Test and Measurement World - Resource Center

The DataFlex-1000 High-Speed, High-Capacity Data Recorder with Optional, Built-In Signal Conditioning

Mon, 09 Nov 2009 17:21:27 GMT

The DataFlex-1000 with optional, fully-integrated, software-driven signal conditioning features a space-saving design and full system control, set-up and status via an integrated touch-screen display, making it an ideal choice for laboratory environments.

The DataFlex-1000A Flight-Capable High-Speed, High-Capacity Data Recorder

Mon, 09 Nov 2009 17:19:01 GMT

The new DataFlex-1000A with optional fully-integrated, software-driven signal conditioning features a sleek, portable, rack-mountable design with full system control, set-up and display provided by any PC or laptop, making it ideal for high-vibration environments.

Faster Time to Root Cause with Diagnosis-Driven Yield Analysis

Wed, 04 Nov 2009 16:45:56 GMT

Learn the benefits of implementing a diagnosis-driven yield analysis flow using the Tessent™ Diagnosis and Tessent YieldInsight™ software products. ICs developed at advanced technology nodes of 65 nm and below exhibit an increased sensitivity to small manufacturing variations. New design-specific and feature-sensitive failure mechanisms are on the rise. Without improved yield analysis methods, time-to-volume is delayed, mature yield is suboptimal, and product quality may suffer, thereby threatening a manufacturer’s profitability.

Techniques to Reduce Measurement Errors in Challenging Environments

Fri, 30 Oct 2009 14:58:54 GMT

Data acquisition applications require making sensitive measurements in environments with high noise levels and electrical interference. This paper explores the latest advances in integrated signal conditioning technologies, along with recommended measurement techniques, to maximize overall system-level performance and minimize sources of error.

A Guide to Calibrating Your Spectrum Analyzer

Mon, 19 Oct 2009 18:34:06 GMT

Spectrum analyzers are often perceived as being complex and time-consuming to calibrate. This application note explains why regular calibration is important and summarizes the key steps for calibrating a spectrum analyzer.

Verification of Electrical Safety Testers: A Better Approach

Mon, 19 Oct 2009 18:28:20 GMT

It can be challenging for metrologists to properly verify the performance of electrical testers, especially those with high voltages, high currents and extreme resistance measurement capability. This paper describes some of the requirements to verify the performance of common testers. It also describes an improved method of verifying many of these devices.

Acquisition, Handling and Analysis of Measurement Data in Real Time - with HBM's Genesis HighSpeed

Wed, 14 Oct 2009 19:02:32 GMT

Requirements for data acquisition (DAQ) systems are now far more demanding. Not only are sample rates increasing; the number of channels and the amount of acquired data are also growing. At the same time, the times-per-test are decreasing. This paper describes how to handle and analyze the increasing amount of test data - with the high-end DAQ system Genesis HighSpeed.

What is NI VeriStand?

Wed, 14 Oct 2009 16:11:18 GMT

NI VeriStand is a software environment for configuring real-time testing applications, including hardware-in-the-loop (HIL) tests. Out of the box, NI VeriStand helps you configure a multicore-ready real-time engine to execute tasks that include Analog, digital, communication bus, and field-programmable gate array (FPGA)-based I/O interfaces, triggerable, multifile data logging, real-time stimulus generation , calculated channels, and event alarming and alarm response routines. NI VeriStand is designed to be customized and extended using a variety of software environments, including NI LabVIEW, NI TestStand, Microsoft Visual Studio .NET, C/C++, and Python.

What can I use the PXIe-6544/45 (Digital Waveform Generators/Analyzers) for?

Wed, 14 Oct 2009 16:11:18 GMT

Mobile phones, high-definition televisions, computers, GPS units, and even simple semiconductor devices all require faster and larger amounts of digital data. To address these applications, National Instruments recently released the NI PXIe-6544/45 100/200 MHz high-speed digital input/output devices, which are ideal for faster clock and data-streaming rates. This white paper, explores some of the applications that are possible with the NI PXIe-6544/45; which includes chip testing and multimedia testing and communication.

Understanding Software-Defined Automated Test Systems

Wed, 14 Oct 2009 16:11:18 GMT

Engineers have used software-defined instrumentation to solve demanding automated test and measurement applications for more than 20 years. Its recent widespread adoption is due to the increasing test challenges that are causing engineers to search for a more flexible and modular test solution. View the short webcast to understand the core principles of software-defined instrumentation, what you can do with software-defined instruments, how to implement a modular, software-defined test system architecture.

