challenges.php?rssid=20422</guid>
			<pubDate>Wed, 01 Jul 2009 06:00:00 GMT</pubDate>
			<description>Exhibits at 2009 IEEE MTT-S International Microwave Symposium ran the gamut from design and...</description>
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										<item>
			<title>System Cascon expands support for TI's IEEE 1149.1 TAP transceiver</title>
			<link>http://www.tmworld.com/article/323221-System_Cascon_expands_support_for_TI_s_IEEE_1149_1_TAP_transceiver.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/323221-System_Cascon_expands_support_for_TI_s_IEEE_1149_1_TAP_transceiver.php?rssid=20422</guid>
			<pubDate>Tue, 30 Jun 2009 19:23:00 GMT</pubDate>
			<description>Goepel electronic has announced the development of a ScanRouter functional library within its...</description>
		</item>
										<item>
			<title>Agilent's mini passive probes cover DC to 1.5 GHz</title>
			<link>http://www.tmworld.com/article/324635-Agilent_s_mini_passive_probes_cover_DC_to_1_5_GHz.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324635-Agilent_s_mini_passive_probes_cover_DC_to_1_5_GHz.php?rssid=20422</guid>
			<pubDate>Tue, 30 Jun 2009 13:00:00 GMT</pubDate>
			<description>The N2870A series of miniature passive oscilloscope probes and accessories from Agilent...</description>
		</item>
										<item>
			<title>BPM introduces BPWin Version 5.0</title>
			<link>http://www.tmworld.com/article/324261-BPM_introduces_BPWin_Version_5_0.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324261-BPM_introduces_BPWin_Version_5_0.php?rssid=20422</guid>
			<pubDate>Fri, 26 Jun 2009 11:50:00 GMT</pubDate>
			<description>BPM Microsystems has introduced its BPWin 5.0 software platform. Enhancements include an IP...</description>
		</item>
										<item>
			<title>Verigy accelerates yield learning on V93000 test platform</title>
			<link>http://www.tmworld.com/article/321630-Verigy_accelerates_yield_learning_on_V93000_test_platform.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321630-Verigy_accelerates_yield_learning_on_V93000_test_platform.php?rssid=20422</guid>
			<pubDate>Wed, 24 Jun 2009 12:44:00 GMT</pubDate>
			<description>Verigy has introduced its Yield Learning Solution, which integrates on-tester, real-time capture...</description>
		</item>
										<item>
			<title>Goepel's System Cascon now features automatic program generator</title>
			<link>http://www.tmworld.com/article/325627-Goepel_s_System_Cascon_now_features_automatic_program_generator.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/325627-Goepel_s_System_Cascon_now_features_automatic_program_generator.php?rssid=20422</guid>
			<pubDate>Tue, 23 Jun 2009 11:45:00 GMT</pubDate>
			<description>Goepel electronic has introduced a fully automatic program generator specifically for the...</description>
		</item>
										<item>
			<title>Geotest teams up with JTAG Technologies on functional, structural test</title>
			<link>http://www.tmworld.com/article/325066-Geotest_teams_up_with_JTAG_Technologies_on_functional_structural_test.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/325066-Geotest_teams_up_with_JTAG_Technologies_on_functional_structural_test.php?rssid=20422</guid>
			<pubDate>Tue, 23 Jun 2009 11:43:00 GMT</pubDate>
			<description>Geotest-Marvin Test Systems and JTAG Technologies have announced a new technology partnership...</description>
		</item>
										<item>
			<title>Dage Precision relocates UK headquarters to larger facility</title>
			<link>http://www.tmworld.com/article/318750-Dage_Precision_relocates_UK_headquarters_to_larger_facility.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/318750-Dage_Precision_relocates_UK_headquarters_to_larger_facility.php?rssid=20422</guid>
			<pubDate>Thu, 18 Jun 2009 13:00:00 GMT</pubDate>
			<description>Spanning over 36,000 square feet, the new building includes a state-of-the-art production area,...</description>
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										<item>
			<title>Tektronix scope software debugs DDR3 memory designs</title>
			<link>http://www.tmworld.com/article/318969-Tektronix_scope_software_debugs_DDR3_memory_designs.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/318969-Tektronix_scope_software_debugs_DDR3_memory_designs.php?rssid=20422</guid>
			<pubDate>Tue, 16 Jun 2009 13:00:00 GMT</pubDate>
			<description>Tektronix announced the third-generation of its DDR analysis software for the DPO/DSA70000B...</description>
		</item>
										<item>
			<title>Microscan miniature imager reads direct part marks</title>
			<link>http://www.tmworld.com/article/320955-Microscan_miniature_imager_reads_direct_part_marks.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/320955-Microscan_miniature_imager_reads_direct_part_marks.php?rssid=20422</guid>
			<pubDate>Tue, 16 Jun 2009 13:00:00 GMT</pubDate>
			<description>The MINI Hawk from Microscan packs DPM reading algorithms into a miniature imager for use in...</description>
		</item>
										<item>
			<title>Elma upgrades rack-mount/desktop enclosure</title>
			<link>http://www.tmworld.com/article/324444-Elma_upgrades_rack_mount_desktop_enclosure.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324444-Elma_upgrades_rack_mount_desktop_enclosure.php?rssid=20422</guid>
			<pubDate>Tue, 16 Jun 2009 13:00:00 GMT</pubDate>
			<description>Elma Electronic has upgraded its Type 15 StyleBox enclosure with several key features, including...</description>
		</item>
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			<title>Universal boundary-scan production tester integrates test electronics in fixture</title>
			<link>http://www.tmworld.com/article/320588-Universal_boundary_scan_production_tester_integrates_test_electronics_in_fixture.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/320588-Universal_boundary_scan_production_tester_integrates_test_electronics_in_fixture.php?rssid=20422</guid>
			<pubDate>Mon, 15 Jun 2009 17:33:00 GMT</pubDate>
			<description>Goepel electronic has introduced its Juliet (JTAG UnLimItEd Tester) family of integrated...</description>
		</item>
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			<title>Anritsu debuts VNAs and power sensors at IMS</title>
			<link>http://www.tmworld.com/article/318780-Anritsu_debuts_VNAs_and_power_sensors_at_IMS.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/318780-Anritsu_debuts_VNAs_and_power_sensors_at_IMS.php?rssid=20422</guid>
			<pubDate>Sun, 14 Jun 2009 21:29:00 GMT</pubDate>
