<?xml version="1.0" encoding="ISO-8859-1"?>
<?xml-stylesheet type="text/xsl" media="screen" href="/~d/styles/rss2full.xsl"?><?xml-stylesheet type="text/css" media="screen" href="http://feeds.feedburner.com/~d/styles/itemcontent.css"?><rss xmlns:dc="http://purl.org/dc/elements/1.1/" version="2.0">
  <channel>
    <title>MEMS Packaging and Testing</title>
    <link>http://www.electroiq.com</link>
    <description />
    <atom10:link xmlns:atom10="http://www.w3.org/2005/Atom" rel="self" type="application/rss+xml" href="http://feeds.feedburner.com/small-times/mems-packaging-and-testing" /><feedburner:info xmlns:feedburner="http://rssnamespace.org/feedburner/ext/1.0" uri="small-times/mems-packaging-and-testing" /><atom10:link xmlns:atom10="http://www.w3.org/2005/Atom" rel="hub" href="http://pubsubhubbub.appspot.com/" /><item>
      <title>Sensory Swarms and MEMS roadmaps on docket at MEPTEC MEMS Technology Symposium</title>
      <link>http://www.electroiq.com/articles/stm/2012/05/sensory-swarms-and-mems-roadmaps-on-docket-at-meptec-mems-technology-symposium.html</link>
      <description>&lt;p&gt;MEPTEC will host its 10th Annual MEMS Technology Symposium in San Jose, CA. Keynotes cover &#x201c;sensory swarms&#x201d; and motion interfaces, and sessions will cover MEMS roadmaps; design, manufacturing, and test of MEMS; MEMS architectures and uses, and more.&lt;/p&gt;</description>
      <pubDate>Thu, 10 May 2012 18:04:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/stm/2012/05/sensory-swarms-and-mems-roadmaps-on-docket-at-meptec-mems-technology-symposium.html</guid>
      <dc:date>2012-05-10T18:04:00Z</dc:date>
    </item>
    <item>
      <title>SWS Inertial Sensor Development Platform evaluates MEMS behavior, performance</title>
      <link>http://www.electroiq.com/articles/stm/2012/05/sws-inertial-sensor-development-platform-evaluates-mems-behavior-and-performance.html</link>
      <description>&lt;p&gt;Si-Ware Systems (SWS) launched its Inertial Sensor Development Platform, the SWS61111, a tool that can be used to evaluate an inertial sensor, such as a gyroscope or accelerometer, to understand sensor behavior and performance with complete interface electronics.&lt;/p&gt;</description>
      <pubDate>Tue, 08 May 2012 21:22:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/stm/2012/05/sws-inertial-sensor-development-platform-evaluates-mems-behavior-and-performance.html</guid>
      <dc:date>2012-05-08T21:22:00Z</dc:date>
    </item>
    <item>
      <title>Audio Precision uncrates PDM interface for MEMS microphone test</title>
      <link>http://www.electroiq.com/articles/stm/2012/05/audio-precision-uncrates-pdm-interface-for-mems-microphone-test.html</link>
      <description>&lt;p&gt;Audio Precision released a pulse density modulation (PDM) audio interface option on its APx500 for direct I/O, modulation, and decimation on MEMS microphones and other PDM devices.&lt;/p&gt;</description>
      <pubDate>Wed, 02 May 2012 18:47:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/stm/2012/05/audio-precision-uncrates-pdm-interface-for-mems-microphone-test.html</guid>
      <dc:date>2012-05-02T18:47:00Z</dc:date>
    </item>
    <item>
      <title>What have we done for you lately?</title>
      <link>http://www.electroiq.com/articles/sst/print/vol-55/issue-4/columns/industry-forum/what-have-we-done.html</link>
      <description>&lt;p&gt;This page is usually reserved for a guest editorial by someone in the industry that wants to rant a little bit about the lack of standards in any given area, the need to get young students interested in engineering and the sciences, why fab safety is so important, or answering the call to innovate, to give a few examples.&lt;/p&gt;</description>
      <pubDate>Tue, 01 May 2012 05:00:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/sst/print/vol-55/issue-4/columns/industry-forum/what-have-we-done.html</guid>