Embedded JTAG Solutions for ATB Design

Wed, 07 Oct 2009 20:48:14 GMT

Escape Communications asked Flynn Systems to help them tackle the challenge of embedding boundary scan tests into their ATB design through the use of readily available, off-the-shelf firmware in order to minimize customization and engineering development costs. Download this case study and receive a Free 30-Day Boundary Scan/JTAG Software Evaluation.

How to Test MIMO Devices Via Channel Sounding?

Mon, 14 Sep 2009 14:33:44 GMT

Never before has understanding the wireless channel been such an important part of designing wireless systems. Learn the basics of the wireless communication channel, MIMO channel sounding, and channel emulation. Hear about a flexible, cost-effective test system that can be used for performing channel sounding and emulation, and functional testing of MIMO wireless devices. Register today!

How to Create Advanced ATE Systems with LXI: Building on the Industry’s Best Practices

Fri, 11 Sep 2009 17:41:58 GMT

What are the advantages of putting test systems online? What is the difference between LAN (Local Area Network) and LXI (LAN eXtensions for Instrumentation) instruments? How does LXI work with my existing equipment? This webcast will give you an overview of these topics, and more. Moderated by Rick Nelson, featuring LXI Consortium panelists. Register now!

New Switch-A-Pitch Adapters from Aries Electronics

Thu, 01 Oct 2009 16:21:28 GMT

Aries Electronics has added a unique adapter series to its extensive line of Correct-a-Chip adapters that save end users both time and money. The new BGA Switch-A-Pitch Adapters enable the use of smaller pitch devices with larger pitch boards.

Aries' Custom Fine Pitch Gold Bump Adapters

Thu, 01 Oct 2009 16:21:28 GMT

Aries Electronics’ new series of adapters enable the use of virtually any SMT IC device on a pitch of 0.4 mm or higher to PC boards on 0.5 mm pitch. These adapt an IC device to some of the more popular TSSOP and QFP packages on 0.5 mm pitch. The unique Fine Pitch Bump Adapters save designers significant time and money by eliminating the need for costly engineering rework.

Aries Electronics’ CSP/BallNest Hybrid Socket

Thu, 01 Oct 2009 16:21:28 GMT

Aries Electronics announced its new patented CSP/BallNest Hybrid Socket suitable for prototyping, test or burn-in of CSP (chip scale package), BGA (ball grid array), microBGA and LGA (land grid array) devices. The socket can be used on devices with a 0.30 mm pitch or larger. A lid nests each ball termination into the socket for reliable connection.

Adjustable Pressure Pad on Aries' New CSP Test Socket

Thu, 01 Oct 2009 16:21:28 GMT

Aries Electronics now offers its 27mm CSP (chip scale package)/MicroBGA (ball grid array) test and burn-in sockets with an optional adjustable pressure pads.

Aries' Switch-A-Pitch Adapter 0.40mm to 1.27mm

Thu, 01 Oct 2009 16:21:28 GMT

Aries Electronics expanded its line of BGA Switch-A-Pitch Adapters that simplify high density interconnect (HDI) construction to enable the use of smaller pitch devices on larger pitch boards. The series now includes models with tops where the BGA landing pads are on a 0.40 mm pitch and adapter bottoms are populated with BGA balls on a 1.27 mm pitch.

How to Calibrate an RTD or Platinum Resistance Thermometer (PRT)

Mon, 19 Oct 2009 18:28:20 GMT

Two types of calibrations apply to PRTs—characterization and tolerance testing. The type of calibration to perform is determined by the way in which the unit under test (UUT) is to be used and the accuracy required by the user. Characterization is the type of calibration in which the UUT resistance is determined at several temperature points and the data are fitted to a mathematical expression. This application note describes calibration by characterization and tolerance testing of RTDs or PRTs.

Low Pin Count Test with Embedded Compression

Wed, 04 Nov 2009 16:45:56 GMT

This webcast discusses methodologies that enable designers to reduce the number of pins and top level routing required for the application of high quality test. Topics include: (1) High test compression with as few as 1 or 2 test channels, (2) Minimize congestion in top level routing using 1 or 2 test channels to access internal blocks, (3) Sample of real world LPCT implementations, and (4) Ways boundary scans achieve LPCT.

HSPA+: Features and Testing Whitepaper

Wed, 26 Aug 2009 17:43:19 GMT

With 85% of all cellular calls in the world set up using 3GPP access technology, 3GPP is the most successful set of telecommunication standards in the world. HSPA+ uses MIMO technology and higher order modulation to deliver twice the data speed and three times the voice capacity of HSPA. Anritsu offers a complete line of flexible, ready-to-run products designed for HSPA+ testing to support your deployment plans.