			<description>Anritsu at IMS 2009 expanded VectorStar VNA coverage to 110 GHz, introduced 4-port VectorStar...</description>
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			<title>Aeroflex expands PXI platform with high-power signal generators for RF component test</title>
			<link>http://www.tmworld.com/article/317964-Aeroflex_expands_PXI_platform_with_high_power_signal_generators_for_RF_component_test.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/317964-Aeroflex_expands_PXI_platform_with_high_power_signal_generators_for_RF_component_test.php?rssid=20422</guid>
			<pubDate>Sun, 14 Jun 2009 20:14:00 GMT</pubDate>
			<description>Aeroflex at IMS 2009 announced it has expanded its PXI test platform with the addition of two...</description>
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										<item>
			<title>Rohde &amp; Schwarz demos coherent-source, nonstandard-OFDM, and group-delay measurements; touts AWR link</title>
			<link>http://www.tmworld.com/article/324991-Rohde_Schwarz_demos_coherent_source_nonstandard_OFDM_and_group_delay_measurements_touts_AWR_link.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324991-Rohde_Schwarz_demos_coherent_source_nonstandard_OFDM_and_group_delay_measurements_touts_AWR_link.php?rssid=20422</guid>
			<pubDate>Sun, 14 Jun 2009 19:33:00 GMT</pubDate>
			<description>Rohde &amp; Schwarz demonstrated the use of coherent sources to make balanced device measurements,...</description>
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			<title>Noisecom, Rohde &amp; Schwarz demo 60-GHz noise-figure measurement at IMS</title>
			<link>http://www.tmworld.com/article/318120-Noisecom_Rohde_Schwarz_demo_60_GHz_noise_figure_measurement_at_IMS.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/318120-Noisecom_Rohde_Schwarz_demo_60_GHz_noise_figure_measurement_at_IMS.php?rssid=20422</guid>
			<pubDate>Fri, 12 Jun 2009 18:41:00 GMT</pubDate>
			<description>Noise figure measurements at 60 GHz were the focus of joint effort by Rohde &amp; Schwarz and...</description>
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										<item>
			<title>B&amp;K Precision expands lineup of triple-output DC supplies</title>
			<link>http://www.tmworld.com/article/320437-B_K_Precision_expands_lineup_of_triple_output_DC_supplies.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/320437-B_K_Precision_expands_lineup_of_triple_output_DC_supplies.php?rssid=20422</guid>
			<pubDate>Fri, 12 Jun 2009 13:00:00 GMT</pubDate>
			<description>Each output of the Model 1762 triple-output DC power supply is fully floating, and outputs can...</description>
		</item>
										<item>
			<title>Keyence microscope enables high-speed motion analysis</title>
			<link>http://www.tmworld.com/article/322762-Keyence_microscope_enables_high_speed_motion_analysis.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/322762-Keyence_microscope_enables_high_speed_motion_analysis.php?rssid=20422</guid>
			<pubDate>Tue, 09 Jun 2009 13:00:00 GMT</pubDate>
			<description>Used for R&amp;D on the factory floor or on a production line, the VW-6000 portable motion-analysis...</description>
		</item>
										<item>
			<title>Spire to Use Rudolph’s software in its turnkey solar-cell lines</title>
			<link>http://www.tmworld.com/article/323170-Spire_to_Use_Rudolph_s_software_in_its_turnkey_solar_cell_lines.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/323170-Spire_to_Use_Rudolph_s_software_in_its_turnkey_solar_cell_lines.php?rssid=20422</guid>
			<pubDate>Thu, 04 Jun 2009 16:07:00 GMT</pubDate>
			<description>Spire and Rudolph Technologies have announced they have reached an agreement to include...</description>
		</item>
										<item>
			<title>Chroma increases power of AC sources to 54 kW</title>
			<link>http://www.tmworld.com/article/322664-Chroma_increases_power_of_AC_sources_to_54_kW.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/322664-Chroma_increases_power_of_AC_sources_to_54_kW.php?rssid=20422</guid>
			<pubDate>Tue, 02 Jun 2009 13:00:00 GMT</pubDate>
			<description>To meet the increasing demand for high power in ATE and bench applications, Chroma has added two...</description>
		</item>
										<item>
			<title>Dynalab releases wire-harness test software</title>
			<link>http://www.tmworld.com/article/322793-Dynalab_releases_wire_harness_test_software.php?rssid=20422</link>
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			<pubDate>Tue, 02 Jun 2009 13:00:00 GMT</pubDate>
			<description>NX View software for Dynalab's NX series of wire-harness testers aims to increase operator...</description>
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			<title>IFSA releases evaluation board for sensor-system development</title>
			<link>http://www.tmworld.com/article/325098-IFSA_releases_evaluation_board_for_sensor_system_development.php?rssid=20422</link>
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			<pubDate>Tue, 02 Jun 2009 13:00:00 GMT</pubDate>
			<description>Canadian manufacturer OPTYS and the worldwide organization IFSA announced the joint development...</description>
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			<title>VTI's VXI modules enable customization of ATE systems</title>
			<link>http://www.tmworld.com/article/319065-VTI_s_VXI_modules_enable_customization_of_ATE_systems.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/319065-VTI_s_VXI_modules_enable_customization_of_ATE_systems.php?rssid=20422</guid>
			<pubDate>Mon, 01 Jun 2009 13:00:00 GMT</pubDate>
			<description>Three modules join the SMIP series of signal switch modules from VTI Instruments, offering...</description>
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			<title>Small-delay-defect testing</title>
			<link>http://www.tmworld.com/article/320469-Small_delay_defect_testing.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/320469-Small_delay_defect_testing.php?rssid=20422</guid>
			<pubDate>Mon, 01 Jun 2009 06:00:00 GMT</pubDate>
			<description>Although TD ATPG improves defect coverage beyond the levels that stuck-at patterns alone can...</description>
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			<title>Consolidation: the buzzword in the chip ATE market</title>
			<link>http://www.tmworld.com/article/321132-Consolidation_the_buzzword_in_the_chip_ATE_market.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321132-Consolidation_the_buzzword_in_the_chip_ATE_market.php?rssid=20422</guid>
			<pubDate>Mon, 01 Jun 2009 06:00:00 GMT</pubDate>