      <dc:date>2012-05-01T05:00:00Z</dc:date>
    </item>
    <item>
      <title>SST Book Review: Energy Harvesting for Autonomous Systems</title>
      <link>http://www.electroiq.com/articles/sst/2012/04/book-review-energy-harvesting-for-autonomous-systems.html</link>
      <description>&lt;p&gt;Contributing editor Steve Groothuis reviews a book titled &#x201c;Energy Harvesting for Autonomous Systems (Smart Materials, Structures, and Systems).&#x201d; The book highlights the progression from the basic principles behind energy harvesting to the comprehensive systems that control the sensing, actuation, and transmission of those devices.&amp;nbsp; &lt;br&gt;
&lt;/p&gt;</description>
      <pubDate>Mon, 30 Apr 2012 20:16:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/sst/2012/04/book-review-energy-harvesting-for-autonomous-systems.html</guid>
      <dc:date>2012-04-30T20:16:00Z</dc:date>
    </item>
    <item>
      <title>CNSE STC designated trusted foundry for DOD Defense Microelectronics Agency</title>
      <link>http://www.electroiq.com/articles/stm/2012/04/cnse-stc-designated-trusted-foundry-for-dod-defense-microelectronics-agency.html</link>
      <description>&lt;p&gt;The College of Nanoscale Science and Engineering's (CNSE) Smart System Technology and Commercialization Center of Excellence (STC), Canandaigua, NY, was designated as a Trusted Foundry by the US Department of Defense's Defense Microelectronics Agency.&lt;/p&gt;</description>
      <pubDate>Thu, 26 Apr 2012 19:55:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/stm/2012/04/cnse-stc-designated-trusted-foundry-for-dod-defense-microelectronics-agency.html</guid>
      <dc:date>2012-04-26T19:55:00Z</dc:date>
    </item>
    <item>
      <title>Metrology tool offers economical price point with high accuracy</title>
      <link>http://www.electroiq.com/articles/sst/2012/04/metrology-tool-offers-economical-price-point-with-high-accuracy.html</link>
      <description>&lt;p&gt;Hexagon Metrology released the Optiv Classic 321GL tp benchtop vision-measuring metrology system for the North American market. It suits electronics and precision parts inspection, including micro-holes, fiber optics, filters, and more.&lt;/p&gt;</description>
      <pubDate>Mon, 23 Apr 2012 19:40:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/sst/2012/04/metrology-tool-offers-economical-price-point-with-high-accuracy.html</guid>
      <dc:date>2012-04-23T19:40:00Z</dc:date>
    </item>
    <item>
      <title>Mold packaging meets metal TSV for 5-10x density of conventional substrates</title>
      <link>http://www.electroiq.com/articles/ap/2012/04/mold-packaging-meets-metal-tsv-for-5-10x-density-of-conventional-substrates.html</link>
      <description>&lt;p&gt;Silex Microsystems brought its Met-Via full-wafer-thickness TSV technology into Chip Architectures by Joint Associated Labs for European Diagnostics, where it is being used to create cost-effective molded chip-level packaging with through metal vias.&lt;/p&gt;</description>
      <pubDate>Thu, 19 Apr 2012 14:17:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/ap/2012/04/mold-packaging-meets-metal-tsv-for-5-10x-density-of-conventional-substrates.html</guid>
      <dc:date>2012-04-19T14:17:00Z</dc:date>
    </item>
    <item>
      <title>MEMS and microelectronics undergo contactless delamination tests at Georgia Tech</title>
      <link>http://www.electroiq.com/articles/stm/2012/04/mems-and-microelectronics-undergo-contactless-delamination-tests-at-georgia-tech.html</link>
      <description />
      <pubDate>Fri, 13 Apr 2012 20:30:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/stm/2012/04/mems-and-microelectronics-undergo-contactless-delamination-tests-at-georgia-tech.html</guid>
