Acculogic

inTEST Closes Acquisition of Acculogic

Administrator — Wed, 22 Dec 2021 14:20:18 +0000

Dec 21, 2021

MT. LAUREL, N.J.–(BUSINESS WIRE)–Dec. 21, 2021– inTEST Corporation (NYSE American:INTT), a global supplier of innovative test and process solutions for the automotive, defense/aerospace, industrial, life science, semiconductor and telecommunications markets, announced today that it has completed its acquisition of Acculogic, Inc. (“Acculogic”) and its affiliates. The Company previously announced that it had entered into a definitive agreement to acquire Acculogic on December 9, 2021 for approximately USD$9 million.

Nick Grant, President and CEO inTEST, commented, “We have been making great progress with our 5-Point Growth Strategy since its launch at the beginning of the year, and this acquisition further demonstrates our ability to execute on our plan to grow the business at a greater rate than the market by expanding its global reach and enhancing its product portfolio. I would like to personally welcome the entire Acculogic organization into the inTEST family as we are excited to add their leading technologies and automation services into our electronic test portfolio.”

Founded in 1992 and headquartered in Markham, Ontario, Canada, Acculogic provides a broad range of electronic test solutions, including the design and manufacturing of complete test systems and engineering services supporting defect-free volume production processes for electronic devices, circuit boards, and EV batteries. Acculogic also has engineering and sales support facilities in Maple Grove, MN, Lake Forest, CA, and Hamburg, Germany. Acculogic has approximately 50 employees and generates approximately 75% of its revenue in the defense/aerospace, automotive and life science markets.

About inTEST Corporation inTEST Corporation is a global supplier of innovative test and process solutions for use in manufacturing and testing across a wide range of markets including automotive, defense/aerospace, industrial, life science, semiconductor and telecommunications. Backed by decades of engineering expertise and a culture of operational excellence, inTEST solves difficult thermal, mechanical and electronic challenges for customers worldwide while generating strong cash flow and profits. inTEST’s strategy leverages these strengths to grow organically and with acquisitions through the addition of innovative technologies, deeper and broader geographic reach and market expansion. For more information, visit www.intest.com.

Forward-Looking Statements This press release includes forward-looking statements within the meaning of the Private Securities Litigation Reform Act of 1995, as amended. These statements do not convey historical information but relate to predicted or potential future events and financial results, such as statements of our plans, strategies and intentions, or our future performance or goals, that are based upon management’s current expectations. Our forward-looking statements can often be identified by the use of forward-looking terminology such as “believes,” “expects,” “intends,” “may,” “will,” “should,” “plans,” “projects,” “forecasts,” “outlook,” “anticipates, “targets”, “estimates” or similar terminology. These statements are subject to risks and uncertainties that could cause actual results to differ materially from those expressed or implied by such statements.

Such risks and uncertainties include, but are not limited to, any mentioned in this press release as well our ability to realize the potential benefits of the Acculogic acquisition and to successfully integrate its operations; our ability to grow our presence in the life science, industrial and international markets; the success of our strategy to diversify our business by entering markets outside the Semi Market; the impact of the COVID-19 pandemic on our business, liquidity, financial condition and results of operations; indications of a change in the market cycles in the Semi Market or other markets we serve; changes in business conditions and general economic conditions both domestically and globally; changes in the demand for semiconductors; our ability to borrow funds or raise capital to finance potential acquisitions; changes in the rates and timing of capital expenditures by our customers; and other risk factors set forth from time to time in our Securities and Exchange Commission filings, including, but not limited to, our annual report on Form 10-K for the year ended December 31, 2020. Any forward-looking statement made by us in this press release is based only on information currently available to us and speaks to circumstances only as of the date on which it is made. We undertake no obligation to update the information in this press release to reflect events or circumstances after the date hereof or to reflect the occurrence of anticipated or unanticipated events.