			<description>After several mergers and acquisitions in recent years, the semiconductor ATE market now is...</description>
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			<title>Tools to tackle costs and complexity</title>
			<link>http://www.tmworld.com/article/322325-Tools_to_tackle_costs_and_complexity.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/322325-Tools_to_tackle_costs_and_complexity.php?rssid=20422</guid>
			<pubDate>Mon, 01 Jun 2009 06:00:00 GMT</pubDate>
			<description>In a recent interview, Richard House of VI Technology discussed the role of engineering services...</description>
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			<title>Tools to tackle costs and complexity (continued)</title>
			<link>http://www.tmworld.com/article/324768-Tools_to_tackle_costs_and_complexity_continued_.php?rssid=20422</link>
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			<pubDate>Mon, 01 Jun 2009 06:00:00 GMT</pubDate>
			<description>A continuation of our interview with Richard House, VP of Operations-ATE for VI...</description>
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			<title>The philosophy of jitter</title>
			<link>http://www.tmworld.com/article/322832-The_philosophy_of_jitter.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/322832-The_philosophy_of_jitter.php?rssid=20422</guid>
			<pubDate>Mon, 01 Jun 2009 06:00:00 GMT</pubDate>
			<description>When Altera began developing its 40-nm Stratix IV FPGA, the company’s engineers faced daunting...</description>
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			<title>Advantest’s new DDR3 memory-test configuration offers 256-DUT parallel test capacity</title>
			<link>http://www.tmworld.com/article/323667-Advantest_s_new_DDR3_memory_test_configuration_offers_256_DUT_parallel_test_capacity.php?rssid=20422</link>
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			<pubDate>Fri, 29 May 2009 19:35:00 GMT</pubDate>
			<description>Advantest has announced availability of an expanded configuration of its T5503 memory test...</description>
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			<title>Verigy announces financial results for second quarter 2009</title>
			<link>http://www.tmworld.com/article/318832-Verigy_announces_financial_results_for_second_quarter_2009.php?rssid=20422</link>
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			<pubDate>Fri, 22 May 2009 12:23:00 GMT</pubDate>
			<description>Revenue for the second quarter was $71 million, an increase of $3 million, or 4 percent, from...</description>
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			<title>iSYSTEM and Goepel to cooperate on test</title>
			<link>http://www.tmworld.com/article/325888-iSYSTEM_and_Goepel_to_cooperate_on_test.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/325888-iSYSTEM_and_Goepel_to_cooperate_on_test.php?rssid=20422</guid>
			<pubDate>Tue, 19 May 2009 13:11:00 GMT</pubDate>
			<description>iSYSTEM and Goepel electronic will leverage their respective support for boundary-scan test and...</description>
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			<title>Stellar rolls out pressure transducers for OEMs</title>
			<link>http://www.tmworld.com/article/317342-Stellar_rolls_out_pressure_transducers_for_OEMs.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/317342-Stellar_rolls_out_pressure_transducers_for_OEMs.php?rssid=20422</guid>
			<pubDate>Tue, 19 May 2009 13:00:00 GMT</pubDate>
			<description>Stellar Technology claims that its GT34XX series of compact pressure transducers offers...</description>
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			<title>Analog Devices introduces inertial sensors for embedded designs</title>
			<link>http://www.tmworld.com/article/318296-Analog_Devices_introduces_inertial_sensors_for_embedded_designs.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/318296-Analog_Devices_introduces_inertial_sensors_for_embedded_designs.php?rssid=20422</guid>
			<pubDate>Mon, 18 May 2009 13:00:00 GMT</pubDate>
			<description>Expanding its iSensor intelligent sensor product family, Analog Devices has added two highly...</description>
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			<title>Aerospace company selects SigmaQuest SigmaSure</title>
			<link>http://www.tmworld.com/article/321869-Aerospace_company_selects_SigmaQuest_SigmaSure.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321869-Aerospace_company_selects_SigmaQuest_SigmaSure.php?rssid=20422</guid>
			<pubDate>Wed, 13 May 2009 17:54:00 GMT</pubDate>
			<description>SigmaQuest has announced that a Fortune 500 defense and aerospace company based in the eastern...</description>
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			<title>Asset ScanWorks platform supports validation and test for Intel Xeon processor 5500 series</title>
			<link>http://www.tmworld.com/article/320710-Asset_ScanWorks_platform_supports_validation_and_test_for_Intel_Xeon_processor_5500_series.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/320710-Asset_ScanWorks_platform_supports_validation_and_test_for_Intel_Xeon_processor_5500_series.php?rssid=20422</guid>
			<pubDate>Thu, 07 May 2009 16:41:00 GMT</pubDate>
			<description>Asset InterTech’s ScanWorks platform for embedded instrumentation now supports both...</description>
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			<title>Mentor Graphics and LogicVision sign merger agreement</title>
			<link>http://www.tmworld.com/article/320840-Mentor_Graphics_and_LogicVision_sign_merger_agreement.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/320840-Mentor_Graphics_and_LogicVision_sign_merger_agreement.php?rssid=20422</guid>
			<pubDate>Thu, 07 May 2009 11:16:00 GMT</pubDate>
			<description>Mentor Graphics and LogicVision have announced that the two companies have signed a definitive...</description>
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			<title>Integrated flow speeds power-amplifier-module design</title>
			<link>http://www.tmworld.com/article/319258-Integrated_flow_speeds_power_amplifier_module_design.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/319258-Integrated_flow_speeds_power_amplifier_module_design.php?rssid=20422</guid>
			<pubDate>Tue, 05 May 2009 16:06:00 GMT</pubDate>
			<description>Agilent Technologies has announced an expansion of the use of its Advanced Design System (ADS)...</description>
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			<title>Goepel teams with Testonica to extend JTAG/boundary scan</title>