      <dc:date>2012-04-13T20:30:00Z</dc:date>
    </item>
    <item>
      <title>Conference Report: MRS Spring 2012, Day 4</title>
      <link>http://www.electroiq.com/articles/sst/2012/04/mrs-spring-conference-day-4.html</link>
      <description>&lt;p&gt;Blogger Michael A. Fury, Techcet Group, reports from the MRS Spring 2012 meeting in San Francisco. Highlights from the fourth day: nanowire FETs, laminate MEMS, nanoparticles in security printing, graphene nanoribbons, Ta&lt;sub&gt;2&lt;/sub&gt;O&lt;sub&gt;5&lt;/sub&gt; memristors, redox flow batteries, graphene, and more.&lt;/p&gt;</description>
      <pubDate>Fri, 13 Apr 2012 19:10:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/sst/2012/04/mrs-spring-conference-day-4.html</guid>
      <dc:date>2012-04-13T19:10:00Z</dc:date>
    </item>
    <item>
      <title>Conference Report: MRS Spring 2012, Day 3</title>
      <link>http://www.electroiq.com/articles/sst/2012/04/conference-report-mrs-spring-2012-day3.html</link>
      <description>&lt;p&gt;&lt;i&gt;Blogger Mike Fury reports from the MRS Spring 2012 meeting in San Francisco. Highlights from the third day: leakage and TDDB in low- &#x3ba; dielectrics, flexible energy storage and conversion, Mn capping layers and diffusion barriers, hard masks for Cu interconnects, nanogenerators, Cu in RF, flexible temperature sensors, NEMS and MEMS in HDD, ZnO nanostructures, and various aspects of CMP. &lt;/i&gt;&lt;br&gt;
&lt;/p&gt;</description>
      <pubDate>Thu, 12 Apr 2012 13:34:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/sst/2012/04/conference-report-mrs-spring-2012-day3.html</guid>
      <dc:date>2012-04-12T13:34:00Z</dc:date>
    </item>
    <item>
      <title>Smallest 3-axis MEMS gyroscope: Teardown report released</title>
      <link>http://www.electroiq.com/articles/stm/2012/04/smallest-3-axis-mems-gyroscope-teardown.html</link>
      <description>&lt;p&gt;Research and Markets released the &amp;quot;ST L3G3250A 3-axis MEMS Gyroscope Reverse Costing Analysis&amp;quot; report, providing a teardown of STMicroelectronics&#x2019; MEMS gyroscope in an LGA package.&lt;/p&gt;</description>
      <pubDate>Wed, 11 Apr 2012 20:40:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/stm/2012/04/smallest-3-axis-mems-gyroscope-teardown.html</guid>
      <dc:date>2012-04-11T20:40:00Z</dc:date>
    </item>
    <item>
      <title>MEMS packaging growth, trends, and special requirements</title>
      <link>http://www.electroiq.com/articles/stm/2012/04/mems-packaging-growth-trends-requirements.html</link>
      <description>&lt;p&gt;The MEMS packaging sector is growing 2x faster (~20% CAGR) by unit shipments than the larger IC packaging industry, shows Yole Développement in its report &#x201c;MEMS Packaging.&#x201d;&lt;/p&gt;</description>
      <pubDate>Tue, 03 Apr 2012 16:32:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/stm/2012/04/mems-packaging-growth-trends-requirements.html</guid>
      <dc:date>2012-04-03T16:32:00Z</dc:date>
    </item>
    <item>
      <title>Conference Report: MEMS Executive Congress Europe</title>
      <link>http://www.electroiq.com/articles/sst/2012/04/conference-report-mems-executive-congress-europe1.html</link>
      <description>&lt;p&gt;Karen Lightman, the Managing Director of the MEMS Industry Group, blogs from the MEMS Executive Congress Europe, which was held March 20th, in Zurich, Switzerland. &lt;/p&gt;
&lt;p&gt;&amp;nbsp;&lt;/p&gt;</description>
      <pubDate>Mon, 02 Apr 2012 17:36:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/sst/2012/04/conference-report-mems-executive-congress-europe1.html</guid>
      <dc:date>2012-04-02T17:36:00Z</dc:date>
    </item>
    <item>
      <title>Microfluidic surface coating agent improves droplet performance</title>