Non-intrusive Board Test Strategies for the Intel® Xeon® Processor 5500 Series

Wed, 07 Oct 2009 20:42:50 GMT

Intel®’s new Xeon® Processor 5500 Series (codenamed Nehalem) is enjoying widespread adoption, but Nehalem circuit board designs challenge intrusive probe- or nails-based test strategies like ICT or MDA, which are constrained by diminished test access. This paper defines three non-intrusive board test (NBT) technologies and describes how they can provide comprehensive test coverage for Nehalem designs.

The Optimized Quality Workflow: Where Quality No Longer Starts or Ends with QA

Thu, 20 Aug 2009 13:16:03 GMT

Inefficient quality workflows with poorly utilized resources, deficient processes, and outdated technology can’t keep pace with today’s market demands for complex devices and services. This paper provides guidance on how to implement an optimized end-to-end quality workflow that enables up to five times more testing without increasing headcount.

The Business Value of Test Asset Sharing in the Communications Industry

Thu, 20 Aug 2009 13:16:03 GMT

This paper explores the fundamental processes and competitive advantages of sharing test assets between service providers and equipment vendors. By sharing test cases, test reports, and other valuable assets, organizations can save time, increase test coverage, and better utilize resources to have a positive impact on the bottom line.

Using EDX Spectroscopy for Non-destructive Detection of Lead in Consumer Products

Fri, 14 Aug 2009 16:10:13 GMT

Many techniques can be used to identify and quantify lead. However, some of the most common methods result in destruction of the product, thereby raising costs. Currently, X-ray fluorescence spectroscopy is the only detection technique that offers high-precision, non-destructive analysis to detect lead in a range of materials. This application analyzes the advantages and applications of this technique.

Improve Power Supply Performance and Safety Using Remote Sensing and Remote Disable

Tue, 11 Aug 2009 18:40:51 GMT

Power supplies will perform safely and as specified at the output terminals. In many applications, the tests on the DUT are not performed right at the power supply output terminals. Power supply features such as remote sense and remote disable allow the power supply regulate its output and even shut down based upon what is happening at the load. Learn tips on how to use these features in your tests.

Create Complex Sequences with a DC Power Supply

Tue, 11 Aug 2009 18:40:51 GMT

DC power supplies are a fundamental component of almost every test system. Today’s complex automatic test equipment (ATE) systems must quickly perform a variety of tests, either to increase test system throughput or to tweak and optimize design performance. Learn the benefits of using list mode to create complex sequences and for improved testing and reduced test time.

Achieve Cleaner Power Signals by Minimizing Common Sources of Noise

Tue, 11 Aug 2009 18:40:51 GMT

Nose in low-level measurements can come from a number of different sources, including motors, office machines, power demands, and the switching supplies found in office equipment. It is possible to filter this noise at the load, but it is often easier to reduce or eliminate the noise before it reaches the DUT. Learn tips on what features to look for in the power supply, and how to minimize the noise in your test setup.

Examining the 10 Most Common PXI Test, Measurement, and Control Applications - Part I

Wed, 14 Oct 2009 16:11:18 GMT

PXI is a rugged PC-based platform that offers high-performance measurement and control capabilities in a low-cost deployment package. With the modular form factor, you can mix and match PXI modules from NI and other PXI vendors to incorporate the exact measurement and control I/O you need in each system. Integrated timing and triggering features in the PXI backplane provide precise intermodule synchronization. Lastly, National Instruments industry-leading PXI software connectivity with NI LabVIEW graphical programming, NI LabWindows™/CVI (ANSI C) software, and Microsoft Visual Studio give you complete control of your PXI system to build fully customized graphical user interfaces, measurement and control analysis, and documentation and reporting.

Examining the 10 Most Common PXI Test, Measurement, and Control Applications - Part II

Wed, 14 Oct 2009 16:11:18 GMT

NI TestStand Advanced Architecture Series

Wed, 14 Oct 2009 16:11:18 GMT

The NI TestStand Advanced Architecture Series consists of documents covering topics of interest to advanced NI TestStand developers. The series' authors are NI TestStand architects and developers who provide insightful content that goes beyond basic documentation by offering best practices for large and complex projects.

Learn more about how the Multimedia Test System (MMTS) can solve your audio/video testing needs.