			<link>http://www.tmworld.com/article/321022-Goepel_teams_with_Testonica_to_extend_JTAG_boundary_scan.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321022-Goepel_teams_with_Testonica_to_extend_JTAG_boundary_scan.php?rssid=20422</guid>
			<pubDate>Mon, 04 May 2009 13:00:00 GMT</pubDate>
			<description>Goepel electronic, a developer of IEEE 1149.x products, has announced that Testonica Lab has...</description>
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			<title>APEX: Panelists tout test and inspection</title>
			<link>http://www.tmworld.com/article/319080-APEX_Panelists_tout_test_and_inspection.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/319080-APEX_Panelists_tout_test_and_inspection.php?rssid=20422</guid>
			<pubDate>Fri, 01 May 2009 06:00:00 GMT</pubDate>
			<description>Industry executives scrutinized the evolving role of PCB (printed-circuit board) test and...</description>
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			<title>Going beyond design for test</title>
			<link>http://www.tmworld.com/article/323363-Going_beyond_design_for_test.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/323363-Going_beyond_design_for_test.php?rssid=20422</guid>
			<pubDate>Fri, 01 May 2009 06:00:00 GMT</pubDate>
			<description>In an exclusive interview, Joeseph Sawicki, VP and General Manager, Design-to-Silicon Division...</description>
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			<title>Going beyond design for test (continued)</title>
			<link>http://www.tmworld.com/article/324273-Going_beyond_design_for_test_continued_.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324273-Going_beyond_design_for_test_continued_.php?rssid=20422</guid>
			<pubDate>Fri, 01 May 2009 06:00:00 GMT</pubDate>
			<description>A continuation of our interview with Joeseph Sawicki, VP and General Manager, Design-to-Silicon...</description>
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			<title>VTI Instruments offers LXI switch/measure brochure</title>
			<link>http://www.tmworld.com/article/321697-VTI_Instruments_offers_LXI_switch_measure_brochure.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321697-VTI_Instruments_offers_LXI_switch_measure_brochure.php?rssid=20422</guid>
			<pubDate>Wed, 29 Apr 2009 13:00:00 GMT</pubDate>
			<description>VTI Instruments' new brochure provides a comprehensive overview of the latest LXI Class A...</description>
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			<title>Koh Young's system combines 3-D measurement with 2-D AOI</title>
			<link>http://www.tmworld.com/article/322642-Koh_Young_s_system_combines_3_D_measurement_with_2_D_AOI.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/322642-Koh_Young_s_system_combines_3_D_measurement_with_2_D_AOI.php?rssid=20422</guid>
			<pubDate>Tue, 28 Apr 2009 13:00:00 GMT</pubDate>
			<description>In addition to offering full 2-D AOI, the Zenith system leverages 3-D inspection technology that...</description>
		</item>
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			<title>Keyence rolls out high-speed multi-camera vision system</title>
			<link>http://www.tmworld.com/article/324179-Keyence_rolls_out_high_speed_multi_camera_vision_system.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324179-Keyence_rolls_out_high_speed_multi_camera_vision_system.php?rssid=20422</guid>
			<pubDate>Tue, 28 Apr 2009 13:00:00 GMT</pubDate>
			<description>The CV-5000 vision system from Keyence brings high-speed image processing to any production...</description>
		</item>
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			<title>MSR extends multifunctional datalogger's lifetime</title>
			<link>http://www.tmworld.com/article/317504-MSR_extends_multifunctional_datalogger_s_lifetime.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/317504-MSR_extends_multifunctional_datalogger_s_lifetime.php?rssid=20422</guid>
			<pubDate>Mon, 27 Apr 2009 13:15:00 GMT</pubDate>
			<description>Outfitted with a 900-mAh lithium-polymer battery, the MSR145 mini datalogger can measure and...</description>
		</item>
										<item>
			<title>Kreon unveils portable 3-D laser scanner</title>
			<link>http://www.tmworld.com/article/319932-Kreon_unveils_portable_3_D_laser_scanner.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/319932-Kreon_unveils_portable_3_D_laser_scanner.php?rssid=20422</guid>
			<pubDate>Fri, 24 Apr 2009 13:00:00 GMT</pubDate>
			<description>By combining its Solano 3-D laser scanner with the Baces measuring arm, Kreon Technologies is...</description>
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			<title>VTI analyzers leverage Dynamic Measurements’ MIMO software</title>
			<link>http://www.tmworld.com/article/323503-VTI_analyzers_leverage_Dynamic_Measurements_MIMO_software.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/323503-VTI_analyzers_leverage_Dynamic_Measurements_MIMO_software.php?rssid=20422</guid>
			<pubDate>Tue, 21 Apr 2009 13:00:00 GMT</pubDate>
			<description>A new software release from Dynamic Measurements’ enhances the modal testing capabilities of...</description>
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			<title>A2LA to accredit environmental test labs for DoD</title>
			<link>http://www.tmworld.com/article/322102-A2LA_to_accredit_environmental_test_labs_for_DoD.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/322102-A2LA_to_accredit_environmental_test_labs_for_DoD.php?rssid=20422</guid>
			<pubDate>Mon, 20 Apr 2009 13:00:00 GMT</pubDate>
			<description>The American Association for Laboratory Accreditation announced the expansion of its laboratory...</description>
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			<title>Bronkhorst rolls out miniature Coriolis flow meter</title>
			<link>http://www.tmworld.com/article/320675-Bronkhorst_rolls_out_miniature_Coriolis_flow_meter.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/320675-Bronkhorst_rolls_out_miniature_Coriolis_flow_meter.php?rssid=20422</guid>
			<pubDate>Thu, 16 Apr 2009 13:00:00 GMT</pubDate>
			<description>Bronkhorst Cori-Tech has released a new model in its series of Coriolis mass flow meters and...</description>
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										<item>
			<title>Agilent Technologies, Maury Microwave support nonlinear component measurement and simulation</title>
			<link>http://www.tmworld.com/article/319353-Agilent_Technologies_Maury_Microwave_support_nonlinear_component_measurement_and_simulation.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/319353-Agilent_Technologies_Maury_Microwave_support_nonlinear_component_measurement_and_simulation.php?rssid=20422</guid>