      <link>http://www.electroiq.com/articles/stm/2012/03/microfluidic-surface-coating-agent-improves-droplet-performance.html</link>
      <description>&lt;p&gt;Microfluidic systems designer and maker Dolomite released Pico-Glide, a surface coating agent that facilitates advanced droplet microfluidics developed by Sphere Fluidics.&lt;/p&gt;</description>
      <pubDate>Thu, 29 Mar 2012 17:42:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/stm/2012/03/microfluidic-surface-coating-agent-improves-droplet-performance.html</guid>
      <dc:date>2012-03-29T17:42:00Z</dc:date>
    </item>
    <item>
      <title>Field Report: Sensors in Design 2012</title>
      <link>http://www.electroiq.com/articles/sst/2012/03/field-report-sensors-in-design-2012.html</link>
      <description>&lt;p&gt;Sensors in Design 2012 was opened March 28 at the San Jose McEnery Convention Center, in conjunction with Design West. Blogger Mike Fury reports. &lt;br&gt;
&lt;/p&gt;</description>
      <pubDate>Thu, 29 Mar 2012 13:52:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/sst/2012/03/field-report-sensors-in-design-2012.html</guid>
      <dc:date>2012-03-29T13:52:00Z</dc:date>
    </item>
    <item>
      <title>Bosch's Akustica enters analog MEMS sector with 2-chip offering</title>
      <link>http://www.electroiq.com/articles/stm/2012/03/bosch-akustica-enters-analog-mems-sector-with-2-chip-offering.html</link>
      <description>&lt;p&gt;Akustica, known for its monolithic single-chip digital MEMS devices, introduced its first analog 2-chip MEMS microphone for mobile handsets, the AKU340.&lt;/p&gt;</description>
      <pubDate>Wed, 28 Mar 2012 13:23:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/stm/2012/03/bosch-akustica-enters-analog-mems-sector-with-2-chip-offering.html</guid>
      <dc:date>2012-03-28T13:23:00Z</dc:date>
    </item>
    <item>
      <title>ACUTRONIC MEMS testers enable economical test at the fab</title>
      <link>http://www.electroiq.com/articles/stm/2012/03/acutronic-mems-testers-enable-economical-test-at-the-fab.html</link>
      <description>&lt;p&gt;ACUTRONIC released standard, off-the-shelf 2-axis rate tables to test several MEMS devices simultaneously. The 21-series is primarily made for MEMS manufacturers.&lt;/p&gt;</description>
      <pubDate>Mon, 19 Mar 2012 19:43:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/stm/2012/03/acutronic-mems-testers-enable-economical-test-at-the-fab.html</guid>
      <dc:date>2012-03-19T19:43:00Z</dc:date>
    </item>
    <item>
      <title>AMEC debuts TSV etch tool with Chinese installations</title>
      <link>http://www.electroiq.com/articles/ap/2012/03/amec-debuts-tsv-etch-tool-with-chinese-installations.html</link>
      <description>&lt;p&gt;Advanced Micro-Fabrication Equipment Inc. (AMEC) uncrated the Primo TSV200E compact, ultra-high-productivity TSV etch tool for 200mm wafers.&lt;/p&gt;</description>
      <pubDate>Wed, 14 Mar 2012 19:48:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/ap/2012/03/amec-debuts-tsv-etch-tool-with-chinese-installations.html</guid>
      <dc:date>2012-03-14T19:48:00Z</dc:date>
    </item>
    <item>
      <title>MEMS at heart of new iNEMI efforts, starting with test/reliability</title>
      <link>http://www.electroiq.com/articles/stm/2012/03/mems-at-heart-of-new-inemi-efforts-starting-with-test-reliability.html</link>
      <description>&lt;p&gt;iNEMI began 2 collaborative efforts related to micro electro mechanical system (MEMS) technology, specifically reliability and test, and will host a workshop on MEMS in May.&lt;/p&gt;</description>
      <pubDate>Tue, 13 Mar 2012 20:36:00 GMT</pubDate>
      <guid>http://www.electroiq.com/articles/stm/2012/03/mems-at-heart-of-new-inemi-efforts-starting-with-test-reliability.html</guid>
      <dc:date>2012-03-13T20:36:00Z</dc:date>
    </item>
  </channel>
</rss>