View source version on businesswire.com: https://www.businesswire.com/news/home/20211221005766/en/

inTEST Corporation

Duncan Gilmour

Chief Financial Officer, Treasurer and Secretary (856) 505-8999

Investors: Deborah K. Pawlowski

Kei Advisors LLC

dpawlowski@keiadvisors.com

(716) 843-3908

Source: inTEST Corporation

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4 Surprisingly Simple Tips That Can Instantly Improve Your Test Program Coverage

Administrator — Mon, 11 Jul 2016 18:39:42 +0000

The primary goal of any test program development effort is to obtain the highest test coverage possible. And, familiarity with the numerous features and capabilities of the Scorpion FLS980 Flying Probe tester can help do just that. So, here are 4 tips that you might find useful:

Consider probing all ICs or other types of test points that might not look very good. Place nails everywhere else, run the Accessibility Report and add nails to currently not covered nets on a particular IC or other device pin (by criteria Pin Name in Bed of Nails) with a very low quality.
Before assigning the “IC” class to all components with seemingly relevant reference designators (IC, U etc.), check if some of these devices can be tested in your Analog Section instead – for instance Voltage Reference (Zener), IC with diode array inside, filters, other clusters including resistor networks and such.
Use Voltage template for Voltage regulators and op-amps to functionally test them.
Create a “Power ON” Container to power on the board and verify voltage regulators, op-amps, digital ICs, frequency measurements, and voltages in some functional test steps.

The post 4 Surprisingly Simple Tips That Can Instantly Improve Your Test Program Coverage appeared first on Acculogic.

Acculogic Appoints New Agent in China and Hong Kong

Administrator — Tue, 22 Dec 2015 16:03:17 +0000

Markham, ON ― December 2015 ― Acculogic Inc., a global leader in electronic production test solutions, announces the appointment of BE FIRST TECHNOLOGY CO., LTD. as its representative throughout China and Hong Kong. BE FIRST TECHNOLOGY has locations in Bejing, Shanghai, Shenzhen, Xi’an and Chengdu.

Saeed Taheri, Acculogic’s CEO, interviewed many possible distribution partners for China and Hong Kong. BE FIRST TECHNOLOGY was simply the best match for Acculogic’s sophisticated ATE product line. The BE FIRST TECHNOLOGY team selected Acculogic to add to its portfolio because of the company’s high level Flying Probe System, In-Circuit tester, Functional Tester and Boundary Scan. Judy Bao, General Manager at BE FIRST TECHNOLOGY has provided sales and service for similar equipment for many years, and is confident that this will be a complimentary partnership.

With experienced sales and service teams in each area, BE FIRST TECHNOLOGY has established strong relationships with many world famous manufacturers and customers over the last ten years. BE FIRST supplies Micro-Electronics, SMT, LCD, LED, OPTO-Electronics, MEMS, BIO-Electronics, manufacturing equipment, test instrument, R&D tools and consumables. The company’s mission is: “Supply first-class products to the customers; Supply first-class service to the customers; Set up and keep first-class relations with the cooperators.”

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Boundary Scan (JTAG) Test Using Teradyne’s Di-Series and Teradyne’s High Speed Subsystem (HSSub)

Administrator — Wed, 25 Mar 2015 13:28:19 +0000

Acculogic’s ScanNavigator boundary scan test environment, presents an easy, cost effective, and a robust way to perform boundary scan (JTAG) test and programming using Teradyne’s Di-Series & Teradyne’s High Speed Subsystem (HSSub) digital test instruments.

The integration of ScanNavigator with the Teradyne Boundary Scan Runtime Library (TERBSR), which includes an application programming interface (API), provides access to the high speed communication channels on Teradyne’s digital test instruments.

Using these channels, ScanNavigator can communicate with the test access port (TAP) on a circuit board that is being tested. Furthermore, multiple boards can be tested simultaneously by defining the TAPs in the Instrument Definition File of ScanNavigator test environment.