			<pubDate>Thu, 16 Apr 2009 11:55:00 GMT</pubDate>
			<description>Agilent Technologies has introduced for its PNA-X nonlinear vector network analyzer an arbitrary...</description>
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			<title>Symmetricom time code displays can be seen from 125 ft</title>
			<link>http://www.tmworld.com/article/321229-Symmetricom_time_code_displays_can_be_seen_from_125_ft.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321229-Symmetricom_time_code_displays_can_be_seen_from_125_ft.php?rssid=20422</guid>
			<pubDate>Wed, 15 Apr 2009 13:00:00 GMT</pubDate>
			<description>Intended to synchronize to time-code signals, the TCD-2 and TCD-4 time-code displays from...</description>
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										<item>
			<title>APEX highlights test and inspection suites and systems</title>
			<link>http://www.tmworld.com/article/325811-APEX_highlights_test_and_inspection_suites_and_systems.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/325811-APEX_highlights_test_and_inspection_suites_and_systems.php?rssid=20422</guid>
			<pubDate>Tue, 07 Apr 2009 15:40:00 GMT</pubDate>
			<description>The IPC APEX Expo, held March 31-April 2, 2009, in Las Vegas, gave exhibitors the opportunity to...</description>
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										<item>
			<title>Industry experts discuss the future of test at APEX’s Test and Inspection Summit</title>
			<link>http://www.tmworld.com/article/318215-Industry_experts_discuss_the_future_of_test_at_APEX_s_Test_and_Inspection_Summit.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/318215-Industry_experts_discuss_the_future_of_test_at_APEX_s_Test_and_Inspection_Summit.php?rssid=20422</guid>
			<pubDate>Mon, 06 Apr 2009 17:12:00 GMT</pubDate>
			<description>This year’s test summit discussed how to deal with emerging technologies, and concluded that...</description>
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			<title>Keithley white paper covers semiconductor characterization</title>
			<link>http://www.tmworld.com/article/321290-Keithley_white_paper_covers_semiconductor_characterization.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321290-Keithley_white_paper_covers_semiconductor_characterization.php?rssid=20422</guid>
			<pubDate>Mon, 06 Apr 2009 13:00:00 GMT</pubDate>
			<description>Keithley Instruments has published a white paper on how semiconductor characterization and...</description>
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										<item>
			<title>Yxlon launches computed tomography scanner</title>
			<link>http://www.tmworld.com/article/317927-Yxlon_launches_computed_tomography_scanner.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/317927-Yxlon_launches_computed_tomography_scanner.php?rssid=20422</guid>
			<pubDate>Fri, 03 Apr 2009 13:00:00 GMT</pubDate>
			<description>The driving force behind the scanner’s capabilities is the coordination of the Yxlon...</description>
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										<item>
			<title>Cognex vision sensor boasts easy setup without a PC</title>
			<link>http://www.tmworld.com/article/322957-Cognex_vision_sensor_boasts_easy_setup_without_a_PC.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/322957-Cognex_vision_sensor_boasts_easy_setup_without_a_PC.php?rssid=20422</guid>
			<pubDate>Thu, 02 Apr 2009 13:00:00 GMT</pubDate>
			<description>Joining the Cognex Checker line of vision sensors is the Checker 3G, a device that does not...</description>
		</item>
										<item>
			<title>E Instruments’ transmitter measures RH and temperature</title>
			<link>http://www.tmworld.com/article/325495-E_Instruments_transmitter_measures_RH_and_temperature.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/325495-E_Instruments_transmitter_measures_RH_and_temperature.php?rssid=20422</guid>
			<pubDate>Thu, 02 Apr 2009 13:00:00 GMT</pubDate>
			<description>You can use the TH200 humidity and temperature transmitter from E Instruments in a variety of...</description>
		</item>
										<item>
			<title>TDK-Lambda AC/DC supplies deliver 40 W to 65 W</title>
			<link>http://www.tmworld.com/article/321925-TDK_Lambda_AC_DC_supplies_deliver_40_W_to_65_W.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321925-TDK_Lambda_AC_DC_supplies_deliver_40_W_to_65_W.php?rssid=20422</guid>
			<pubDate>Wed, 01 Apr 2009 13:00:00 GMT</pubDate>
			<description>The single-output CSS65 series of AC/DC power supplies from TDK-Lambda accepts a wide input...</description>
		</item>
										<item>
			<title>T&amp;MW announces award winners</title>
			<link>http://www.tmworld.com/article/320568-T_MW_announces_award_winners.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/320568-T_MW_announces_award_winners.php?rssid=20422</guid>
			<pubDate>Wed, 01 Apr 2009 06:00:00 GMT</pubDate>
			<description>T&amp;MW presents the winners of our annual Best in Test awards, which recognize important and...</description>
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										<item>
			<title>Thermal imaging finds faults quickly</title>
			<link>http://www.tmworld.com/article/325713-Thermal_imaging_finds_faults_quickly.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/325713-Thermal_imaging_finds_faults_quickly.php?rssid=20422</guid>
			<pubDate>Wed, 01 Apr 2009 06:00:00 GMT</pubDate>
			<description>As chip sizes continue to get smaller, the ability to detect uneven heat generation and thermal...</description>
		</item>
										<item>
			<title>Simulate, emulate, or hope for the best?</title>
			<link>http://www.tmworld.com/article/323119-Simulate_emulate_or_hope_for_the_best_.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/323119-Simulate_emulate_or_hope_for_the_best_.php?rssid=20422</guid>
			<pubDate>Wed, 01 Apr 2009 06:00:00 GMT</pubDate>
			<description>Once upon a time, you verified a logic design for an FPGA (field-programmable gate array) by...</description>
		</item>
										<item>
			<title>A base of innovation for 2009</title>
			<link>http://www.tmworld.com/article/323879-A_base_of_innovation_for_2009.php?rssid=20422</link>
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			<pubDate>Wed, 01 Apr 2009 06:00:00 GMT</pubDate>
			<description>Innovation is proceeding despite the economic downturn. We present some of the fruits of...</description>
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			<title>RF engineers automate tests</title>