Wed, 17 Jun 2009 16:07:05 GMT

The need to test multiple technologies on one device has increased dramatically as consumers demand more sophistication from their multimedia products. VI Technology’s award-winning Multimedia Test System (MMTS) is designed to deliver the fastest path to audio and video measurements for multimedia devices, such as DVD players, set top boxes, smart phones, mobile devices, video game consoles, and computers. Learn more about the MMTS and how it can solve your audio/video testing needs.

Parts Collaboration Within the Sunstone ECOsystem: PCB123™, LiveBOM™, Digi-Key® & NXP®

Mon, 08 Jun 2009 16:48:21 GMT

Sunstone Circuits’ technological collaboration with Digi-Key Corporation and NXP Semiconductor provides Sunstone PCB123 CAD users access to ready-made, certified parts symbols from NXP. Not only is sufficient information provided to ensure accurate physical design, but the collaboration also ensures efficient design with component availability and pricing information. Within the Sunstone ECOsystemSM, these new functional elements provide the end user with a turn-key level of convenience and accuracy, even when working on prototypes and early engineering projects.

Future technologies and testing for Fixed Mobile Convergence, SAE and LTE in cellular mobile communications

Wed, 02 Sep 2009 19:37:11 GMT

The Mobile Communications industry is currently developing standards and solutions for the next steps in the evolution of mobile networks. This whitepaper looks at the fundamental radio and network technologies being introduced in these steps, and how this is aligned into the future Fixed Mobile Convergence (FMC) of the Next Generation Networks.

Aries' Switch A Pitch Adapters Explanation

Thu, 01 Oct 2009 16:21:28 GMT

New developments in the design of BGA devices are now occurring on a regular basis. Reduction of device size is always a consideration, so a frequent “improvement” is the reduction of a device’s pin-to-pin pitch – often while incorporating new capabilities in the device.

Evolution of A Special Test Socket Design

Thu, 01 Oct 2009 16:21:28 GMT

A conversation between Aries Electronics and a customer explaining the evolutions of a test socket.

CSP Test Socket “Probe and Spring” Explanation

Thu, 01 Oct 2009 16:21:28 GMT

Aries has designed a complete, new, cost effective concept for test sockets. The design is very cost effective for two reasons.

Aries Electronics Correct-A-Chip

Thu, 01 Oct 2009 16:21:28 GMT

In the late 1980’s, Aries introduced the concept of “Correct-A-Chip Adapters”. The initial designs resulted from applications where a through-hole DIP device became obsolete. Aries innovated the use of PCBs integrated into DIP to DIP adapters where the female pins on the top of the adapter were connected to a re-routing PCB in the middle.

The Connector Conundrum

Thu, 01 Oct 2009 16:21:28 GMT

The Conundrum: The way to get the piece cost down on a test socket designed to work with a specific device package is to make a set of molds specific to the application. Unfortunately, a set of molds is expensive. If you’re going to make thousands of sockets, you can justify this cost. But for many situations, only a few sockets are needed.

Mass InterConnect Preserves Test Instrumentation

Fri, 08 May 2009 13:36:47 GMT

Mass InterConnect systems provide a reliable connection between instruments and units under test (UUTs). When testing printed circuit boards (PCBs), quality is paramount. Whether the system is PXI, VXI, LXI or rack and stack, mass interconnects can consolidate I/O and reduce testing time. A range of connectors and interfaces ensure that any testing system can be protected by a mass interconnect solution.

VPC Online Configurators

Fri, 08 May 2009 13:25:26 GMT

VPC online configurators offer a streamlined method for designing patchcords and cable assemblies using signal, power, coaxial, thermocouple, pneumatic, and other contacts & modules. These easy to follow steps will guide you through the design process.

Mass InterConnect Solutions Catalog

Fri, 08 May 2009 13:25:26 GMT

VPC offers a range of mass interconnect solutions for a variety of testing needs. Ranging from 2 to 75 module configurations, with a variety of I/O options, any testing interconnect need can be met by VPC's solutions.

Mass InterConnect Military Applications

Fri, 08 May 2009 13:25:26 GMT

VPC offers a range of interconnect products. Learn how VPC's military customers have integrated mass interconnect solutions.

VPC iCon Product Catalog

Fri, 08 May 2009 13:25:26 GMT

VPC's iCon allows a wide range of I/O, including signal, power and coaxial in one small package. A half-turn rugged engaging mechanism is engineered for 10,000 cycles and is designed to mate up to 320 signal contacts.