Advantages of using Acculogic’s ScanNavigator with Terdayne’s digital instruments:

No need to purchase additional hardware
Significant reduction of tests costs & test times
Quick deployment with large scale ATE systems
Use tests developed in product design stage throughout the product life cycle – from design to prototype to manufacturing to repair & maintenance

Background

ScanNavigator is a fully integrated boundary scan test environment that harnesses the power of Acculogic’s comprehensive set of boundary scan test and on-board device programming tools in a single, intuitive graphical user environment. Whether it’s high fault coverage shorts and opens testing on boundary scan nets, or programming PLDs and flash memory via the scan chain, ScanNavigator provides easy access to all the hardware and software tools necessary to develop, execute and diagnose boundary scan tests.

Teradyne Di-Series is a family of C-size VXI digital test instruments, with 64 (single-ended) or 32 (differential-pair) programmable channels per card, data rates up to 50 MHz and the flexibility, performance and ease of use to test all levels of integration from SRA/SRU to WRA/LRU.

Teradyne High Speed Subsystem is comprised of an 18-slot PXIe Express (PXIe) 3U Chassis with a bandwidth of nearly 1 GB/s between instruments. APXIe subsystem-timing controller provides precise sub-nanosecond inter-slot coordination. The Foundation includes a fast, dedicated Quad-Core computer running a 64-bit version of Windows 7, providing the LXI communication to the teststation host computer and integration with HSSub Core Instruments via the high bandwidth, low latency PXIe backplane.

The post Boundary Scan (JTAG) Test Using Teradyne’s Di-Series and Teradyne’s High Speed Subsystem (HSSub) appeared first on Acculogic.

Acculogic introduces: Dynamic Test on the fly with Network Analyzer “BodeScan”

Administrator — Mon, 16 Mar 2015 18:30:19 +0000

1.Overview

Small value capacitors, inductors, resistors and crystals can now be tested by using the BodeScan option of the Flying Scorpion. Even complex parallel combinations of these devices can be tested. Values as small as 2pf for capacitors and 100nH for inductors can be now be tested.

2.Methodology

BodeScan is a dynamic analog method of testing complex two-terminal networks. In the example below, a complex network of a tuned circuit with filter, that consists of small capacitor with parallel inductor and resistor.

Since the BodeScan method allows the frequency applied to L-C resonant circuits to be varied, the attenuation and phase frequency responses of resonant circuits and filters can be plotted. The values of the capacitors (C), inductors (L) and resistors (R) within such a network can be determined by plotting and evaluating a Bode diagram.

By sweeping the input frequency the operation of quartz crystals and filter circuits transfer function to be characterized and tested.

Here are the two bode software test templates, Bode and RLC Bode:

3.Bode Hardware

The BodeScan system uses a HF Measurement head (Bodebox) that is mounted onto a camera module. Up to 4 Bodeboxes can be used within the system. Each Bodebox is directly connected to two adjacent Probe Modules using coax. There is a controller box mounted inside the system PC.

4.Specification

Frequency range Level	1kHz to 15MHz, resolution 32 bit, continuously variable
Amplitude (sinusoidal signal)	100, 200, 400 and 500mVpp
DC offset	± 360mV (can be switched off)
Resistance measurement (2 wire only	10 Ω to 150kΩ in 2 overlapping ranges, resolution 12 bit, exponential, error 5%
Capacitance measurement	1.6pF to 20μF, resolution 0.01pF error at < 2MHz: 3% error at > 2MHz: 8%
Inductance measurement	100nH to 20H, resolution 2.5nH error at < 2MHz: 3% error at > 2MHz: 8%
Filters, resonant circuits	Test for phase shift and attenuation characteristic
DYNAMIC TESTS (Bode diagram) Frequency range	1kHz to 15MHz, resolution 32 bit, continuously variable
DYNAMIC TESTS (Bode diagram) Frequency range	Test of ability to oscillate from 100 kHz to 15 MHz
Phase measurement	±175°, resolution 0.09°, error at < 2MHz: < 1° error at > 2MHz: < 5