			<link>http://www.tmworld.com/article/324463-RF_engineers_automate_tests.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324463-RF_engineers_automate_tests.php?rssid=20422</guid>
			<pubDate>Wed, 01 Apr 2009 06:00:00 GMT</pubDate>
			<description>RF testing for devices such as amplifiers and RFICs can be tedious work. Such devices work over...</description>
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			<title>Alternative circuits</title>
			<link>http://www.tmworld.com/article/324714-Alternative_circuits.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324714-Alternative_circuits.php?rssid=20422</guid>
			<pubDate>Wed, 01 Apr 2009 06:00:00 GMT</pubDate>
			<description>When Dr. Paul Eisler (1907–1995) graduated from the Technical University of Vienna in 1930,...</description>
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			<title>Prism's audio analyzers streamline production line testing</title>
			<link>http://www.tmworld.com/article/317375-Prism_s_audio_analyzers_streamline_production_line_testing.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/317375-Prism_s_audio_analyzers_streamline_production_line_testing.php?rssid=20422</guid>
			<pubDate>Tue, 31 Mar 2009 13:00:00 GMT</pubDate>
			<description>Console manufacturer Soundcraft has acquired a number of dScope Series III units from Prism...</description>
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			<title>MSC 2009: Interest in measurement remains strong</title>
			<link>http://www.tmworld.com/article/317399-MSC_2009_Interest_in_measurement_remains_strong.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/317399-MSC_2009_Interest_in_measurement_remains_strong.php?rssid=20422</guid>
			<pubDate>Fri, 27 Mar 2009 18:42:00 GMT</pubDate>
			<description>"Test and measurement is key to all aspects of commerce in this historic time," stated Richard...</description>
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			<title>Chroma’s programmable DC supply spans 600 W to 5000 W</title>
			<link>http://www.tmworld.com/article/323109-Chroma_s_programmable_DC_supply_spans_600_W_to_5000_W.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/323109-Chroma_s_programmable_DC_supply_spans_600_W_to_5000_W.php?rssid=20422</guid>
			<pubDate>Thu, 26 Mar 2009 13:00:00 GMT</pubDate>
			<description>Offering many advantages for ATE integration and testing, the 62000P Series of programmable DC...</description>
		</item>
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			<title>Bustronic introduces VPX load board</title>
			<link>http://www.tmworld.com/article/319588-Bustronic_introduces_VPX_load_board.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/319588-Bustronic_introduces_VPX_load_board.php?rssid=20422</guid>
			<pubDate>Wed, 25 Mar 2009 13:00:00 GMT</pubDate>
			<description>Elma Bustronic’s 3U VPX load board helps confirm that a chassis meets VITA 46/48 power...</description>
		</item>
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			<title>Giga Solution and Global Unichip launch RF SIP test for mobile TV tuner production</title>
			<link>http://www.tmworld.com/article/323849-Giga_Solution_and_Global_Unichip_launch_RF_SIP_test_for_mobile_TV_tuner_production.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/323849-Giga_Solution_and_Global_Unichip_launch_RF_SIP_test_for_mobile_TV_tuner_production.php?rssid=20422</guid>
			<pubDate>Mon, 23 Mar 2009 16:15:00 GMT</pubDate>
			<description>Giga Solution Tech, a test-service corporation focusing on RFIC/SIP/SOC test area, and Global...</description>
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			<title>Keithley upgrades Model 4200-SCS for solar-cell testing, adds nine-slot chassis support and cable kit</title>
			<link>http://www.tmworld.com/article/319309-Keithley_upgrades_Model_4200_SCS_for_solar_cell_testing_adds_nine_slot_chassis_support_and_cable_kit.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/319309-Keithley_upgrades_Model_4200_SCS_for_solar_cell_testing_adds_nine_slot_chassis_support_and_cable_kit.php?rssid=20422</guid>
			<pubDate>Mon, 23 Mar 2009 12:33:00 GMT</pubDate>
			<description>Keithley Instruments has introduced a variety of hardware, firmware, and software enhancements...</description>
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			<title>Johnstech releases test contactor for RF/microwave devices</title>
			<link>http://www.tmworld.com/article/320235-Johnstech_releases_test_contactor_for_RF_microwave_devices.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/320235-Johnstech_releases_test_contactor_for_RF_microwave_devices.php?rssid=20422</guid>
			<pubDate>Fri, 20 Mar 2009 15:18:00 GMT</pubDate>
			<description>Johnstech International has announced the release of its Pad ROL100A Series test contactor for...</description>
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			<title>XJTAG unveils XJFlash to speed flash programming</title>
			<link>http://www.tmworld.com/article/325484-XJTAG_unveils_XJFlash_to_speed_flash_programming.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/325484-XJTAG_unveils_XJFlash_to_speed_flash_programming.php?rssid=20422</guid>
			<pubDate>Thu, 19 Mar 2009 14:08:00 GMT</pubDate>
			<description>XJTAG said it has significantly improved the flash-programming speed of its XJTAG boundary-scan...</description>
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			<title>Sunstone partners on PCB initiatives</title>
			<link>http://www.tmworld.com/article/319484-Sunstone_partners_on_PCB_initiatives.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/319484-Sunstone_partners_on_PCB_initiatives.php?rssid=20422</guid>
			<pubDate>Thu, 19 Mar 2009 13:51:00 GMT</pubDate>
			<description>Sunstone Circuits is working with NXP, Digi-Key, and National Instruments to facilitate...</description>
		</item>
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			<title>Darnell identifies AC-DC growth opportunities in 2009</title>
			<link>http://www.tmworld.com/article/318378-Darnell_identifies_AC_DC_growth_opportunities_in_2009.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/318378-Darnell_identifies_AC_DC_growth_opportunities_in_2009.php?rssid=20422</guid>
			<pubDate>Thu, 19 Mar 2009 13:00:00 GMT</pubDate>
			<description>Fueled by the emergence of LED SSL (solid-state lighting) as a major application area, the...</description>
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			<title>Quadtech rolls out AC/DC programmable power sources</title>