Mass InterConnect Automotive Applications

Fri, 08 May 2009 13:25:26 GMT

VPC offers a range of interconnect products. Learn how VPC's automotive customers have integrated mass interconnect solutions into test platforms. Applications include thermal testing of air bag electrical control units (ECUs) and electrical testing of ECUs for engine, lock-key and naviation systems.

Mass InterConnect Commercial Applications

Fri, 08 May 2009 13:25:26 GMT

VPC offers a range of interconnect products. Learn how VPC's commercial customers have integrated mass interconnect solutions into test platforms. Applications include VI Technology's IC Characterization System, Fulitech's cell phone PCB tester, and Peritec's Mixed Signal IC tester for component PCBs.

Using JTAG Emulation for Board-Level Functional Test

Wed, 19 Aug 2009 15:38:07 GMT

This paper provides insight in how to utilize a device's JTAG port to perform interconnect and functional based tests for high speed peripherals such as DDR3 SDRAMs. It also discusses the benefits and cost savings when using this test strategy.

Limited Access Testing on the Agilent i3070”

Tue, 11 Aug 2009 18:40:51 GMT

Modern electronic products are at risk of losing electrical test access to in-circuit test (ICT) due to product miniaturization and sophistication. Many of the limited access testing tools used in high-end products are now being applied to consumer products. However, new technologies have been developed to complement existing ones, including Agilent’s Medalist i3070 ICTSuper 7 suite. This paper provides an introduction to the toolset.

Leading the Way in Automated Test

Wed, 14 Oct 2009 16:11:18 GMT

For more than 30 years, National Instruments has helped companies worldwide build more cost-effective automated test systems. While continuing to serve as today’s leading authority in instrument control, NI is now driving innovation in test system design with virtual instrumentation. Reduce your costs by investing in a platform that combines open PC technologies and modular instrumentation with industry-leading test system software.

Reducing Switching Costs in Automated Test System with FETs and SSRs

Wed, 14 Oct 2009 16:11:18 GMT

Found in products from automotive engines to thermocouples, electromechanical relays are readily available, low-cost devices that you can use to route signals originating from almost anywhere. It is no wonder that these devices have become ubiquitous in the automated test market. Despite their industry adoption, electromechanical relays are relatively slow (hundreds of channels per second) and have limited lifetime, which makes them unsuitable for use in applications such as semiconductor validation test.

Fibre Channel over Ethernet (FCoE) Test Challenges

Tue, 19 May 2009 15:58:11 GMT

Fibre Channel over Ethernet (FCoE) technology maps the impeccable advantages of Fibre Channel on performance, security, and effectiveness in terms of storage transportation onto Ethernet network. Learn about the challenges of FCoE from a test and measurement perspective, differences of methodologies on LAN and SAN oriented testing, and challenges of integrating into one universal solution. Register now.

Simplify Your DMM: Top Five Tools and Tips

Wed, 14 Oct 2009 16:11:18 GMT

Although digital multimeters (DMMs) are common instruments found in most automated test systems, not all DMMs are designed with programming and automation in mind. NI DMMs, which are designed specifically for automated test, offer a variety of tools to make programmatic measurements and switching easier to implement and more reliable. This paper examines the top five tools provided by NI DMMs and tips for getting the most out of them.

Digi Jump-Starts Your Embedded Development

Mon, 28 Sep 2009 14:15:19 GMT

Digi JumpStart Kits™ are complete development solutions that leverage the reliability and flexibility of the royalty-free ThreadX-based NET+OS® platform, or the readily available library of software and community support of Linux. Kits for the ultra-compact Digi Connect ME® 9210 include module, development board, documentation and more.

Compact, Powerful, Secure Core Module Dev Kit

Mon, 28 Sep 2009 14:15:19 GMT

Digi's ConnectCore 9P 9215 module delivers a powerful, secure, compact network-enabled 150 MHz processor solution with an ARM9 core, a rich set of peripherals and unique interface flexibility. Digi JumpStart Kits™ for NET+OS®, Linux or Microsoft® .NET Micro Framework minimize design risks, so you can begin product development right out of the box.

Wireless Network-Enabled Core Module Dev Kit

Mon, 28 Sep 2009 14:15:19 GMT

The ConnectCore™ Wi-9P 9215 wireless core module utilizes Digi's NET+ARM processor and Digi's own secure 802.11a/b/g WLAN technology with full WPA2/802.11i support, making it the industry's only network-enabled core module with true long-term product availability. The Digi JumpStart Kit™ makes embedded development easy and cost-effective.