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Thank you for stopping by our booth at IPC APEX EXPO 2015

Administrator — Mon, 09 Mar 2015 14:29:45 +0000

IPC APEX EXPO 2015 was a major trade show event for the printed circuit board and electronics manufacturing industry. As an exhibitor at this show we want to thank all of those who stopped by at our booth. We had the opportunity to create many new contacts, and we were delighted with the strong interest in our FLS980 Flying Prober tester.

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Why Use a Flying Probe Tester?

Administrator — Thu, 05 Mar 2015 21:29:56 +0000

A Flying Probe Tester is an in-circuit test system, which does not need a bed of nail test fixture. The Flying Prober extends in-circuit test benefits to applications where bed of nail is impossible to use (no access), too long to build (prototype) or too expensive to justify (high mix/low volume).

The post Why Use a Flying Probe Tester? appeared first on Acculogic.

An In-Circuit Test Fixture That is Easy to Debug and Can Perform ISP

Administrator — Mon, 05 Jan 2015 19:14:12 +0000

Many aspects are taken into consideration during the in-circuit test fixture design process. Factors such as: ease of debug, in-system programming, and power-up testing were the main considerations of this fixture design, which was manufactured for an automotive application. The in-circuit test program and fixture were developed for Acculogic’s iCT7000 in-circuit tester.

One of the unique features of this fixture is the vacuum slide, which allows access to the probes when the vacuum is actuated. So, the top side of the fixture can be opened up while the probes are in contact with the units under test (UUT), thereby making it easier to debug the fixture.

Another aspect of this fixture is that it allows the UUTs to be programmed after successfully completing the in-circuit test stage. This is achieved using an in-system programmer, which is installed inside the fixture and is capable of gang programming of up to 8 devices.

A multi-latching relay card is incorporated in to the fixture, which further extends the functionality of the fixture. Using this device, a UUT can be selected to be powered-up. In addition, a marker probe – controlled by the relay card – marks any board that successfully passes in-circuit test and the programming stages.

A final note. The tester’s fixture (electronic) interface connects horizontally with the fixture. This allows a more compact test fixture to be built, which means a lower fixture cost.

The post An In-Circuit Test Fixture That is Easy to Debug and Can Perform ISP appeared first on Acculogic.

Coverage Optimization support for JTag Tech and Corelis

Administrator — Mon, 29 Dec 2014 14:44:49 +0000

Acculogic announces support for Test Coverage Optimization between the flagship FLS980 Flying Probe Test System and boundary scan tool vendors JTag Technologies and Corelis. The key advantage here is that we can leverage boundary scan coverage and reduce test time and limit the number of contacts during the execution of a flying probe test sequence.

Acculogic Software tools consume the boundary scan vendors test coverage report and then automatically disables the duplicate flying probe based tests. On a large PCBA, often you can find thousands of duplicate test steps, and this has proven to reduce test times dramatically. One board design with more than 130 minute run time, was reduced to just over 22 minutes using this technique. While these results are astounding, it is more often that the reductions are in the range of 25-50% overall test time savings. Often Test Engineers have Boundary Scan Test vectors provided from OEMs or from other sources so that it becomes important to deal with many different Boundary Scan Tool Vendors coverage files. This is exactly what we do!

One specific area related to Boundary Scan failure analysis can also be improved using this combined approach. Boundary Scan is very good at isolating faults to the NET Level, once the net based fault is isolated, the Flying Probe can be used to isolate which pin on the NET is the real failure and where the real repair should take place.

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7 Reasons Why Acculogic's FLS980 Flying Prober Provides Superior Test Coverage

Administrator — Thu, 23 Oct 2014 17:46:14 +0000

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