			<link>http://www.tmworld.com/article/325631-Quadtech_rolls_out_AC_DC_programmable_power_sources.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/325631-Quadtech_rolls_out_AC_DC_programmable_power_sources.php?rssid=20422</guid>
			<pubDate>Thu, 19 Mar 2009 13:00:00 GMT</pubDate>
			<description>To better assist customers with their testing needs, QuadTech has launched three new series of...</description>
		</item>
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			<title>Industrial group releases nanoETXexpress 1.0 specification</title>
			<link>http://www.tmworld.com/article/318944-Industrial_group_releases_nanoETXexpress_1_0_specification.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/318944-Industrial_group_releases_nanoETXexpress_1_0_specification.php?rssid=20422</guid>
			<pubDate>Wed, 18 Mar 2009 13:00:00 GMT</pubDate>
			<description>The group will present the small nanoETXexpress form factor to the PICMG consortium for...</description>
		</item>
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			<title>Agilent to collaborate with Aster on test-coverage analysis</title>
			<link>http://www.tmworld.com/article/318027-Agilent_to_collaborate_with_Aster_on_test_coverage_analysis.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/318027-Agilent_to_collaborate_with_Aster_on_test_coverage_analysis.php?rssid=20422</guid>
			<pubDate>Wed, 18 Mar 2009 11:35:00 GMT</pubDate>
			<description>Agilent Technologies has announced a strategic partnership with Aster Technologies to enable...</description>
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			<title>Spreadtrum selects Verigy V93000 to test mobile digital TV devices</title>
			<link>http://www.tmworld.com/article/324304-Spreadtrum_selects_Verigy_V93000_to_test_mobile_digital_TV_devices.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324304-Spreadtrum_selects_Verigy_V93000_to_test_mobile_digital_TV_devices.php?rssid=20422</guid>
			<pubDate>Wed, 18 Mar 2009 11:32:00 GMT</pubDate>
			<description>Verigy has announced that Spreadtrum Communications selected the V93000 system for production...</description>
		</item>
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			<title>Endevco releases sensor resource guide</title>
			<link>http://www.tmworld.com/article/317108-Endevco_releases_sensor_resource_guide.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/317108-Endevco_releases_sensor_resource_guide.php?rssid=20422</guid>
			<pubDate>Tue, 17 Mar 2009 13:00:00 GMT</pubDate>
			<description>The 2009 Endevco Product Catalog and Measurement Resource publication is a complete guide to...</description>
		</item>
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			<title>Teradyne unveils ETS-88 at Semicon China</title>
			<link>http://www.tmworld.com/article/323434-Teradyne_unveils_ETS_88_at_Semicon_China.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/323434-Teradyne_unveils_ETS_88_at_Semicon_China.php?rssid=20422</guid>
			<pubDate>Tue, 17 Mar 2009 12:18:00 GMT</pubDate>
			<description>The ETS-88 test system from Teradyne's Eagle Test business unit can simultaneously run multiple...</description>
		</item>
										<item>
			<title>Vicor puts power tutorial series on DVD</title>
			<link>http://www.tmworld.com/article/323493-Vicor_puts_power_tutorial_series_on_DVD.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/323493-Vicor_puts_power_tutorial_series_on_DVD.php?rssid=20422</guid>
			<pubDate>Mon, 16 Mar 2009 21:15:00 GMT</pubDate>
			<description>The Brick Business Unit of Vicor announced its Power Techtorials, a Vicor Power Tutorial Series...</description>
		</item>
										<item>
			<title>Synopsys Yield Explorer supports volume diagnostics analysis</title>
			<link>http://www.tmworld.com/article/321199-Synopsys_Yield_Explorer_supports_volume_diagnostics_analysis.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321199-Synopsys_Yield_Explorer_supports_volume_diagnostics_analysis.php?rssid=20422</guid>
			<pubDate>Mon, 16 Mar 2009 12:31:00 GMT</pubDate>
			<description>Synopsys has introduced Yield Explorer, a yield-management product that expedites the discovery...</description>
		</item>
										<item>
			<title>Kaman unveils multipurpose noncontact displacement sensor</title>
			<link>http://www.tmworld.com/article/318929-Kaman_unveils_multipurpose_noncontact_displacement_sensor.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/318929-Kaman_unveils_multipurpose_noncontact_displacement_sensor.php?rssid=20422</guid>
			<pubDate>Thu, 12 Mar 2009 13:00:00 GMT</pubDate>
			<description>Based on balanced bridge eddy current technology, the KD-2306 noncontact linear displacement...</description>
		</item>
										<item>
			<title>Averna test software allows automatic remote updates</title>
			<link>http://www.tmworld.com/article/324172-Averna_test_software_allows_automatic_remote_updates.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324172-Averna_test_software_allows_automatic_remote_updates.php?rssid=20422</guid>
			<pubDate>Wed, 11 Mar 2009 13:00:00 GMT</pubDate>
			<description>Proligent 4.1, Averna’s test engineering platform, gives OEMs the ability to update remote...</description>
		</item>
										<item>
			<title>Lehighton offers mobility tester for semiconductor wafers</title>
			<link>http://www.tmworld.com/article/324663-Lehighton_offers_mobility_tester_for_semiconductor_wafers.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324663-Lehighton_offers_mobility_tester_for_semiconductor_wafers.php?rssid=20422</guid>
			<pubDate>Wed, 11 Mar 2009 13:00:00 GMT</pubDate>
			<description>The LEI 1605 mobility tester from Lehighton Electronics manually measures electron mobility...</description>
		</item>
										<item>
			<title>Modelithics expands passive component library</title>
			<link>http://www.tmworld.com/article/320772-Modelithics_expands_passive_component_library.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/320772-Modelithics_expands_passive_component_library.php?rssid=20422</guid>
			<pubDate>Tue, 10 Mar 2009 13:00:00 GMT</pubDate>
			<description>Modelithics has released an enhanced version of its CLR Library, significantly increasing the...</description>
		</item>
										<item>
			<title>Wolfram offers consulting services to tweak productivity</title>
			<link>http://www.tmworld.com/article/324942-Wolfram_offers_consulting_services_to_tweak_productivity.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324942-Wolfram_offers_consulting_services_to_tweak_productivity.php?rssid=20422</guid>
			<pubDate>Tue, 10 Mar 2009 13:00:00 GMT</pubDate>