Digi Drop-in Networking Professional Dev Kit, $199

Mon, 28 Sep 2009 14:15:19 GMT

This proof-of-concept wireless connectivity development kit from Digi provides the hardware and software needed to easily configure and "drop-in" a low-power mesh (including ZigBee) or multipoint sensor/device network. The kit includes XBee/XBee-PRO embedded modules, interface boards, a wireless gateway, wall router and Python programming engine.

868 MHz RF Module Kit for European M2M

Mon, 28 Sep 2009 14:15:19 GMT

Digi's XBee-PRO® 868 embeddable RF modules provide up to 40 km RF LOS transmission and are ideal for urban deployments. Customers using these modules can easily migrate to other XBee solutions, including pin-compatible 900 MHz and 2.4 GHz ZigBee and proprietary options. Development kits are available for a limited time for just $99.

Globally Deployable RF Module Development Kits

Mon, 28 Sep 2009 14:15:19 GMT

Digi's XBee® DigiMesh™ 2.4 modules are globally deployable embedded RF modules available in low-power XBee and extended-range XBee-PRO® form factors. They combine a fast 2.4 GHz transceiver with the innovative DigiMesh peer-to-peer mesh networking protocol. Kits include 2 XBee and 2 XBee-PRO modules.

Webcast Available Now: Designing IP Enabled Devices to Drive Adoption of VoIP in the SMB Market

Wed, 04 Nov 2009 17:11:51 GMT

Continued headway of VoIP into the SMB marketplace depends on how effectively VoIP benefits can be translated via new devices and applications. Texas Instruments discusses challenges and solutions associated with designing products for this market, such as single-platform solutions, "office-in-a-box" devices, and more. This webcast is available today. Register now!

Videocast: Reliable Wireless Sense and Control Made Easy

Wed, 29 Jul 2009 20:31:13 GMT

Reliable and simple wireless solutions are no longer mutually exclusive. Learn about embedded wireless design challenges and tools needed to overcome them. CyFi™ is a low-power RF solution that enables you to deploy a reliable, simple, power-efficient sense and control application quickly and easily. Register now!

Video Webcast: Capacitive Touch-Sensing Design Best Practices

Wed, 29 Jul 2009 20:31:13 GMT

Touch-sensing is changing the way humans interact with products such as cell phones, PCs, consumer electronics, white goods, and automotive systems. Learn design best practices that are critical to adding elegant capacitive touch-sensing interfaces - touch-sensing buttons, sliders, touchpads - in this live video webcast with Q&A. Register now!

Product Lifecycle Insights: Tackling EU-REACH Environmental Compliance Head-on with Information

Tue, 19 May 2009 15:58:11 GMT

New Webcast: Industry leaders discuss escalating pressures facing global manufacturing and the growing information gaps impacting business performance related to regulatory and legislative compliance, component obsolescence, and quality and reliability. Register today!

Product Lifecycle Insights: Turbulent Green Supply Chains - Past, Present, and Future

Tue, 19 May 2009 15:58:11 GMT

Green doesn't only impact those with eco-friendly or socially-responsible product ambitions, or that must comply with regulations like RoHS, WEEE, REACH and EuP. Learn about the impact of environmental performance on product lifecycles from a panel of experts led by the authors of "Benchmarking Green", Rory King and Andrew K. Reese. Register now!

How to Avoid the Traps and Pitfalls of SOC Design

Tue, 19 May 2009 15:58:11 GMT

New Webinar: Designing SOCs is a high-risk enterprise with many risks involved, and a high penalty for failure, since development costs are measured in millions of dollars. Join Tensilica's Technology Evangelist Steve Leibson for an unusually frank discussion of ways you can avoid the traps and pitfalls and lead your team to a successful SOC design. Register now!

Everything You Wanted to Know About SOC Memory* .... * But Forgot to Ask

Tue, 19 May 2009 15:58:11 GMT

If you're a system architect or on an SOC design team, memory is critically important. On today's multicore SOC designs, more on-chip silicon is devoted to memory than anything else, yet memory is often an afterthought. Learn the alternatives for on-chip and off-chip memory usage that designers must know to develop successful multicore SOCs. Register now!

Wireless/wired industrial control development kit

Mon, 28 Sep 2009 14:15:19 GMT

Rabbit's BL4S200 single-board computers deliver the features and wireless connectivity to support networking for industrial control applications. In addition to the Ethernet versions, the BL4S200 offers a choice of Wi-Fi and ZigBee enabled wireless networking options that have been certified by the FCC and other international agencies.

MiniCoreT Ultra-compact networking module kit - $49

Mon, 28 Sep 2009 14:15:19 GMT

Rabbit® has combined its legendary ease-of-use and drive toward product cost reductions in creating the most compact, lowest-cost, embedded solution available today. The MiniCore™ family is Rabbit's smallest and lowest cost embedded solution, and offers designers an easy path to adding reliable network connectivity to any system they design.

Memory and mass storage for kit for embedded designs

Mon, 28 Sep 2009 14:15:19 GMT

The RabbitCore® RCM4300 Module from Rabbit® offers the features and performance to support complex embedded designs such as data encryption, secure data transmission, and web server applications. The RCM4300 core module provides the capability to use up to 1 GB mass storage with the industry-standard miniSD™ memory cards which you can swap with another miniSD card without powering down the module.

Module kit with on-board 802.15.4 mesh networking

Mon, 28 Sep 2009 14:15:19 GMT

The RabbitCore® RCM4510W next-generation core module adds ZigBee enabled/802.15.4 mesh networking connectivity to the existing Rabbit® 4000 microprocessor features allowing you to create a low-cost, low-power, wireless network as part of your control solution for your embedded application.

SMB (Server Message Block) Storage Application Kit

Mon, 28 Sep 2009 14:15:19 GMT

Use the SMB protocol for high-capacity storage space over a network connection. The SMB server shares file and printer resources over a computer network, allowing for flexibility and scalability. The included RabbitCore® module can act as an SMB client and remotely access the server shares.

Embedded ZigBee enabled-to-Ethernet gateway kit

Mon, 28 Sep 2009 14:15:19 GMT

The BL4S100 is a low-cost Rabbit® 4000-based single-board computer that delivers ZigBee and Ethernet capability. ZigBee offers mesh networking functionality to make networking easy to deploy and maintain. With both Ethernet and ZigBee integrated, the BL4S100 delivers a low-cost platform to design a ZigBee enabled Ethernet network or gateway.

Advanced 802.11b/g embedded module development kit

Mon, 28 Sep 2009 14:15:19 GMT

The RabbitCore® RCM5400W module from Rabbit® provides Wi-Fi/802.11b/g functionality which enables you to create low-cost, embedded wireless control and communication solution for embedded control applications.

Webcast on The Impact of Clock Recovery on Your Serial Data Measurements

Thu, 28 May 2009 14:39:37 GMT

Clock Recovery is an important component in serial data measurements, whether evaluating the performance of transmitters, receivers or systems. If you spend considerable time trying to achieve jitter measurements which correlate, you will see how the contribution of clock recovery performance can improve your measurement integrity. Register today.

Demystifying Receiver Jitter Tolerance Testing

Thu, 28 May 2009 14:39:37 GMT

Although all serial data standards specify a required receiver jitter tolerance, compliance testing of the link physical layer has generally ignored the receiver. This seminar fills knowledge gaps by explaining receiver testing and the complicated "recipe" of jitter sources, showing how jitter sources relate to interference mechanisms in the real communication channel, how to properly calibrate the jitter sources to assure accurate testing, and more. Register today!

Why Different Instruments Give You Different Jitter Answers

Thu, 28 May 2009 14:39:37 GMT

Webcast: The fact that lab instruments, whether of different types, or models within the same type, give frustratingly different measured results for the same target device is not news to most engineers. Here we explore some underlying reasons why this occurs. Register today!

EM Tools for Designing Circuits, Packages, and Connectors

Tue, 11 Aug 2009 18:40:51 GMT

Exclusive Webcast: RF Designers today need an EDA toolset that helps with the challenges of high frequency and highly integrated design work. This webcast will show you how Agilent's EEsof EDA portfolio assures design success from circuit level up to the highest levels of integration. Register today!

Power Supply Measurement and Analysis

Thu, 24 Sep 2009 16:19:04 GMT

Free webcast: Today's power supplies are driving to a level of efficiency never seen before. This webcast will explore the required measurements to validate and characterize each section of a common switch-mode power supply. Example topics include switching loss, safe operating area, slew rate, magnetic properties and power loss, power quality and harmonics. Register now!

Device Test Considerations for CDMA2000/EV-DO to LTE Technology Migration

Wed, 26 Aug 2009 17:43:19 GMT

Live Webcast: As CDMA operators transition to LTE for their next generation wireless networks, this timely seminar provides an understanding of requirements for device testing including 3GPP2 to LTE mobility and System Selection scenarios. Sponsored by Anritsu, Hosted by EDN and T&MW. Register Today!