			<description>Wolfram Research, announced the broad availability of its consulting service Wolfram Solutions,...</description>
		</item>
										<item>
			<title>The RFIC evaluator</title>
			<link>http://www.tmworld.com/article/319172-The_RFIC_evaluator.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/319172-The_RFIC_evaluator.php?rssid=20422</guid>
			<pubDate>Sun, 01 Mar 2009 07:00:00 GMT</pubDate>
			<description>Joe Flynn is a staff engineer at Sequoia Communications, a start-up fabless semiconductor...</description>
		</item>
										<item>
			<title>Testing WiMedia UWB</title>
			<link>http://www.tmworld.com/article/319178-Testing_WiMedia_UWB.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/319178-Testing_WiMedia_UWB.php?rssid=20422</guid>
			<pubDate>Sun, 01 Mar 2009 07:00:00 GMT</pubDate>
			<description>The bandwidths and modulation schemes used in UWB (ultrawideband) present significant test...</description>
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			<title>Board test evolves, APEX panel to elaborate</title>
			<link>http://www.tmworld.com/article/321679-Board_test_evolves_APEX_panel_to_elaborate.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/321679-Board_test_evolves_APEX_panel_to_elaborate.php?rssid=20422</guid>
			<pubDate>Sun, 01 Mar 2009 07:00:00 GMT</pubDate>
			<description>As electronic products become more complex, engineers increasingly need to build in testability...</description>
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			<title>Keithley discontinuing parametric testers, plans more layoffs</title>
			<link>http://www.tmworld.com/article/323001-Keithley_discontinuing_parametric_testers_plans_more_layoffs.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/323001-Keithley_discontinuing_parametric_testers_plans_more_layoffs.php?rssid=20422</guid>
			<pubDate>Thu, 26 Feb 2009 16:30:00 GMT</pubDate>
			<description>The parametric test product line discontinuation and 6% layoff statement comes just days after...</description>
		</item>
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			<title>Zeiss begins low-voltage TEM development project</title>
			<link>http://www.tmworld.com/article/324043-Zeiss_begins_low_voltage_TEM_development_project.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/324043-Zeiss_begins_low_voltage_TEM_development_project.php?rssid=20422</guid>
			<pubDate>Thu, 26 Feb 2009 14:35:00 GMT</pubDate>
			<description>Carl Zeiss SMT has announced that it is embarking on a project in partnership with the...</description>
		</item>
										<item>
			<title>SV Probe’s vertical probe performs high-current/density testing</title>
			<link>http://www.tmworld.com/article/318668-SV_Probe_s_vertical_probe_performs_high_current_density_testing.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/318668-SV_Probe_s_vertical_probe_performs_high_current_density_testing.php?rssid=20422</guid>
			<pubDate>Thu, 26 Feb 2009 14:00:00 GMT</pubDate>
			<description>According to the manufacturer, the PowerPlus uses a probe material that provides a significant...</description>
		</item>
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			<title>PowerGenix selects SigmaQuest tools for green battery manufacturing</title>
			<link>http://www.tmworld.com/article/319910-PowerGenix_selects_SigmaQuest_tools_for_green_battery_manufacturing.php?rssid=20422</link>
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			<pubDate>Mon, 23 Feb 2009 14:00:00 GMT</pubDate>
			<description>SigmaQuest, which specializes in on-demand, scalable software for product quality management, is...</description>
		</item>
										<item>
			<title>Advantech fanless computer suits embedded automation</title>
			<link>http://www.tmworld.com/article/323200-Advantech_fanless_computer_suits_embedded_automation.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/323200-Advantech_fanless_computer_suits_embedded_automation.php?rssid=20422</guid>
			<pubDate>Thu, 19 Feb 2009 14:00:00 GMT</pubDate>
			<description>The Industrial Automation Group of Advantech offers the UNO-3282, an embedded automation...</description>
		</item>
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			<title>IPC’s Schuld to drive assembly-technology standards</title>
			<link>http://www.tmworld.com/article/323597-IPC_s_Schuld_to_drive_assembly_technology_standards.php?rssid=20422</link>
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			<pubDate>Thu, 19 Feb 2009 13:11:00 GMT</pubDate>
			<description>Kevin Schuld will work with standing IPC technical committees to develop standards for the...</description>
		</item>
										<item>
			<title>CableTest temperature probe works with wire analyzer</title>
			<link>http://www.tmworld.com/article/317287-CableTest_temperature_probe_works_with_wire_analyzer.php?rssid=20422</link>
			<guid isPermaLink="true">http://www.tmworld.com/article/317287-CableTest_temperature_probe_works_with_wire_analyzer.php?rssid=20422</guid>
			<pubDate>Wed, 18 Feb 2009 14:00:00 GMT</pubDate>
			<description>CableTest Systems offers a new add-on for its MPT series wiring analyzer: the MPT indoor/outdoor...</description>
		</item>
										<item>
			<title>Corelis unveils entry-level I2C bus analyzer</title>
			<link>http://www.tmworld.com/article/319538-Corelis_unveils_entry_level_I2C_bus_analyzer.php?rssid=20422</link>
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			<pubDate>Wed, 18 Feb 2009 14:00:00 GMT</pubDate>
			<description>In a move to reduce the costs associated with product design, validation, and test, Corelis has...</description>
		</item>
										<item>
			<title>Bustronic adds 16 channels to VPX serial test module</title>
			<link>http://www.tmworld.com/article/319572-Bustronic_adds_16_channels_to_VPX_serial_test_module.php?rssid=20422</link>
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			<pubDate>Wed, 18 Feb 2009 14:00:00 GMT</pubDate>
			<description>Elma Bustronic has announced a 16-channel version of its SERDES (serializer/deserializer) test...</description>
		</item>
										<item>
			<title>Simulator speeds eye measurements</title>
			<link>http://www.tmworld.com/article/322965-Simulator_speeds_eye_measurements.php?rssid=20422</link>
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			<pubDate>Tue, 17 Feb 2009 19:56:00 GMT</pubDate>
			<description>Agilent Technologies has introduced a million-bit-per-minute signal-integrity channel simulator...</description>
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