Back-to-Basics: Channel modeling and 'what if' analysis for signal integrity applications

Tue, 11 Aug 2009 18:40:51 GMT

Watch a rapid technique "what if" analysis for signal integrity applications. In this webcast with live Q&A, learn a faster, more thorough approach to explore the design space than iterating the hardware to success. An ADS circuit model using a Tyco XAUI backplane is used in simulations to show what configuration changes lead to the required performance. Register now!

7 Ways A New Test Engineering Platform Will Help You Cut Costs In 2009

Tue, 19 May 2009 15:58:11 GMT

With the recent economic shift, OEMs are challenged to reduce the cost of manufacturing and test, yet deliver the same or better product quality. In this live webinar, you'll learn 7 ways that a centralized test platform will help you establish a more efficient test process, so you can trim costs and stay competitive. Register today!

The Basics of ZigBee Transmitter Testing

Wed, 14 Oct 2009 16:11:18 GMT

ZigBee is a wireless standard for personal area network (PAN) sensor monitoring and control. Learn how National Instruments Alliance Partner SeaSolve has developed a test suite including transmit (Tx), receive (Rx) and compliance testing for ZigBee. In this application note, we will describe test methodologies and techniques for each type of testing.

Fast, Flexible 6.6 GHz RF Instrumentation for PXI

Wed, 14 Oct 2009 16:11:18 GMT

Download the information kit to learn how to perform automated measurements up to 10X faster than traditional instruments. NI RF instrumentation harnesses the latest computing technologies, such as multicore processors and the PCI Express data bus. Download the information kit to learn more.

Why Choose a Modular Test Platform

Wed, 14 Oct 2009 16:11:18 GMT

This webcast discusses how to optimize automated test systems. Presented by National Instruments

Business Benefits of the NI Test Platform

Wed, 14 Oct 2009 16:11:18 GMT

Learn how industry leaders, including Philips, Hella, Lockheed Martin, Motorola, Guidant, and Key Energy Services are using NI software and hardware to research, design, test, automate, and improve a wide array of products and services

Best Practices for NI TestStand Process Model Development and Customization

Wed, 14 Oct 2009 16:11:18 GMT

Process model development and customization is probably one of the most powerful features in NI TestStand because you can generalize concepts in multiple test sequences and promote heavy code reuse to reduce development and maintenance time. This document outlines best practices for customizing the process model. This document is most useful to those who have a good knowledge of basic process model development. Not understanding fully how to effectively customize process models can negatively affect system development, potentially during the later stages of the development cycle. Refer to the NI TestStand Reference Manual for more information about the different aspects of process models. If a project includes complex requirements, consider using outside expertise when the risk of the learning curve is not acceptable.

Implementing Parallel Test Architectures

Wed, 14 Oct 2009 16:11:18 GMT

This webcast discusses parallel test architectures and their tendencies to become increasingly important parts of automated test systems today.

Boundary-Scan for PCB Interconnect Testing

Wed, 19 Aug 2009 15:38:07 GMT

Boundary-Scan for PCB Interconnect Testing and In-System Device Programming

A brief overview of boundary-scan architecture and its relation to the JTAG standard. New technology trends that make using boundary-scan essential for dramatically reducing development and production test costs. The various uses of boundary-scan and the tools available today for supporting boundary-scan technology.

Simulating The Effects of a Transfer Switch

Tue, 19 May 2009 15:58:11 GMT

The purpose of this application note is to demonstrate how to simulate the phase shift that may be encountered on an AC line when power is applied from a second, “synchronized” source of AC Power. While the power lines are generally locked in frequency, phase shifting can often occur. Shown below are methods used to create a phase shift using Pacific's UPC-Series Programmable Controller. The goal is to create a sub-cycle offset that can be programmed to occur at any phase angle on the fundamental waveform, and last for a specified number of degrees.

Simulating AC Power Line Harmonics

Tue, 19 May 2009 15:58:11 GMT

This application note will familiarize the reader with how various harmonics injected on individual phases (Line to Neutral) may not produce the expected results when observed Line to Line.

Pacific Power Source: The Power of Expertise

Tue, 19 May 2009 15:58:11 GMT

At Pacific Power Source, Inc., customer satisfaction is delivered in twos--in terms of exceptional products and unmatched technological expertise.

UPC Manager Software

Tue, 19 May 2009 15:58:11 GMT

UPC Manager Software gives you the tools necessary to quickly and easily operate your Pacific AC Power Source. With our complete, graphical interface, control all areas of your AC Power Source testing with simple presets, user prompts, Test Plans and custom reports.